摘要:
A device for coupling beam guides of optical systems for unidirectional or bidirectional transmission of beams via a beam transition between the optical systems is provided, the device having a connecting device and mechanical centering means. The connecting device provides a magnetic coupling for implementing a coupling connection in a coupling area. The centering means are situated opposite one another on the optical systems and coupled in such a way to cause the beam guides to self-center due to the attraction caused by the magnetic forces.
摘要:
A device for coupling beam guides of optical systems for unidirectional or bidirectional transmission of beams via a beam transition between the optical systems is provided, the device having a connecting device and mechanical centering means. The connecting device provides a magnetic coupling for implementing a coupling connection in a coupling area. The centering means are situated opposite one another on the optical systems and coupled in such a way to cause the beam guides to self-center due to the attraction caused by the magnetic forces.
摘要:
A device for measuring the shape of freeform surfaces of objects includes a point-measuring optical and or interferometric scanning arm which is displaceable along a predefined path line, which device generates a measurement beam focused on the freeform surface to be measured. With reference to the scanning point, the scanning arm is able to rotate in at least one plane, in such a way that the measuring beam impinges upon the freeform surface to be measured in a perpendicular manner or within an acceptance angle of the scanning arm.
摘要:
An interferometric measuring device includes a short-coherent radiation source and a system composed of a modulation interferometer having a first and a second modulation interferometer beam path and a downstream reference interferometer, the radiation being split in the reference interferometer into a first beam path and a second beam path. If a dispersive optical component is situated in at least one beam path of the reference interferometer, a different optical path length becomes effective for radiation of a different wavelength in the beam path having the dispersive optical component. Therefore, if one measuring probe is replaced with another one having a modified optical path length, the modulation interferometer may be adjusted and the reference interferometer may remain unchanged. The reference interferometer may thus be used over an extended adjustment path of the modulation interferometer without optical components having to be replaced for adjusting the different path difference of measuring probes in the reference interferometer.
摘要:
An interferometric measuring device includes a short-coherent radiation source and a system composed of a modulation interferometer having a first and a second modulation interferometer beam path and a downstream reference interferometer, the radiation being split in the reference interferometer into a first beam path and a second beam path. If a dispersive optical component is situated in at least one beam path of the reference interferometer, a different optical path length becomes effective for radiation of a different wavelength in the beam path having the dispersive optical component. Therefore, if one measuring probe is replaced with another one having a modified optical path length, the modulation interferometer may be adjusted and the reference interferometer may remain unchanged. The reference interferometer may thus be used over an extended adjustment path of the modulation interferometer without optical components having to be replaced for adjusting the different path difference of measuring probes in the reference interferometer.
摘要:
An interferometric system for measuring surfaces of a measured object using an optical system. The optical system has a beam splitter, which directs measuring beams in a first beam path and measuring beams in a second beam path onto the surfaces of the measured object with the aid of two mirrors. The beam paths which are formed by the light beams which are reflected on the surfaces at least partially overlap in an area having identical beam direction. In this manner, measured surfaces of the measured object are at least partially imaged on an identically irradiated surface of a detector, such as an image recorder.
摘要:
An interferometric system for measuring surfaces of a measured object using an optical system. The optical system has a beam splitter, which directs measuring beams in a first beam path and measuring beams in a second beam path onto the surfaces of the measured object with the aid of two mirrors. The beam paths which are formed by the light beams which are reflected on the surfaces at least partially overlap in an area having identical beam direction. In this manner, measured surfaces of the measured object are at least partially imaged on an identically irradiated surface of a detector, such as an image recorder.
摘要:
A sensor objective at the exit of a measuring branch of a measuring probe of an interferometric measuring unit for detecting the shape, roughness or distance of the surface of a measured object, the interferometric measuring unit including a modulation interferometer and the measuring probe being optically connected to the modulation interferometer via an optical fiber system and the sensor objective having a focusing element and a downstream deflection element for coupling out and coupling back in a measuring beam directed toward the surface to be measured and reflected from the latter. The deflection element includes at least two optical components, each having a shared interface, the deflection angle of the at least one beam deflected to a system longitudinal axis being settable by mutual displacement and/or rotation of the optical components during mounting. The mutual displacement and/or rotation of the optical components is/are performed at the shared interface(s). Therefore, arbitrary deflection angles for the beam may be set using a small number of optical components which are tailored to one another. Because no components have to be manufactured for specific customers, there is a significant reduction in manufacturing costs as well as significantly shortened manufacturing and therefore delivery times. Because the interfaces of the optical components are joined to one another without a wedge-shaped gap during the gluing of the components after adjustment, the disadvantageous influence of non-reproducible adhesive shrinkage is eliminated.
摘要:
The present invention relates to an interferometric measuring device having a short-coherent radiation source, a modulation interferometer and a downstream reference interferometer connected thereto. The mechanical coupling between the reference interferometer and the modulation interferometer is provided with a backlash. For equalizing an optical path difference in the interferometric measuring device, an optical path difference established in the modulation interferometer is reset in the reference interferometer. The optical path differences between the partial beams in the modulation interferometer and between the partial beams in the reference interferometer may be changed via optical components mechanically coupled with the aid of a backlash, the movable optical component of the reference interferometer following a movement of the movable optical component of the modulation interferometer after passing a backlash distance in the backlash.
摘要:
A device for an interferometric measuring device having a first interferometer and a second interferometer, short coherent radiation being supplied to the first interferometer via a radiation source which is split into to beam components by a first beam splitter; and the optical path length in a beam component being longer than in the other beam component to the effect that the optical path difference is greater than the coherence length of the radiation; before emerging from the first interferometer, the two beam components being recombined and supplied to the second interferometer, which splits the radiation into two additional beam components; the optical path lengths of the two beam components being different to the effect that the optical path difference registered in the first interferometer is balanced again; the optical path length for the respective beam component in the first and the second interferometer being able to be set by at least one movable optical component, and the movable optical components are coupled to each other mechanically. A method for balancing an optical path difference in such an interferometric measuring device, the optical path differences between the beam components being changed in the two interferometers by mechanically coupled movable optical components at the same time and by the same absolute amount. By doing this, path differences in the beam components of the interferometers are able to be varied in one working step, the conditions for the formation of interference being complied with.