Boron-Containing Dopant Compositions, Systems and Methods of Use Thereof For Improving Ion Beam Current and Performance During Boron Ion Implantation
    2.
    发明申请
    Boron-Containing Dopant Compositions, Systems and Methods of Use Thereof For Improving Ion Beam Current and Performance During Boron Ion Implantation 审中-公开
    含硼掺杂剂组合物,系统及其使用方法,用于提高硼离子注入过程中的离子束电流和性能

    公开(公告)号:US20170032941A1

    公开(公告)日:2017-02-02

    申请号:US15293367

    申请日:2016-10-14

    Abstract: A novel composition, system and method for improving beam current during boron ion implantation are provided. In a preferred aspect, the boron ion implant process involves utilizing B2H6, 11BF3 and H2 at specific ranges of concentrations. The B2H6 is selected to have an ionization cross-section higher than that of the BF3 at an operating arc voltage of an ion source utilized during generation and implantation of active hydrogen ions species. The hydrogen allows higher levels of B2H6 to be introduced into the BF3 without reduction in F ion scavenging. The active boron ions produce an improved beam current characterized by maintaining or increasing the beam current level without incurring degradation of the ion source when compared to a beam current generated from conventional boron precursor materials.

    Abstract translation: 提供了一种用于在硼离子注入期间改善束电流的新型组成,系统和方法。 在优选的方面,硼离子注入工艺涉及在特定浓度范围内使用B2H6,11BF3和H2。 在生成和注入活性氢离子物质期间使用的离子源的工作电弧电压下,选择B2H6具有高于BF 3的电离横截面。 氢气允许更高水平的B 2 H 6被引入BF 3中而不减少F离子清除。 当与常规硼前体材料产生的束电流相比时,活性硼离子产生改进的束电流,其特征在于保持或增加束电流水平而不引起离子源的劣化。

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