公开(公告)号：US20240105524A1

公开(公告)日：2024-03-28

申请号：US18367229

申请日：2023-09-12

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hyungjin KIM ,  Minhwan SEO ,  Wondon JOO ,  Jiyoung CHU ,  Sangwoo BAE ,  Sungmin AHN ,  Seungyeol OH ,  Jungyu LEE

IPC: H01L21/66 ,  G02B5/30 ,  G02B27/09 ,  G02B27/28 ,  H01L21/68

CPC classification number: H01L22/12 ,  G02B5/3083 ,  G02B27/0955 ,  G02B27/0977 ,  G02B27/283 ,  H01L21/681

Abstract: The optical device includes an illuminator configured to emit illumination light in a first horizontal direction, a polarizing prism configured to polarize the illumination light incident thereto through a first surface thereof in the first horizontal direction, a first reflector and a second reflector, each configured to reflect the illumination light from the polarizing prism, and a first lens and a second lens configured to condense the illumination light reflected from the first and second reflectors, respectively.

公开(公告)号：US20250006123A1

公开(公告)日：2025-01-02

申请号：US18404179

申请日：2024-01-04

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Choonghoon LEE ,  Sung-Jin PARK ,  Sangwoo BAE ,  Seung-Hoon BAEK

IPC: G09G3/3233

Abstract: A display device includes a pixel array that includes a pixel including a light emitting diode and a first transistor that includes a source terminal to which a pixel drive voltage is applied and a gate terminal to which a data signal is applied, and outputs drive current generated based on the voltage difference between the gate terminal and the source terminal, to the light emitting diode, and a display driver IC that generates the data signal based on the pixel drive voltage.

公开(公告)号：US20230068376A1

公开(公告)日：2023-03-02

申请号：US17740529

申请日：2022-05-10

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Ingi KIM ,  Minhwan SEO ,  Sangwoo BAE ,  Akinori OKUBO ,  Jungchul LEE ,  Eunhee JEANG

IPC: G01J4/02

Abstract: Provided is a polarization measuring device including a stage on which a measurement target is provided, a light source assembly configured to emit incident light, a first polarimeter configured to polarize the incident light, a second polarimeter configured to polarize reflected light reflected from the measurement target that is irradiated by the incident light, a filter assembly configured to remove noise from the reflected light, and a detector configured to receive the reflected light and measure an intensity of the reflected light and a phase of the reflected light.

公开(公告)号：US20220120662A1

公开(公告)日：2022-04-21

申请号：US17215185

申请日：2021-03-29

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sangwoo BAE ,  Boris AFINOGENOV ,  Maksim RIABKO ,  Anton MEDVEDEV ,  Aleksandr SHOROKHOV ,  Anton SOFRONOV ,  Ingi KIM ,  Jungwook KIM ,  Youngjoo LEE ,  Kyunghun HAN

IPC: G01N15/14

Abstract: A particle inspection method includes irradiating a spatially modulated modulation beam onto a surface of a substrate and detecting an absorption light signal from a reflection beam generated through reflection of the spatially modulated modulation beam by the substrate.

公开(公告)号：US20190113463A1

公开(公告)日：2019-04-18

申请号：US15940011

申请日：2018-03-29

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Seongkeun CHO ,  Akinori OKUBO ,  Tae Hyun KIM ,  Sangwoo BAE ,  Janghwi LEE

IPC: G01N21/88 ,  G01N21/21 ,  G01N21/95 ,  H01L21/66 ,  H01L21/67

CPC classification number: G01N21/8806 ,  G01N21/21 ,  G01N21/9501 ,  G01N2021/8848 ,  G01N2201/0683 ,  H01L21/67288 ,  H01L22/12

Abstract: An optical test system includes a stage region to accommodate an object to be tested, a first incident optical system which changes a first polarization state of a first light beam to a second polarization state and provide the first light beam in the second polarization state to the stage region in a first direction at a first incident angle which is not a right angle, a second incident optical system which changes a third polarization state of a second light beam to a fourth polarization state and inputs the second light beam in the fourth polarization state to the stage region in a second direction at a second incident angle which is not a right angle, and a main optical system to detect a first reflected light beam reflected from the stage region at a first reflection angle different from the first and second incident.