METHOD OF FABRICATING SURFACE-EMITTING LASER

    公开(公告)号:US20180356459A1

    公开(公告)日:2018-12-13

    申请号:US15934359

    申请日:2018-03-23

    发明人: Ryosuke KUBOTA

    IPC分类号: G01R31/28 G01R31/27 H01S5/00

    摘要: A method of fabricating a surface-emitting laser includes the steps of fabricating a substrate product including device sections, a pad electrode, and a conductor, each of the device sections including a surface-emitting laser having an electrode, the conductor connecting the pad electrode to the electrode across a boundary of the device sections; attaching a connection device to the substrate product, the connection device including a probe device having a probe and a probe support base having an opening; performing a burn-in test of the surface-emitting lasers by applying electric power to the pad electrode through the probe at a high temperature; and after the burn-in test, separating the substrate product into semiconductor chips. The burn-in test includes a step of monitoring light emitted by the surface-emitting laser through the opening during the burn-in test, and a step of selecting the surface-emitting lasers based on a monitoring result.

    LASER LIGHT SOURCE DEVICE AND METHOD OF MANUFACTURING LASER LIGHT SOURCE DEVICE

    公开(公告)号:US20180331495A1

    公开(公告)日:2018-11-15

    申请号:US15776549

    申请日:2016-02-22

    IPC分类号: H01S5/022

    摘要: A technology disclosed in the specification of the subject application relates to a laser light source device capable of suppressing loss of optical output power from a semiconductor laser device, and to a method of manufacturing of a laser light source device while the degree of freedom in arrangement of the semiconductor laser device is secured. A laser light source device according to the subject technology includes a semiconductor laser device, and an optical element provided on an optical axis of an emission light emitted from the semiconductor laser device. The optical element separates a portion of a luminous flux of an emission light that is emitted from the semiconductor laser device and that is not separated in a fast axis direction from another portion so as to be separated in the fast axis direction.

    LIGHT EMITTING DEVICE
    10.
    发明申请

    公开(公告)号:US20180261733A1

    公开(公告)日:2018-09-13

    申请号:US15820180

    申请日:2017-11-21

    IPC分类号: H01L33/50 H01S5/022

    摘要: A light emitting device includes a light emitting element that emits a light having a peak wavelength of not less than 411 nm and not more than 421 nm, and a phosphor that emits a fluorescence having a longer peak wavelength than the peak wavelength of the light emitted from the light emitting element. An emission spectrum of only the light emitting element and an emission spectrum of only the phosphor overlap each other while having an overlap width of not less than 71 nm and not more than 81 nm. The overlap width is defined as a wavelength difference between a long wavelength side point at a 0.1% height of a peak height of the emission spectrum of only the light emitting element and a short wavelength side point at a 0.1% height of a highest peak of the emission spectrum of only the phosphor.