System and method of facilitating contactless payment transactions across different payment systems using a common mobile device acting as a stored value device
    1.
    发明申请
    System and method of facilitating contactless payment transactions across different payment systems using a common mobile device acting as a stored value device 审中-公开
    使用充当储值设备的通用移动设备促进跨不同支付系统的非接触式支付交易的系统和方法

    公开(公告)号:US20050222961A1

    公开(公告)日:2005-10-06

    申请号:US10940939

    申请日:2004-09-14

    Abstract: A system for facilitating contactless payment transactions across different contactless payment systems using a common mobile device that acts as a stored value device is provided. A combination of a mobile application and a communication module allows the mobile device, which is associated with one payment system, to emulate various transmission standards and data exchange formats that are used in different payment systems in order to perform contactless payment transactions with merchants that are associated with different contactless payment systems. A service application running in a service operator computer communicates with the various contactless payment systems to facilitate the settlement of the amount owed to various payment systems by the one payment system associated with the mobile device.

    Abstract translation: 提供了一种用于促进使用充当存储值设备的公共移动设备的不同非接触式支付系统之间的非接触式支付交易的系统。 移动应用和通信模块的组合允许与一个支付系统相关联的移动设备模拟在不同支付系统中使用的各种传输标准和数据交换格式,以便与商户进行非接触式支付交易 与不同的非接触支付系统相关联。 运行在服务运营商计算机中的服务应用程序与各种非接触式支付系统进行通信,以便于通过与移动设备相关联的一个支付系统来解决各种支付系统的数量。

    Device and method for energy and angle-resolved electron spectroscopy
    2.
    发明授权
    Device and method for energy and angle-resolved electron spectroscopy 有权
    能量和角度分辨电子能谱的装置和方法

    公开(公告)号:US06492644B1

    公开(公告)日:2002-12-10

    申请号:US09598612

    申请日:2000-06-21

    Applicant: Philippe Staib

    Inventor: Philippe Staib

    CPC classification number: H01J37/05 H01J37/252

    Abstract: A device for imaging a beam of particles composed of charged particles with a certain energy and angle distribution on a detector device using a device, including a deflection unit with at least one deceleration lens provided for forming essentially parallel particle paths in the particle beam, whose reciprocal distances correspond to the angle distribution of the particles, and a filtering unit, which is located between the deflection unit and the detector facility, whereby the filtering unit may be biased with a potential for formation of a braking field and is adapted to be energy-selectively permeable for the particles, on the sample side before the deflection unit, an entry window in the form of an axial-symmetrical staged aperture or an entry grid is located, which is electrically separated from the deflection unit and at ground potential.

    Abstract translation: 一种用于使用装置在检测器装置上对具有一定能量和角度分布的带电粒子组成的粒子束进行成像的装置,该装置包括具有至少一个减速透镜的偏转单元,用于在粒子束中形成基本上平行的粒子路径, 互相距离对应于颗粒的角度分布,以及位于偏转单元和检测器设备之间的过滤单元,由此过滤单元可能被施加用于形成制动场的可能性,并且适于作为能量 - 对于颗粒,在偏转单元之前的样品侧是可选择地渗透的,位于轴向对称分段孔或入口栅格形式的入口窗处,其与偏转单元电接地并处于地电位。

    Electron diffraction system for use in production environment and for high pressure deposition techniques
    3.
    发明授权
    Electron diffraction system for use in production environment and for high pressure deposition techniques 有权
    用于生产环境和高压沉积技术的电子衍射系统

    公开(公告)号:US06841777B2

    公开(公告)日:2005-01-11

    申请号:US10664718

    申请日:2003-09-17

    Applicant: Philippe Staib

    Inventor: Philippe Staib

    CPC classification number: H01J37/295

    Abstract: An electron source particularly for a RHEED measurement system or a RHEED measurement system as such includes an electron emitter (5), a first deflection stage (6a, b) for radiating an electron beam onto a sample (1), and a second deflection stage between the first stage (6a, b) and the sample 1, preferably near the sample.

    Abstract translation: 特别是用于RHEED测量系统或RHEED测量系统的电子源包括电子发射器(5),用于将电子束辐射到样品(1)上的第一偏转台(6a,b)和第二偏转级 在第一阶段(6a,b)和样品1之间,优选在样品附近。

    Apparatus and method for imaging a particle beam
    4.
    发明授权
    Apparatus and method for imaging a particle beam 失效
    用于对粒子束进行成像的装置和方法

    公开(公告)号:US06198095B1

    公开(公告)日:2001-03-06

    申请号:US09006985

    申请日:1998-01-14

    Applicant: Philippe Staib

    Inventor: Philippe Staib

    CPC classification number: H01J49/488 H01J37/252 H01J2237/255

    Abstract: An apparatus and method for imaging on a detector a particle beam of charged particles having a distinct energy distribution and a distinct angle distribution. The apparatus has deflectors which are provided to create in the particle beam essentially parallel particle paths spaced to correspond to their original angle distribution. The deflectors also direct the particle beam to semi-transmissive, aligned filter electrodes, which produce a potential difference to create a deceleration field to allow the particles to pass through by means of energy selectivity.

    Abstract translation: 一种用于在检测器上成像具有不同能量分布和不同角度分布的带电粒子的粒子束的装置和方法。 该设备具有偏转器,其设置成在粒子束中产生基本平行的颗粒路径,其间隔开以对应于其原始角度分布。 偏转器还将粒子束引导到半透射的对准的滤光器电极,其产生电位差以产生减小场,以允许粒子通过能量选择性通过。

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