Method of patterning styrene diene block copolymer electron beam resists
    3.
    发明授权
    Method of patterning styrene diene block copolymer electron beam resists 失效
    苯乙烯二烯嵌段共聚物电子束抗蚀剂图案方法

    公开(公告)号:US4061799A

    公开(公告)日:1977-12-06

    申请号:US615447

    申请日:1975-09-22

    申请人: Terry L. Brewer

    发明人: Terry L. Brewer

    CPC分类号: G03F7/038

    摘要: Disclosed is a method of forming patterned electron beam resists from styrene-diene block copolymers and the resists formed thereby. A thin film of a styrene-diene block copolymer is applied to a support and is subjected to an electron beam scan. An electron beam irradiates a portion of the copolymer film according to a programmed pattern; the copolymer cross links where irradiated, thus causing the irradiated portion of the copolymer to become insoluble in a solvent. The balance of the copolymer remains soluble in the solvent, dissolves and is removed, resulting in the desired pattern of openings.

    摘要翻译: 公开了一种从苯乙烯 - 二烯嵌段共聚物形成图案化电子束抗蚀剂的方法和由此形成的抗蚀剂。 将苯乙烯 - 二烯嵌段共聚物的薄膜施加到载体上并进行电子束扫描。 电子束根据编程图案照射共聚物膜的一部分; 所述共聚物交联链接被照射,从而使所述共聚物的照射部分变得不溶于溶剂。 共聚物的余量保持溶于溶剂中,溶解并除去,产生所需的开口图案。

    Anti-reflective coating
    4.
    发明授权
    Anti-reflective coating 失效
    防反射涂层

    公开(公告)号:US5674648A

    公开(公告)日:1997-10-07

    申请号:US465518

    申请日:1995-06-01

    IPC分类号: G03F7/09 G06F7/00

    CPC分类号: G03F7/091

    摘要: A light absorbing medium to be interposed under photosensitive layers, such as a photo-resist for integrated circuit "chips" to eliminate defects caused by reflected light, has a polymer vehicle which can penetrate into small depressions of a substrate and form a thin, smooth and uniform coating. The coating includes a light absorbing dye. This light absorbing layer is imageable in the process. The light absorbing material eliminates many of the defects caused by reflected light resulting in increased sharpness of the images in the photo-resist. The material reduces the losses due to defects and increases the yield of useable product.

    摘要翻译: 为了消除由反射光引起的缺陷,介于光敏层之间的光吸收介质,例如用于集成电路“芯片”的光致抗蚀剂,具有能够渗透到基板的小凹陷中并形成薄而平滑的聚合物载体 均匀涂层。 涂层包括吸光染料。 该光吸收层在该过程中是可成像的。 光吸收材料消除了由反射光引起的许多缺陷,导致光致抗蚀剂中的图像的清晰度增加。 该材料减少了由于缺陷造成的损失并增加了可用产品的产量。

    Anti-reflective coating
    5.
    发明授权
    Anti-reflective coating 失效
    防反射涂层

    公开(公告)号:US4910122A

    公开(公告)日:1990-03-20

    申请号:US638258

    申请日:1984-08-06

    IPC分类号: G03F7/09 H01L21/027

    摘要: A light absorbing medium to be interposed under photosensitive layers, such as a photo-resist for integrated circuit "chips" to eliminate defects caused by reflected light, has a polymer vehicle which can penetrate into small depressions of a substrate and form a thin, smooth and uniform coating. The coating includes a light absorbing dye. This light absorbing layer is imageable in the process. The light absorbing material eliminates many of the defects caused by reflected light resulting in increased sharpness of the images in the photo-resist. The material reduces the losses due to defects and increases the yield of useable product.

    摘要翻译: 为了消除由反射光引起的缺陷,介于光敏层之间的光吸收介质,例如用于集成电路“芯片”的光致抗蚀剂,具有能够渗透到基板的小凹陷中并形成薄而平滑的聚合物载体 均匀涂层。 涂层包括吸光染料。 该光吸收层在该过程中是可成像的。 光吸收材料消除了由反射光引起的许多缺陷,导致光致抗蚀剂中的图像的清晰度增加。 该材料减少了由于缺陷造成的损失并增加了可用产品的产量。

    Pirani pressure sensor
    10.
    发明授权
    Pirani pressure sensor 失效
    皮拉尼压力传感器

    公开(公告)号:US5633465A

    公开(公告)日:1997-05-27

    申请号:US384826

    申请日:1995-02-07

    IPC分类号: G01L21/12

    CPC分类号: G01L21/12

    摘要: The invention is a method and apparatus for a pirani pressure sensor. The apparatus consists of a current supply and current receiving means affixed to a substrate. Bridging the current supply means and current receiving means is an electrically conductive polymer. The pirani pressure sensor may be made using conventional photolithographic techniques.

    摘要翻译: 本发明是一种用于玻璃压力传感器的方法和装置。 该装置由固定在基板上的电流源和电流接收装置组成。 桥接电流供应装置和电流接收装置是导电聚合物。 可以使用常规的光刻技术制造皮拉压力传感器。