Oblique deposition to induce magnetic anisotropy for MRAM cells
    1.
    发明授权
    Oblique deposition to induce magnetic anisotropy for MRAM cells 失效
    倾斜沉积以诱导MRAM细胞的磁各向异性

    公开(公告)号:US06818961B1

    公开(公告)日:2004-11-16

    申请号:US10611789

    申请日:2003-06-30

    IPC分类号: H01L2982

    摘要: A method of fabricating a magnetoresistive tunneling junction cell comprising the steps of providing a substrate with a surface, depositing a first magnetic region (17) having a resultant magnetic moment vector onto the substrate, depositing an electrically insulating material (16) onto the first magnetic region, and depositing a second magnetic region (15) onto the electrically insulating material, wherein at least a portion of one of the first and second magnetic regions is formed by depositing said region at a nonzero deposition angle relative to a direction perpendicular to the surface of the substrate to create an induced anisotropy.

    摘要翻译: 一种制造磁阻隧道结电池的方法,包括以下步骤:向衬底提供表面;将具有合成磁矩矢量的第一磁区(17)沉积到衬底上,将电绝缘材料(16)沉积到第一磁 并且将第二磁性区域(15)沉积到所述电绝缘材料上,其中所述第一和第二磁性区域中的一个的至少一部分相对于垂直于所述表面的方向以非零沉积角沉积所述区域而形成 的基底以产生诱导各向异性。

    Low power magnetoresistive random access memory elements

    公开(公告)号:US07329935B2

    公开(公告)日:2008-02-12

    申请号:US11581951

    申请日:2006-10-16

    IPC分类号: H01L29/82 H01L43/00

    摘要: Low power magnetoresistive random access memory elements and methods for fabricating the same are provided. In one embodiment, a magnetoresistive random access device has an array of memory elements. Each element comprises a fixed magnetic portion, a tunnel barrier portion, and a free SAF structure. The array has a finite magnetic field programming window Hwin represented by the equation Hwin≈(Hsat−σsat)−(Hsw+σsw), where Hsw is a mean switching field for the array, Hsat is a mean saturation field for the array, and Hsw for each memory element is represented by the equation HSW≅√{square root over (HkHSAT)}, where Hk represents a total anisotropy and HSAT represents an anti-ferromagnetic coupling saturation field for the free SAF structure of each memory element. N is an integer greater than or equal to 1. Hk, HSAT, and N for each memory element are selected such that the array requires current to operate that is below a predetermined current value.

    Reduced power magnetoresistive random access memory elements

    公开(公告)号:US07129098B2

    公开(公告)日:2006-10-31

    申请号:US10997118

    申请日:2004-11-24

    IPC分类号: H01L21/00

    摘要: Low power magnetoresistive random access memory elements and methods for fabricating the same are provided. In one embodiment, a magnetoresistive random access device has an array of memory elements. Each element comprises a fixed magnetic portion, a tunnel barrier portion, and a free SAF structure. The array has a finite magnetic field programming window Hwin represented by the equation Hwin≈(Hsat−Nσsat)−(Hsw+Nσsw), where Hsw is a mean switching field for the array, Hsat is a mean saturation field for the array, and Hsw for each memory element is represented by the equation HSW≅√{square root over (HkHSAT)}, where Hk represents a total anisotropy and HSAT represents an anti-ferromagnetic coupling saturation field for the free SAF structure of each memory element. N is an integer greater than or equal to 1. Hk, HSAT, and N for each memory element are selected such that the array requires current to operate that is below a predetermined current value.

    Magnetoresistive random access memory with reduced switching field variation
    4.
    发明授权
    Magnetoresistive random access memory with reduced switching field variation 失效
    具有减小的开关场变化的磁阻随机存取存储器

    公开(公告)号:US06967366B2

    公开(公告)日:2005-11-22

    申请号:US10648466

    申请日:2003-08-25

    摘要: An array of multi-state, multi-layer magnetic memory devices (10) wherein each memory device comprises a nonmagnetic spacer region (22) and a free magnetic region (24) positioned adjacent to a surface of the nonmagnetic spacer region, the free magnetic region including a plurality of magnetic layers (36,34,38), wherein the magnetic layer (36) in the plurality of magnetic layers positioned adjacent to the surface of the nonmagnetic spacer region has a thickness substantially greater than a thickness of each of the magnetic layers (34,38) subsequently grown thereon wherein the thickness is chosen to improve the magnetic switching variation so that the magnetic switching field for each memory device in the array of memory devices is more uniform.

    摘要翻译: 一种多状态多层磁存储器件阵列,其中每个存储器件包括非磁性间隔区域(22)和邻近非磁性间隔区域表面定位的自由磁区域(24),所述自由磁性区域 区域,其包括多个磁性层(36,34,38),其中位于所述非磁性间隔区域的表面附近的所述多个磁性层中的所述磁性层(36)的厚度基本上大于所述非磁性间隔区域的厚度 随后在其上生长的磁性层(34,38),其中选择厚度以改善磁切换变化,使得存储器件阵列中的每个存储器件的磁切换场更均匀。

    Synthetic antiferromagnetic structure for magnetoelectronic devices
    6.
    发明授权
    Synthetic antiferromagnetic structure for magnetoelectronic devices 失效
    用于磁电子器件的合成反铁磁结构

    公开(公告)号:US07235408B2

    公开(公告)日:2007-06-26

    申请号:US11075587

    申请日:2005-03-09

    IPC分类号: H01L21/00

    摘要: A nearly balanced synthetic antiferromagnetic (SAF) structure that can be advantageously used in magnetoelectronic devices such as a magnetoresistive memory cell includes two ferromagnetic layers and an antiferromagnetic coupling layer separating the two ferromagnetic layers. The SAF free layer has weakly coupled regions formed in the antiferromagnetic coupling layer by a treatment such as annealing, layering of the antiferromagnetic coupling layer, or forming the antiferromagnetic coupling layer over a roughened surface of a ferromagnetic layer. The weakly coupled regions lower the flop field of the SAF free layer in comparison to untreated SAF free layers. The SAF flop is used during the write operation of such a structure and its reduction results in lower power consumption during write operations and correspondingly increased device performance.

    摘要翻译: 可以有利地用于诸如磁阻存储器单元的磁电子器件中的几乎平衡的合成反铁磁(SAF)结构包括两个铁磁层和分离两个铁磁层的反铁磁耦合层。 SAF自由层通过诸如退火,反铁磁耦合层的分层或在铁磁层的粗糙表面上形成反铁磁耦合层的处理,在反铁磁耦合层中形成弱耦合区域。 与未处理的SAF自由层相比,弱耦合区域降低了SAF自由层的触发场。 在这种结构的写入操作期间使用SAF触发器,并且其减少导致在写入操作期间较低的功耗并且相应地增加器件性能。

    Synthetic antiferromagnetic structure for magnetoelectronic devices
    7.
    发明授权
    Synthetic antiferromagnetic structure for magnetoelectronic devices 失效
    用于磁电子器件的合成反铁磁结构

    公开(公告)号:US06898112B2

    公开(公告)日:2005-05-24

    申请号:US10322979

    申请日:2002-12-18

    摘要: A nearly balanced synthetic antiferromagnetic (SAF) structure that can be advantageously used in magnetoelectronic devices such as a magnetoresistive memory cell includes two ferromagnetic layers and an antiferromagnetic coupling layer separating the two ferromagnetic layers. The SAF free layer has weakly coupled regions formed in the antiferromagnetic coupling layer by a treatment such as annealing, layering of the antiferromagnetic coupling layer, or forming the antiferromagnetic coupling layer over a roughened surface of a ferromagnetic layer. The weakly coupled regions lower the flop field of the SAF free layer in comparison to untreated SAF free layers. The SAF flop is used during the write operation of such a structure and its reduction results in lower power consumption during write operations and correspondingly increased device performance.

    摘要翻译: 可以有利地用于诸如磁阻存储器单元的磁电子器件中的几乎平衡的合成反铁磁(SAF)结构包括两个铁磁层和分离两个铁磁层的反铁磁耦合层。 SAF自由层通过诸如退火,反铁磁耦合层的分层或在铁磁层的粗糙表面上形成反铁磁耦合层的处理,在反铁磁耦合层中形成弱耦合区域。 与未处理的SAF自由层相比,弱耦合区域降低了SAF自由层的触发场。 在这种结构的写入操作期间使用SAF触发器,并且其减少导致在写入操作期间较低的功耗并且相应地增加器件性能。

    Cladding of a conductive interconnect for programming a MRAM device using multiple magnetic layers
    8.
    发明授权
    Cladding of a conductive interconnect for programming a MRAM device using multiple magnetic layers 失效
    用于使用多个磁性层编程MRAM器件的导电互连的包层

    公开(公告)号:US06720597B2

    公开(公告)日:2004-04-13

    申请号:US10010363

    申请日:2001-11-13

    IPC分类号: H01L2976

    CPC分类号: H01L27/222 G11C11/16

    摘要: A cladded conductive interconnect for programming a magnetoresistive memory device which includes a conductive material with a length, a first barrier conductive material positioned on the conductive material, and a multi-layer cladding region positioned along the length of the conductive material wherein the multi-layer cladding region includes N ferromagnetic layers, where N is a whole number greater than or equal to two, and wherein the multi-layer cladding region further includes at least one spacer layer, wherein the spacer layer can include a metal, an insulator, or an exchange interaction material, and wherein the spacer layer is sandwiched therebetween each adjacent ferromagnetic layer.

    摘要翻译: 一种用于编程磁阻存储器件的包覆导电互连件,其包括具有长度的导电材料,位于导电材料上的第一阻挡导电材料,以及沿导电材料的长度定位的多层包覆区域,其中多层 包层区域包括N个铁磁层,其中N是大于或等于2的整数,并且其中所述多层包覆区域还包括至少一个间隔层,其中所述间隔层可以包括金属,绝缘体或 交换相互作用材料,并且其中间隔层夹在每个相邻的铁磁层之间。

    Two-axis magnetic field sensor with multiple pinning directions
    10.
    发明授权
    Two-axis magnetic field sensor with multiple pinning directions 有权
    具有多个钉扎方向的双轴磁场传感器

    公开(公告)号:US07965077B2

    公开(公告)日:2011-06-21

    申请号:US12117396

    申请日:2008-05-08

    IPC分类号: G01R33/09 H01L43/08 G01B7/14

    摘要: A fabrication process and apparatus provide a high-performance magnetic field sensor (200) from two differential sensor configurations (201, 211) which require only two distinct pinning axes (206, 216) which are formed from a single reference layer (60) that is etched into high aspect ratio shapes (62, 63) with their long axes drawn with different orientations so that, upon treating the reference layers with a properly aligned saturating field (90) and then removing the saturating field, the high aspect ratio patterns provide a shape anisotropy that forces the magnetization of each patterned shape (62, 63) to relax along its respective desired axis. Upon heating and cooling, the ferromagnetic film is pinned in the different desired directions.

    摘要翻译: 制造工艺和装置从两个差异传感器配置(201,211)提供高性能磁场传感器(200),其仅需要由单个参考层(60)形成的两个不同的钉扎轴(206,216),所述单个参考层 被蚀刻成高纵横比形状(62,63),其长轴以不同取向绘制,使得在用适当对齐的饱和场(90)处理参考层,然后去除饱和场时,高纵横比图案提供 使得各图案形状(62,63)的磁化强制沿其各自期望的轴松弛的形状各向异性。 在加热和冷却时,铁磁膜被固定在不同的期望方向上。