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公开(公告)号：US20210364620A1
公开(公告)日：2021-11-25
申请号：US17256851
申请日：2019-06-06
发明人： Shangmin SUN , Yu HU , Sheng YAO , Tao WANG , Xibin YIN
摘要： The present disclosure provides a smart automatic frequency control (AFC) apparatus, including: a phase shift module, connected to a first signal input terminal and configured to: receive an incident wave from the first signal input terminal, perform a phase shift on the incident wave according to a phase shift parameter so as to generate a phase-shifted signal, and output the phase-shifted signal to a phase detection module; and the phase detection module, connected to the phase shift module and a second signal input terminal and configured to: receive a reflected wave from the second signal input terminal, perform a phase detection on the phase-shifted signal and the reflected wave so as to generate a phase difference signal, and output the phase difference signal via a control interface.
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公开(公告)号：US20240319114A1
公开(公告)日：2024-09-26
申请号：US18574756
申请日：2022-07-01
发明人： Weizhen WANG , Bicheng LIU , Chunguang ZONG , Shangmin SUN
IPC分类号： G01N23/04 , G01N23/083 , G01N23/10
CPC分类号： G01N23/04 , G01N23/083 , G01N23/10 , G01N2223/204 , G01N2223/50
摘要： An inspection system includes: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on an inspected object; and a processor in communication connection with the radiation source and configured to select a periodic radiation combination corresponding to a type of the object according to the type of the object, and cause the radiation source to emit radiation to the object in the selected periodic radiation combination during the time that the object is scanned, and the periodic radiation combination is a chronological arrangement of radiation pulses output by the radiation source in each scanning period, and radiation pulses have at least two different radiation energies. The system is capable of improving adaptability and simplifying control. An inspection method is also provided.
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公开(公告)号：US20240302299A1
公开(公告)日：2024-09-12
申请号：US18575301
申请日：2022-07-01
发明人： Weizhen WANG , Bicheng LIU , Chunguang ZONG , Shangmin SUN
IPC分类号： G01N23/083 , G01N23/04 , H01J25/50
CPC分类号： G01N23/083 , G01N23/04 , G01N2223/20 , H01J25/50
摘要： An inspection system comprises: a radiation source; a detector configured to detect a signal when radiation emitted by the radiation source acts on the inspected object; and a processor in communication connection with the radiation source and configured to determine at least one periodic radiation combination corresponding to a type of the object according to the type of the object, select periodic radiation combinations respectively corresponding to at least two different portions of the object in the at least one periodic radiation combination, and cause the radiation source to emit radiation to the at least two corresponding different portions in selected periodic radiation combinations during the time that the object is scanned, wherein a periodic radiation combination is a chronological arrangement of at least one radiation pulse output by the radiation source in each scanning period. An inspection method is also provided.
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公开(公告)号：US20220099857A1
公开(公告)日：2022-03-31
申请号：US17420678
申请日：2020-01-03
发明人： Xuping FAN , Quanwei SONG , Yu HU , Shangmin SUN
摘要： The present disclosure relates to a security inspection device and a transfer method, and the security inspection device includes an arm frame, provided with detectors, and configured to form an inspection channel; a first compartment, internally provided with a radiation source and connected with the arm frame, a protection wall, connected with the first compartment or the arm frame, and configured to perform radiation protection for an object to be protected, and a tire assembly, configured to enable the security inspection device to move relative to the ground, and the arm frame, the first compartment, the protection wall and the tire assembly are set to be transported together in a connected state.
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公开(公告)号：US20220082723A1
公开(公告)日：2022-03-17
申请号：US17420132
申请日：2020-01-03
发明人： Quanwei SONG , Xuping FAN , Junping SHI , Yuan HE , Hui MENG , Chunguang ZONG , Yu HU , Shangmin SUN , Jinguo CAO
IPC分类号： G01V5/00
摘要： The present disclosure relates to a security inspection device and a transfer method, and the security inspection device includes an arm frame, provided with detectors, and configured to form an inspection channel, a first compartment, internally provided with a radiation source and connected with the arm frame, a protection wall, connected with the first compartment or the arm frame, and configured to perform radiation protection for an object to be protected, and a tire, configured to enable the security inspection device to move relative to the ground, and the arm frame, the first compartment and the protection wall are set to be transported together in a connected state.
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公开(公告)号：US20210270991A1
公开(公告)日：2021-09-02
申请号：US17255394
申请日：2020-01-06
发明人： Yanwei XU , Weifeng YU , Yu HU , Chunguang ZONG , Shangmin SUN
IPC分类号： G01V5/00 , G01S17/894 , G06K9/78
摘要： The present disclosure relates to a security scanning inspection system and method. The security scanning inspection system comprises a detector, a scanning device and a controller, wherein the detector is configured to detect a protective attribute of an object to be inspected; the scanning device is movably arranged and the scanning device is configured to emit a scanning ray during movement to perform a security scanning inspection on the object to be inspected, the scanning device comprising at least two working modes, wherein a dose of a scanning ray in each working mode is different from a dose of a scanning ray in any other working modes; and the controller configured to select a working mode of the scanning device according to the protective attribute of the object to be inspected detected by the detector.
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公开(公告)号：US20240319112A1
公开(公告)日：2024-09-26
申请号：US18575288
申请日：2022-07-01
发明人： Bicheng LIU , Weizhen WANG , Chunguang ZONG , Shangmin SUN
IPC分类号： G01N23/02
CPC分类号： G01N23/02 , G01N2223/1006 , G01N2223/206 , G01N2223/64
摘要： The present disclosure relates to an inspection system and method. The inspection system includes: a ray source, configured to generate rays having different energies; a detector, configured to detect a signal when a ray emitted by the ray source acts on at least one cross section of an inspected object; and a processor, in communication connection with the ray source, configured to adjust an energy of the ray emitted by the ray source according to information representing a material parameter of at least one cross section of the inspected object. The embodiments of the present disclosure is capable of being applicable to radiation inspection of multiple types of inspected objects.
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公开(公告)号：US20240085349A1
公开(公告)日：2024-03-14
申请号：US18259772
申请日：2021-12-15
发明人： Zhiqiang CHEN , Lei LIU , Shangmin SUN , Chunguang ZONG , Yu HU , Yuan MA , Zheng JI
CPC分类号： G01N23/04 , G01N23/10 , G01V5/0016
摘要： The present disclosure provides a radiation inspection system, including a container respectively provided with an entrance and an exit on opposite side walls thereof; and a radiation scanning imaging device disposed in the container and having an inspection channel. The radiation scanning imaging device includes a ray source, the ray source includes ray generators, and ray generators are configured to emit ray beams at different angles, so that the radiation scanning imaging device performs radiation scanning inspection on an object to be inspected passing through the inspection channel from the entrance to the exit.
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公开(公告)号：US20230288350A1
公开(公告)日：2023-09-14
申请号：US18013555
申请日：2021-07-02
发明人： Zhiqiang CHEN , Yuanjing LI , Shangmin SUN , Chunguang ZONG , Yu HU , Huaping TANG , Bicheng LIU , Weizhen WANG
IPC分类号： G01N23/203
CPC分类号： G01N23/203 , G01N2223/316 , G01N2223/3301 , G01N2223/501
摘要： The present invention relates to a backscatter imaging device, a control method and an inspection system. The backscatter imaging device includes a ray source assembly configured to emit rays to a scanning area; a backscatter detector array including a plurality of backscattering detectors and configured to receive scattered photons when the rays are backscattered by an object within the scanning area; and a first collimator assembly including a plurality of first collimating channels corresponding to the plurality of backscatter detectors respectively, arranged on one side of the backscatter detector array adjacent to the scanning area, and configured to align the scattered photons when the rays are backscattered by the object, and the plurality of backscatter detectors receive scattered photons corresponding to a plurality of depths in the object respectively; and at least part of the plurality of first collimation channels have an adjustable collimation angle.
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公开(公告)号：US20210364455A1
公开(公告)日：2021-11-25
申请号：US17255968
申请日：2020-01-03
发明人： Jianmin LI , Li ZHANG , Yuanjing LI , Zhiqiang CHEN , Hao YU , Shangmin SUN , Bicheng LIU , Weizhen WANG , Dongyu WANG , Yuan MA , Yu HU , Chunguang ZONG
IPC分类号： G01N23/20008 , G01N23/203
摘要： The present disclosure provides a back scattering inspection system and a back scattering inspection method. The back scattering inspection system includes a frame and a back scattering inspection device. The rack includes a track arranged vertically or obliquely relative to the ground, and a space enclosed by the track forms an inspection channel; and the back scattering inspection device includes a back scattering ray emitting device and a back scattering detector, and the back scattering inspection device is movably disposed on the track for inspecting an inspected object passing through the inspection channel. The back scattering inspection system can perform back scattering inspection on a plurality of surfaces of the inspected object.
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