公开(公告)号：US20240210943A1

公开(公告)日：2024-06-27

申请号：US18483970

申请日：2023-10-10

Applicant: SEMES CO., LTD.

Inventor： Seung Chan LEE ,  Ho Young LEE ,  Wang Hyeon SON ,  Woo Sang KWON

IPC: G05D1/02

CPC classification number: G05D1/0212 ,  G05D1/0234 ,  G05D2201/0206

Abstract: A driving apparatus and an operating method of the same are provided. The driving apparatus includes: a driving part for driving; and a handling part positioned above the driving part and handling a target object, wherein the handling part transports the target object to a destination and performs a self-replacement operation of replacing the target object with a replacement target object located at the destination.

公开(公告)号：US20240208085A1

公开(公告)日：2024-06-27

申请号：US18373869

申请日：2023-09-27

Applicant: SEMES CO., LTD.

Inventor： Seung Chan LEE ,  Sun Oh KIM ,  Jeong Woo HAN ,  Ho Young LEE ,  Wang Hyeon SON ,  Woo Sang KWON ,  Dong Hoon YANG ,  Seung Seok HA ,  Seung Jun LEE ,  Gil Do KIM ,  Sang Hoon BAEK ,  Ji Wook KWON

IPC: B25J21/00 ,  F24F3/167

CPC classification number: B25J21/005 ,  F24F3/167

Abstract: Provided are a driving apparatus and an operation method thereof. The driving apparatus includes driving parts driving on a driving path in a clean room in an autonomous driving manner, and handling parts provided on the driving parts and performing a three-dimensional handling operation for an object through flow in multi-directions.

公开(公告)号：US20240123630A1

公开(公告)日：2024-04-18

申请号：US18083470

申请日：2022-12-16

Applicant: SEMES CO., LTD.

Inventor： Seung Chan LEE ,  Ho Young LEE

IPC: B25J15/00 ,  B25J5/00 ,  B25J11/00 ,  H01L21/687

CPC classification number: B25J15/0052 ,  B25J5/00 ,  B25J11/0095 ,  B25J15/0028 ,  H01L21/68707

Abstract: One aspect of the gripping apparatus for gripping a gripping object provided with a head unit, in which a fitting groove is formed, of the present invention for achieving the above object comprises a base unit made of a frame, plate, box, or a combination thereof; a first gripper including a first distal end unit bent corresponding to the fitting groove, wherein a separation distance of the first distal end unit is adjusted at the base unit, and a plurality of first grippers facing each other are provided; a second gripper located outside the first gripper and including a second distal end unit bent toward a lower edge of the gripping object, wherein a separation distance of the second distal end unit is adjusted at the base unit, and a plurality of a second grippes facing each other are provided; an adjusting unit provided in the base unit and for adjusting a separation distance of the first distal end units of the plurality of first grippers and a separation distance of the second end units of the plurality of second grippers; and a vertical driving unit for manipulating the adjusting unit.

公开(公告)号：US20240270511A1

公开(公告)日：2024-08-15

申请号：US18399392

申请日：2023-12-28

Applicant: SEMES CO., LTD.

Inventor： Da Han KIM ,  Seung Chan LEE ,  Ho Young LEE

IPC: B65G47/90

CPC classification number: B65G47/90

Abstract: A gripper gripping a plurality of types of probe cards is provided. The gripper includes a frame, a driving unit connected to the frame, and a plurality of gripper portions connected to the driving unit and including an inner gripper portion and an outer gripper portion. The gripper portions include a moving block moving in a radial direction as the driving unit is driven, and the inner gripper portion and the outer gripper portion connected to the moving block. The outer gripper portion is rotatably connected to the moving block, and is configured such that the outer gripper portion rotates downward with respect to the moving block as the moving block moves in a radial outward direction.

公开(公告)号：US20240183895A1

公开(公告)日：2024-06-06

申请号：US18503840

申请日：2023-11-07

Applicant: SEMES CO., LTD.

Inventor： Ho Young LEE ,  Seung Chan LEE

IPC: G01R31/26 ,  G01R1/073

CPC classification number: G01R31/2601 ,  G01R1/07314

Abstract: A probe card transporting apparatus and method capable of loading a plurality of probe cards and enabling the replacement of probe cards independently are provided. The probe card transporting apparatus includes: a first loading module where a first probe card, which is a replacement probe card, is mounted; a second loading module where a second probe card to be replaced is mounted; and a hand gripper module withdrawing the second probe card from a probe station for semiconductor testing or inserting the first probe card into the probe station.