公开(公告)号：US20190056336A1

公开(公告)日：2019-02-21

申请号：US16081249

申请日：2017-02-22

申请人： SHIMADZU CORPORATION ,  OSAKA UNIVERSITY

发明人： Takahiro DOKI ,  Koichi TANABE ,  Toshinori YOSHIMUTA ,  Kenji KIMURA ,  Akihiro NISHIMURA ,  Taro SHIRAI ,  Satoshi SANO ,  Akira HORIBA ,  Takayoshi SHIMURA ,  Heiji WATANABE ,  Takuji HOSOI

IPC分类号： G01N23/041 ,  G01N23/20 ,  A61B6/00

摘要： [PROBLEM TO BE SOLVED] To provide a radiation phase contrast imaging device having a small device configuration[SOLVING MEANS] The present invention focused on the findings that the distance between the phase grating 5 and the FPD 4 does not need to be the Talbot distance. The distance between the phase grating 5 and the FPD 4 can be more freely set. However, a self-image cannot be detected unless the self-image is sufficiently magnified with respect to the phase grating 5. The degree on how much the self-image is magnified on the FPD 4 with respect to the original phase grating 5 is determined by a magnification ratio X2/X1. Therefore, in the present invention, the magnification ratio is set to be the same as the magnification ratio in a conventional configuration. With this, even if the distance X2 between the radiation source 3 and the FPD 4 is reduced, a situation in which the self-image cannot be detected by the FPD 4 due to the excessively small size thereof does not occur.

公开(公告)号：US20170160213A1

公开(公告)日：2017-06-08

申请号：US15370010

申请日：2016-12-06

申请人： SHIMADZU CORPORATION

发明人： Kenji SATO ,  Akihiro NISHIMURA

IPC分类号： G01N23/207

CPC分类号： G01N23/2076 ,  G01N2223/0563

摘要： An X-ray spectroscopic analysis apparatus includes: a radiation source configured to irradiate a predetermined irradiation area in the surface of a sample with an excitation beam for generating a characteristic X-ray; an analyzing crystal provided facing the irradiation area; a slit provided between the irradiation area and the analyzing crystal, the slit being parallel to the irradiation area and a predetermined crystal plane of the analyzing crystal; and an X-ray linear sensor including linear detection elements arranged in a direction perpendicular to the slit, the detection elements each having a length in a direction parallel to the slit. By detecting characteristic X-rays from different linear portions of the irradiation area for each wavelength, it is possible to perform analysis with sensitivity higher than the sensitivity of a conventional X-ray spectroscopic analysis apparatus that irradiates a point-like irradiation area with an excitation beam.

公开(公告)号：US20180279972A1

公开(公告)日：2018-10-04

申请号：US15562777

申请日：2016-03-01

申请人： SHIMADZU CORPORATION

发明人： Koichi TANABE ,  Shingo FURUI ,  Toshinori YOSHIMUTA ,  Kenji KIMURA ,  Akihiro NISHIMURA ,  Taro SHIRAI ,  Takahiro DOKI ,  Satoshi SANO ,  Akira HORIBA ,  Toshiyuki SATO

IPC分类号： A61B6/10 ,  G01T1/20 ,  A61B6/00

CPC分类号： G01T1/2018 ,  A61B6/4208 ,  A61B6/4233 ,  A61B6/484

摘要： In an X-ray imaging device according to a first embodiment, an X-ray detector has a configuration in which scintillator elements are defined by light-shielding walls in a lattice shape. Among X-rays incident on the X-ray detector, X-rays incident on the light-shielding walls are not converted into scintillator light and are transmitted by the X-ray detector. Accordingly, by causing X-rays to be incident on the X-ray detector in which the scintillator elements are defined by the light-shielding walls in a lattice shape, an area in which X-rays 3a transmitted by a subject M are incident on the X-ray detector can be limited to an arbitrary range. Accordingly, since a detection mask can be omitted in the X-ray imaging device which is used for EI-XPCi, it is possible to reduce a manufacturing cost of the X-ray imaging device.