Abstract:
A clock generation device includes a flip-flop, a clock division unit, and a clock comparator. The flip-flop generates a chip selection signal synchronized with an internal clock signal. The clock division unit generates second divided clock signals based on a first divided clock signal. The clock comparator selects ones of the second divided clock signals based on the chip selection signal. The clock division unit divides the internal clock signal based on the first divided clock signal and the selected one of the second divided clock signals.
Abstract:
A semiconductor memory device and a method of operating the same are provided. The semiconductor memory device includes a buffer that inputs a first signal and outputs a first delay signal, a command decoder that outputs a second signal, a mask pulse signal generator that inputs the first delay signal and the second signal and generates a mask pulse signal, and a signal reshaper that inputs the first delay signal, the second signal and the mask pulse signal and reshapes the first delay signal or the second signal.
Abstract:
A memory device is provided. The memory device includes programming first bit data into a plurality of memory cells; identifying target memory cells which are in a first state and whose threshold voltages are equal to or greater than a first voltage from the memory cells programmed with the first bit data; receiving second bit data which is to be programmed into the memory cells; calculating a plurality of third bit data by performing a first process on the second bit data; selecting third bit data which changes a largest number of target memory cells from the first state to a second state in response to the memory cells being programmed with each of the plurality of third bit data from the plurality of third bit data; and programming the selected third bit data into the memory cells.
Abstract:
A delay-locked loop circuit includes a phase detector and a coarse-lock detector. The phase detector receives a feedback clock and a first clock to generate first and second phase detecting signals, respectively. The coarse-lock detector generates a coarse-lock signal based on changes of phase of the first and second phase detecting signals.
Abstract:
Exemplary embodiments disclose a command control circuit including a command decoder configured to generate an internal command signal using a chip select (CS) signal and a command signal, and a CS gating logic configured to provide the CS signal to the command decoder, wherein the CS gating logic is further configured to provide the CS signal to the command decoder in response to a clock enable (CKE) signal being at a first level, and block the CS signal from the command decoder in response to the CKE signal being at a second level.