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公开(公告)号：US20250044222A1
公开(公告)日：2025-02-06
申请号：US18767486
申请日：2024-07-09
Applicant: SAMSUNG ELECTRONICS CO., LTD
Inventor： Seungwoo LEE , Jinseob KIM , Jinyong KIM , Taejoong KIM , Jinwoo AHN , Jaehwang JUNG , Taeyong JO , Garam CHOI
Abstract: An image measurement device includes an optical system that transmits light output to an image detection unit, the image detection unit configured to detect the light and generate an image, and an image processing unit that extracts spectral data from the image, wherein the image processing unit generates a profile according to an amount of light for each of a plurality of pixels based on the image, and performs Fourier transform on the profile.
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公开(公告)号：US20200152694A1
公开(公告)日：2020-05-14
申请号：US16512850
申请日：2019-07-16
Applicant: Samsung Electronics Co., Ltd.
Inventor： Junho LEE , Namhyeok KWAK , Gunduk KIM , Seungwoo LEE , Do-Hun KIM , Heedong KIM
IPC: H01L27/15 , F21S41/13 , F21S41/153 , H01L33/50
Abstract: Disclosed are light emitting modules and automobile illumination devices including the same. The light emitting module comprises a module substrate, a light emitting device on the module substrate, and a light guide structure apart from the module substrate and in plan view surrounding the light emitting device. The light emitting device comprises a first pixel and a second pixel each including a light emitting diode (LED) chip that emits light whose wavelength falls within a range of blue color or ultraviolet ray, and a wavelength conversion material on a top surface of at least one of the first and second pixels.
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公开(公告)号：US20190199926A1
公开(公告)日：2019-06-27
申请号：US16328155
申请日：2017-06-20
Applicant: Samsung Electronics Co., Ltd.
Inventor： Gyushik AN , Seungwoo LEE , Ahron YANG , Jaehee JEON , Soyeon HEO
CPC classification number: H04N5/23245 , G06T7/80 , H04N5/225 , H04N5/2258 , H04N5/232 , H04N5/23219 , H04N5/232935 , H04N5/262
Abstract: Various embodiments of the present invention relate to an apparatus and a method for controlling a plurality of cameras in an electronic device. Herein, the electronic device comprises: a first camera; a second camera set to have an angle of view included in an angle of view of the first camera; a display; and a processor, wherein the processor may be configured to display, on the display, a first image acquired through the first camera of the plurality of cameras; detect information corresponding to the second camera from the first image; activate the second camera, when it is determined to activate the second camera on the basis of the information corresponding to the second camera; and display, on the display, at least one image corresponding to activation of the first camera and the second camera. Other embodiments are also possible.
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公开(公告)号：US20200217882A1
公开(公告)日：2020-07-09
申请号：US16738864
申请日：2020-01-09
Applicant: Samsung Electronics Co., Ltd.
Inventor： Youngbae LEE , Yongseob YUN , Seungwoo LEE , Jinchul CHOI , Yongsang YUN
Abstract: An electronic device and method related to measurement of an electromagnetic (EM) signal emitted from an external electronic device. The electronic device including a processor, a memory, and an EM sensor. The memory stores instructions, which, when executed, enable the processor to: obtain an input signal including an electromagnetic signal of an external electronic device and a self-noise using the EM sensor; identify an ambient condition of the electronic device; identify a compensation self-noise corresponding o the ambient condition; generate a signal pattern, based on the input signal and the compensation self-noise; and identify the external electronic device, based on at least a part of the signal pattern
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公开(公告)号：US20240167806A1
公开(公告)日：2024-05-23
申请号：US18232673
申请日：2023-08-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Seungwoo LEE , Jinwoo AHN , Taejoong KIM , Myungjun LEE
IPC: G01B9/02 , G01B9/02015
CPC classification number: G01B9/02043 , G01B9/02032
Abstract: Provided is a pupil image measuring device including a light source configured to generate and output a light, a stage on which a measurement target is loaded, an optical system configured to transmit the light output from the light source, to the measurement target, a detector configured to detect a light reflected from the measurement target, and a spatial light distribution controller configured to adjust an intensity or amount of the light output from the light source or the reflected light, for each space of a plurality of spaces of the spatial light distribution controller, wherein the spatial light distribution controller is disposed on a pupil plane.
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Patent Agency Ranking
6.发明申请公开(公告)号：US20170048458A1
公开(公告)日：2017-02-16
申请号：US15226382
申请日：2016-08-02
Applicant: Samsung Electronics Co., Ltd.
Inventor： Hoseong JEON , Seungwoo LEE , Woohyun BAEK , Kihuk LEE
CPC classification number: H04N5/23267 , H04N5/23254 , H04N5/23293
Abstract: An apparatus and a method for providing images are provided. The apparatus includes an electronic device that may have a camera, and a processor configured to obtain an image that contains a plurality of objects by using the camera, display the image through a display that is functionally connected to the processor, select a partial area of the image, which includes at least a portion of at least one of the plurality of objects, based on the sizes, movements, or positions of the plurality of objects, and stabilize the image based on the selected partial area.
Abstract translation: 提供了一种用于提供图像的装置和方法。 该装置包括可以具有照相机的电子设备和被配置为通过使用相机来获得包含多个对象的图像的处理器，通过功能性地连接到处理器的显示器显示图像，选择一部分区域 基于所述多个对象的尺寸，移动或位置，所述图像包括所述多个对象中的至少一个对象的至少一部分，并且基于所选择的部分区域来稳定所述图像。
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公开(公告)号：US20250045870A1
公开(公告)日：2025-02-06
申请号：US18766740
申请日：2024-07-09
Applicant: SAMSUNG ELECTRONICS CO., LTD
Inventor： Seungwoo LEE , Jinseob KIM , Jinyong KIM , Taejoong KIM
Abstract: An image measurement device includes an optical system that transmits light output to an image detection unit, the image detection unit configured to detect the light and generate an image, and an image processing unit that extracts spectral data from the image, wherein the image processing unit generates a profile according to an amount of light for each of a plurality of pixels based on the image, and performs Fourier transform on the profile.
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公开(公告)号：US20230286432A1
公开(公告)日：2023-09-14
申请号：US18098500
申请日：2023-01-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Seungwoo LEE , Gunduk KIM , Jongin KIM , Jongtae KIM , Jiheon OH , Junho LEE , Kyuchae CHO
IPC: B60Q1/14 , F21S41/151 , F21S41/663
CPC classification number: B60Q1/143 , F21S41/151 , F21S41/663
Abstract: Provided is a light-emitting cell array including a first emission region including a first light-emitting cell provided in a first direction, a second emission region including a plurality of second light-emitting cells, the plurality of second light-emitting cells being stacked on the first light-emitting cell in a second direction intersecting with the first direction and provided in the first direction, and a third emission region including a plurality of third light-emitting cells different from the plurality of second light-emitting cells, the plurality of third light-emitting cells being stacked on the plurality of second light-emitting cells in the second direction and provided in the first direction.
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9.发明申请公开(公告)号：US20200154583A1
公开(公告)日：2020-05-14
申请号：US16683692
申请日：2019-11-14
Applicant: Samsung Electronics Co., Ltd.
Inventor： Youngbae LEE , Seungwoo LEE , Seungnyun KIM
Abstract: A method for measuring an electromagnetic (EM) signal radiated from an external electronic device and an electronic device thereof are provided. The electronic device includes a housing, a display, a first conducting unit, a second conducting unit, at least one EM sensing circuit, at least one wireless communication circuit, a processor, and a memory. The memory stores instructions of when being executed, enabling the processor to receive, by using the first conducting unit, a first signal sensed by the EM sensing circuit, and receive, by using the second conducting unit, a second signal sensed by the EM sensing circuit, and provide a signal pattern on the basis of the first signal and the second signal, and identify an external electronic device, at least partially on the basis of the signal pattern.
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公开(公告)号：US20230375463A1
公开(公告)日：2023-11-23
申请号：US18082040
申请日：2022-12-15
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Seoyeon JEONG , Seungwoo LEE , Inho SHIN , Wookrae KIM , Myungjun LEE , Jaehwang JUNG
IPC: G01N21/21 , G02B27/28 , G01N21/956 , G01B11/24
CPC classification number: G01N21/211 , G02B27/283 , G01N21/956 , G01B11/2441 , G01B2210/56
Abstract: A semiconductor measurement apparatus includes an illumination unit configured to provide illumination light including linearly polarized light beams having different wavelengths, an optical unit including an objective lens configured to allow the illumination light to be incident on a sample, the optical unit being configured to transmit reflection light generated when the illumination light is reflected from the sample, a self-interference generator configured to self-interfere the reflection light transmitted from the optical unit and transmit the reflection light to a first image sensor, for each wavelength, and a controller. The controller is configured to process a measurement image output by the image sensor to divide the measurement image into a first image representing an intensity ratio of a polarization component of the reflection light and a second image representing a phase difference of the polarization component of the reflection light, for each wavelength.
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