NANOINDENTATION SURFACE ANALYSIS METHOD
    1.
    发明申请
    NANOINDENTATION SURFACE ANALYSIS METHOD 有权
    纳米表面分析方法

    公开(公告)号:US20090120172A1

    公开(公告)日:2009-05-14

    申请号:US12251136

    申请日:2008-10-14

    IPC分类号: G01N3/44

    摘要: The present invention provides a novel method for determining the mechanical properties of the surfaces of materials including thin films. Generally, the method is comprised of laterally scanning the surface of the film with an array of cantilever tips varying temperature, load and time to obtain a measurement of mechanical properties, such as hardness and glass transition temperature. The method can be used to obtain mechanical properties of films that would otherwise be unobtainable using standard methods.

    摘要翻译: 本发明提供一种用于确定包括薄膜的材料的表面的机械性能的新方法。 通常,该方法包括用悬臂尖端阵列横向扫描薄膜的表面,该阵列具有温度,载荷和时间,从而获得诸如硬度和玻璃化转变温度的机械性能的测量。 该方法可以用于获得否则将使用标准方法无法获得的膜的机械性能。

    Nanoindentation surface analysis tool and method
    2.
    发明授权
    Nanoindentation surface analysis tool and method 失效
    纳米压痕表面分析工具和方法

    公开(公告)号:US07451636B2

    公开(公告)日:2008-11-18

    申请号:US11358883

    申请日:2006-02-21

    IPC分类号: G01N3/32

    摘要: The present invention provides a novel method for determining the mechanical properties of the surfaces of materials including thin films. Generally, the method is comprised of laterally scanning the surface of the film with an array of cantilever tips varying temperature, load and time to obtain a measurement of mechanical properties, such as hardness and glass transition temperature. The method can be used to obtain mechanical properties of films that would otherwise be unobtainable using standard methods.

    摘要翻译: 本发明提供一种用于确定包括薄膜的材料的表面的机械性能的新方法。 通常,该方法包括用悬臂尖端阵列横向扫描薄膜的表面,该阵列具有温度,载荷和时间,从而获得诸如硬度和玻璃化转变温度的机械性能的测量。 该方法可用于获得否则将使用标准方法无法获得的膜的机械性能。

    Nanoindentation surface analysis method
    3.
    发明授权
    Nanoindentation surface analysis method 有权
    纳米压痕表面分析法

    公开(公告)号:US07849731B2

    公开(公告)日:2010-12-14

    申请号:US12251136

    申请日:2008-10-14

    IPC分类号: G01N3/42

    摘要: The present invention provides a novel method for determining the mechanical properties of the surfaces of materials including thin films. Generally, the method is comprised of laterally scanning the surface of the film with an array of cantilever tips varying temperature, load and time to obtain a measurement of mechanical properties, such as hardness and glass transition temperature. The method can be used to obtain mechanical properties of films that would otherwise be unobtainable using standard methods.

    摘要翻译: 本发明提供一种用于确定包括薄膜的材料的表面的机械性能的新方法。 通常,该方法包括用悬臂尖端阵列横向扫描薄膜的表面,该阵列具有温度,载荷和时间,从而获得诸如硬度和玻璃化转变温度的机械性能的测量。 该方法可以用于获得否则将使用标准方法无法获得的膜的机械性能。

    Data storage device
    5.
    发明授权
    Data storage device 有权
    数据存储设备

    公开(公告)号:US08374071B2

    公开(公告)日:2013-02-12

    申请号:US12130283

    申请日:2008-05-30

    IPC分类号: G11B7/00

    摘要: The present invention relates to a data storage device comprising: a polymer layer for storing data in the form of topographic features; a substrate comprising a conductor, a first surface of the polymer layer being provided on the substrate; and at least one probe which, when the device is in use, interacts with a second surface of the polymer layer, wherein, when in use, the data storage device is operable to apply a first electrical potential to the at least one probe relative to the substrate, thereby to cause a protrusion to be formed on the second surface of the polymer layer.

    摘要翻译: 数据存储装置技术领域本发明涉及一种数据存储装置,包括:用于以地形特征的形式存储数据的聚合物层; 包括导体的衬底,所述聚合物层的第一表面设置在所述衬底上; 以及当所述装置在使用时与所述聚合物层的第二表面相互作用的至少一个探针,其中当使用时,所述数据存储装置可操作以相对于所述至少一个探针施加第一电位 从而在聚合物层的第二表面上形成突起。

    DEVICE AND METHOD FOR SENSING A POSITION OF A PROBE
    6.
    发明申请
    DEVICE AND METHOD FOR SENSING A POSITION OF A PROBE 有权
    用于感测探头位置的装置和方法

    公开(公告)号:US20100026332A1

    公开(公告)日:2010-02-04

    申请号:US12544246

    申请日:2009-08-20

    IPC分类号: G01R31/02

    摘要: A device for sensing a position of a probe relative to a reference medium, the probe comprising a heater element with a temperature dependent electrical resistance and being adapted to determine probe position by measuring a parameter associated to a thermal relaxation time of the heater element.

    摘要翻译: 一种用于感测探针相对于参考介质的位置的装置,所述探针包括具有温度依赖性电阻的加热器元件,并且适于通过测量与所述加热器元件的热松弛时间相关联的参数来确定探针位置。

    Device and method for sensing a position of a probe
    9.
    发明授权
    Device and method for sensing a position of a probe 有权
    用于感测探针位置的装置和方法

    公开(公告)号:US07952369B2

    公开(公告)日:2011-05-31

    申请号:US12544246

    申请日:2009-08-20

    IPC分类号: G01R31/02

    摘要: A device for sensing a position of a probe relative to a reference medium, the probe comprising a heater element with a temperature dependent electrical resistance and being adapted to determine probe position by measuring a parameter associated to a thermal relaxation time of the heater element.

    摘要翻译: 一种用于感测探针相对于参考介质的位置的装置,所述探针包括具有温度依赖性电阻的加热器元件,并且适于通过测量与所述加热器元件的热松弛时间相关联的参数来确定探针位置。

    WEAR-LESS OPERATION OF A MATERIAL SURFACE WITH A SCANNING PROBE MICROSCOPE
    10.
    发明申请
    WEAR-LESS OPERATION OF A MATERIAL SURFACE WITH A SCANNING PROBE MICROSCOPE 有权
    使用扫描探针显微镜对材料表面进行无磨损操作

    公开(公告)号:US20110113517A1

    公开(公告)日:2011-05-12

    申请号:US12940079

    申请日:2010-11-05

    IPC分类号: G01Q70/08

    摘要: A method and a scanning probe microscope (SPM) for scanning a surface of a material. The method and SPM have a cantilever sensor configured to exhibit both a first spring behavior and a second, stiffer spring behavior. While operating the SPM in contact mode, the sensor is scanned on the material surface and a first spring behavior of the sensor (e.g. a fundamental mode of flexure thereof) is excited by deflection of the sensor by the material surface. Also while operating the SPM in contact mode, excitation means are used to excite a second spring behavior of the sensor at a resonance frequency thereof (e.g. one or more higher-order resonant modes) of the cantilever sensor to modulate an interaction of the sensor and the material surface and thereby reduce the wearing of the material surface.

    摘要翻译: 用于扫描材料表面的方法和扫描探针显微镜(SPM)。 该方法和SPM具有构造成展现第一弹簧性能和第二较硬弹簧特性的悬臂传感器。 当在接触模式下操作SPM时,传感器被扫描在材料表面上,传感器的第一弹簧特性(例如其基本弯曲模式)被材料表面的传感器偏转所激发。 同时在接触模式下操作SPM时,激励装置用于在悬臂传感器的共振频率(例如一个或多个高次谐振模式)下激发传感器的第二弹簧特性,以调制传感器和 材料表面,从而减少材料表面的磨损。