Method and apparatus for reconfigurable memory
    7.
    发明申请
    Method and apparatus for reconfigurable memory 失效
    可重构存储器的方法和装置

    公开(公告)号:US20050146910A1

    公开(公告)日:2005-07-07

    申请号:US11040954

    申请日:2005-01-21

    IPC分类号: G06F12/00 G11C5/02 G11C29/00

    摘要: A reconfigurable memory in an integrated circuit includes an array of memory cells and a memory controller. The array of memory cells in the reconfigurable memory are tested to determine if they are unusable and if so, their associated physical addresses corresponding to their physical location. After determining the physical addresses where any failure exists, the physical addresses locations associated with the physical locations of unusable memory cells or memory blocks are mapped out to avoid addressing them. While mapping out unusable memory locations or memory blocks reduces the total capacity, the reconfigurable memory has sufficient capacity for the integrated circuit to remain functionally usable.

    摘要翻译: 集成电路中的可重构存储器包括存储器单元阵列和存储器控制器。 测试可重配置存储器中的存储器单元阵列以确定它们是否不可用,如果是,则它们的相关物理地址对应于它们的物理位置。 在确定存在任何故障的物理地址之后,映射与不可用存储器单元或存储器块的物理位置相关联的物理地址位置,以避免对其进行寻址。 当映射不可用的存储器位置或存储器块减少总容量时,可重构存储器具有足够的容量以使集成电路保持功能可用。