OBSERVATION SYSTEM
    3.
    发明申请
    OBSERVATION SYSTEM 审中-公开

    公开(公告)号:US20200217782A1

    公开(公告)日:2020-07-09

    申请号:US16821538

    申请日:2020-03-17

    摘要: An observation system includes an observation apparatus including a housing having an arrangement surface for placement of a sample, the sample including a culture medium, and an external illumination unit which is disposed outside the housing and includes at least one light source configured to emit illumination light. At least a part of the arrangement surface is formed of a transparent member having an optically transparent property. The observation apparatus includes an imaging unit which is provided in the housing and includes an image sensor configured to image, via the transparent member, the sample illuminated by the illumination light from the external illumination unit to acquire images of at least three colors.

    Microscope system and correction collar operating device

    公开(公告)号:US10317658B2

    公开(公告)日:2019-06-11

    申请号:US14789293

    申请日:2015-07-01

    IPC分类号: G02B21/06 G02B21/00 G02B21/24

    摘要: A microscope includes: an objective lens having an optical system; a correction collar provided on the objective lens and configured to move the optical system in a direction of an optical axis of the optical system by rotating around the objective lens to correct aberration; a switching unit to which the objective lens is attachable and which switches a position of the objective lens; a supporting unit for supporting the switching unit; and a focusing unit that holds the supporting unit such that the supporting unit is movable along the optical axis of the objective lens. A correction collar operating device is detachably attached to the supporting unit and includes: an input unit for inputting rotary force to rotate the correction collar; and a correction collar driving unit for rotating the correction collar according to the rotary force while the correction collar driving unit has contact with the correction collar.

    Inspection method, computer-readable recording medium, and reference standard plate

    公开(公告)号:US11443415B2

    公开(公告)日:2022-09-13

    申请号:US17142703

    申请日:2021-01-06

    发明人: Masaru Mizunaka

    IPC分类号: H04N7/18 G06T7/00 H04N17/00

    摘要: An inspection method for inspecting a counting function of an imaging system that captures an image of a phase object includes: capturing an image of a reference standard plate that includes a base region and a plurality of counting target regions having a phase amount in a thickness direction different from a phase amount of the base region, under a condition where the number of counting target regions positioned within a field of view of the imaging system is specified among the plurality of counting target regions; counting the counting target regions included in the captured image of the reference standard plate; and outputting at least a counted result of the counting target regions.