公开(公告)号：US20140329476A1

公开(公告)日：2014-11-06

申请号：US14258246

申请日：2014-04-22

Applicant: Renesas Electronics Corporation ,  Renesas Electronics Corporation

Inventor： Shintaro YAMAMICHI ,  Hirokazu HONDA ,  Masaki WATANABE ,  Junichi ARITA ,  Norio OKADA ,  Jun UENO ,  Masashi NISHIMOTO ,  Michitaka KIMURA ,  Tomohiro NISHIYAMA

IPC: H04B1/38 ,  H04B1/40 ,  H04W84/18

CPC classification number: H04W84/18 ,  H01L2224/45144 ,  H01L2224/48091 ,  H01L2224/49111 ,  H01L2924/00014 ,  H01L2924/00

Abstract: A compact electronic device as a constituent element of a wireless communication system using a sensor. A first feature of the device is that a first semiconductor chip is bare-chip-mounted over a front surface of a first wiring board in the form of a chip and a second semiconductor chip is bare-chip-mounted over a second wiring board in the form of a chip. A second feature is that a wireless communication unit and a data processing unit which configure a module are separately mounted. A third feature is that the first and second wiring boards are stacked in the board thickness direction to make up the module (electronic device).

Abstract translation: 作为使用传感器的无线通信系统的组成要素的小型电子设备。 该器件的第一个特征是第一半导体芯片以芯片的形式裸地安装在第一布线板的前表面上，并且第二半导体芯片裸地安装在第二布线板上 芯片的形式。 第二特征是分别安装配置模块的无线通信单元和数据处理单元。 第三特征是第一和第二布线板沿板厚度方向堆叠以组成模块（电子设备）。

公开(公告)号：US20170092614A1

公开(公告)日：2017-03-30

申请号：US15375072

申请日：2016-12-09

Applicant: Renesas Electronics Corporation

Inventor： Toshihiro IWASAKI ,  Takeumi KATO ,  Takanori OKITA ,  Yoshikazu SHIMOTE ,  Shinji BABA ,  Kazuyuki NAKAGAWA ,  Michitaka KIMURA

IPC: H01L23/00 ,  H01L21/56 ,  H01L21/48

CPC classification number: H01L24/81 ,  H01L21/4853 ,  H01L21/563 ,  H01L23/49816 ,  H01L23/49838 ,  H01L24/03 ,  H01L24/04 ,  H01L24/05 ,  H01L24/11 ,  H01L24/14 ,  H01L24/16 ,  H01L24/17 ,  H01L24/32 ,  H01L24/75 ,  H01L24/83 ,  H01L24/94 ,  H01L25/043 ,  H01L25/0657 ,  H01L25/074 ,  H01L25/0756 ,  H01L25/117 ,  H01L2224/0345 ,  H01L2224/0346 ,  H01L2224/0347 ,  H01L2224/0361 ,  H01L2224/03622 ,  H01L2224/03912 ,  H01L2224/0401 ,  H01L2224/051 ,  H01L2224/056 ,  H01L2224/1132 ,  H01L2224/1147 ,  H01L2224/1181 ,  H01L2224/11849 ,  H01L2224/11901 ,  H01L2224/131 ,  H01L2224/1403 ,  H01L2224/14104 ,  H01L2224/14131 ,  H01L2224/1605 ,  H01L2224/1701 ,  H01L2224/1703 ,  H01L2224/73204 ,  H01L2224/75252 ,  H01L2224/75745 ,  H01L2224/75824 ,  H01L2224/8101 ,  H01L2224/81024 ,  H01L2224/81048 ,  H01L2224/81191 ,  H01L2224/81192 ,  H01L2224/81193 ,  H01L2224/81194 ,  H01L2224/81203 ,  H01L2224/81815 ,  H01L2224/81986 ,  H01L2224/831 ,  H01L2224/8385 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/0105 ,  H01L2924/01075 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/14 ,  H01L2924/181 ,  H01L2924/3841 ,  H01L2224/81201 ,  H01L2924/00

Abstract: The joint reliability in flip chip bonding of a semiconductor device is enhanced. Prior to flip chip bonding, flux 9 is applied to the solder bumps 5a for flip chip bonding over a substrate and reflow/cleaning is carried out and then flip chip bonding is carried out. This makes is possible to thin the oxide film over the surfaces of the solder bumps 5a and make the oxide film uniform. As a result, it is possible to suppress the production of local solder protrusions to reduce the production of solder bridges during flip chip bonding and enhance the joint reliability in the flip chip bonding of the semiconductor device.