摘要:
An article recognition apparatus includes a marker having four or more unit pattern marks which are provided at a predetermined positional relationship on an article to be recognized and which are formed in such a way that a density pattern sequentially changes from a center position to a periphery of the pattern marker. The article recognition apparatus also includes an imaging tool that is disposed opposite the article to be recognized and that captures an image of the marker; a supporting mechanism that supports the imaging tool so as to enable setting of the imaging tool at least at a non-face-up measurement position; and a layout information recognition block that recognizes layout information about a position and an attitude of the article to be recognized.
摘要:
An article recognition apparatus includes a marker having four or more unit pattern marks which are provided at a predetermined positional relationship on an article to be recognized and which are formed in such a way that a density pattern sequentially changes from a center position to a periphery of the pattern marker. The article recognition apparatus also includes an imaging tool that is disposed opposite the article to be recognized and that captures an image of the marker; a supporting mechanism that supports the imaging tool so as to enable setting of the imaging tool at least at a non-face-up measurement position; and a layout information recognition block that recognizes layout information about a position and an attitude of the article to be recognized.
摘要:
A group of light spots dispersed and disposed three-dimensionally to be disposed not in one plane on an object-to-be-measured are shot by a camera. A position and an attitude of the object-to-be-measured are recognized based on an optical image representing each of the light spots included on a shot image by the camera.
摘要:
A group of light spots dispersed and disposed three-dimensionally to be disposed not in one plane on an object-to-be-measured are shot by a camera. A position and an attitude of the object-to-be-measured are recognized based on an optical image representing each of the light spots included on a shot image by the camera.
摘要:
A component assembly inspection method includes taking an image of a first light spot group possessed by a first component with a camera after the first component is assembled in a second component, the first light spot group including plural light spots. The method further includes recognizing a position and an attitude of the first component based on a light image that is on the image taken with the camera and represents each of the light spots of the first light spot group; and determining quality of an assembly state of the first component in the second component based on the position and attitude of the first component.
摘要:
An assembly inspection apparatus includes a marker having four or more unit pattern marks which are provided, at a predetermined positional relationship, in a portion of an assembly component to be put into a receiving assembly component and which are formed in such a way that a density pattern sequentially changes from a center position to a periphery of the pattern mark; an imaging tool that is disposed opposite the assembly component put into the receiving assembly component and that captures an image of the marker; a layout information recognition block that recognizes layout information about a position and an attitude of the assembly component put into the receiving assembly component by use of at least imaging information about the marker whose image has been captured by the imaging tool; and an assembly inspection block that inspects whether or not a superior assembly state is achieved.
摘要:
A component assembly inspection method includes taking an image of a first light spot group possessed by a first component with a camera after the first component is assembled in a second component, the first light spot group including plural light spots. The method further includes recognizing a position and an attitude of the first component based on a light image that is on the image taken with the camera and represents each of the light spots of the first light spot group; and determining quality of an assembly state of the first component in the second component based on the position and attitude of the first component.
摘要:
An abrasive apparatus adopted to abrade a curved surface of workpiece includes: an abrading head including an abrading tip having a substantially spherical outer surface and a rotating shaft supporting the abrading tip, the abrading head being positioned to face the curved surface; a thrust moving mechanism for relatively moving the abrading head and the curved surface; a lateral moving mechanism for relatively moving the abrading head and the curved surface; a pivotal moving mechanism for relatively moving the abrading head and the curved surface pivotally around a center point; and a controller for controlling the abrading head, the thrust moving mechanism, the lateral moving mechanism and the pivotal moving mechanism synchronously so that the abrading tip contacts and presses the curved surface at any point thereon with a substantially constant pressure in a direction consistent with a normal line thereat. An angle adjuster supporting the abrading head for adjusting an angle of the rotating shaft against the curved surface is also disclosed.
摘要:
A method for fabricating a metal member having a plurality or multitude of fine holes comprises forming a repeatedly usable master which includes a conductive substrate and non-conductive portions used to form the fine holes and fixedly deposited on the conductive substrate, subjecting the master to electrodeposition to form an electrodeposition film which has non-electrodeposited fine holes in position corresponding to the non-conductive portions, and separating the electrodeposition film from the master. In the master formation step, the non-conductive portions are so formed to have projections from the surface of the conductive substrate. The electrodeposition is effected so that the electrodeposition film is deposited about the side surfaces of each projection as exposing at least a top of the projection. The fine holes of the separated electrodeposition film have invariably a constant dimensional accuracy without suffering any influence of the electrodeposition conditions. The formation density of the fine holes is free of any limitation as will be caused by the thickness of the electrodeposition film.
摘要:
To assure that a plate-shaped brittle material is exactly cut into two plate pieces, a jig having a thread-shaped projection secured thereto in conformity with a predetermined pattern positionally coincident with a cut groove formed in the plate-shaped brittle material, an elastic member located on the cut groove side of the plate-shaped brittle material, and a plate-shaped brittle material to be cut into two plate pieces are placed on a table of a press machine one above another, and subsequently, a predetermined intensity of pressing power is applied to the jig from above by operating a pressing machine. Alternatively, a jig having a thread-shaped projection secured thereto, an elastic member located on the opposite side relative to the cut groove side of the plate-shaped brittle material, and a plate-shaped brittle material to be cut into two plate pieces may be placed on the press table one above another. Otherwise, a pair of jigs each having a thread-shaped projection secured thereto, a pair of elastic members one of which is located on the cut groove side of a plate-shaped brittle material and other one of which is located on the opposite side relative to the cut groove side of the plate-shaped brittle material, and a plate-shaped brittle material to be cut into two plate pieces may be placed on the press table one above another.