Auto-corrected IO driver architecture
    1.
    发明授权

    公开(公告)号:US10673434B2

    公开(公告)日:2020-06-02

    申请号:US16145839

    申请日:2018-09-28

    Abstract: A circuit or associated system or method comprises a first driver including a first transistor bank and a first resistor connected in series between a first predetermined voltage and an output pad, the first transistor bank including a first driver transistor and a plurality of first calibration transistors, wherein the plurality of first calibration transistors are respectively controlled based on a combination of bits of a first calibration code and on an output of at least one first logic gate.

    AUTO-CORRECTED IO DRIVER ARCHITECTURE
    2.
    发明申请

    公开(公告)号:US20200106438A1

    公开(公告)日:2020-04-02

    申请号:US16145839

    申请日:2018-09-28

    Abstract: A circuit or associated system or method comprises a first driver including a first transistor bank and a first resistor connected in series between a first predetermined voltage and an output pad, the first transistor bank including a first driver transistor and a plurality of first calibration transistors, wherein the plurality of first calibration transistors are respectively controlled based on a combination of bits of a first calibration code and on an output of at least one first logic gate.

    SKELETON I/O GENERATION FOR EARLY ESD ANALYSIS

    公开(公告)号:US20170255741A1

    公开(公告)日:2017-09-07

    申请号:US15172974

    申请日:2016-06-03

    Abstract: A design flow of an integrated circuit may include a skeleton input/output (I/O) generation stage during which information about ESD protection circuitry and rails but not functional circuitry of the I/O cells of the integrated circuit is generated. The information may be used in an ESD analysis stage to generate performance characteristics of the ESD protection circuitry. Results of the ESD analysis may then be used to design optimized ESD protection circuitry along with the rest of the circuit components of the I/O cells. In this way, the design of ESD protection circuitry may be optimized without having to redo a completed I/O cell design and significantly delay the design flow before tapeout.

    DYNAMIC IMPEDANCE CONTROL FOR VOLTAGE MODE DRIVERS

    公开(公告)号:US20180302093A1

    公开(公告)日:2018-10-18

    申请号:US15626580

    申请日:2017-06-19

    Abstract: A circuit may receive control signals to generate an output signal with pulses corresponding to pulses of a source signal. The circuit may include a primary circuit and an auxiliary circuit. The primary circuit may constantly participate in the generation of pulses of the output signal. The auxiliary circuit may selectively participate with the primary circuit in the generation of the pulses. For two consecutive pulses of the output signal, whether the auxiliary circuit participates in generating the latter of the two pulses may depend on whether a threshold level is crossed during generation of the consecutive pulses.

    Skeleton I/O generation for early ESD analysis

    公开(公告)号:US09996655B2

    公开(公告)日:2018-06-12

    申请号:US15172974

    申请日:2016-06-03

    Abstract: A design flow of an integrated circuit may include a skeleton input/output (I/O) generation stage during which information about ESD protection circuitry and rails but not functional circuitry of the I/O cells of the integrated circuit is generated. The information may be used in an ESD analysis stage to generate performance characteristics of the ESD protection circuitry. Results of the ESD analysis may then be used to design optimized ESD protection circuitry along with the rest of the circuit components of the I/O cells. In this way, the design of ESD protection circuitry may be optimized without having to redo a completed I/O cell design and significantly delay the design flow before tapeout.

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