公开(公告)号：US20200158662A1

公开(公告)日：2020-05-21

申请号：US16319574

申请日：2017-07-10

Applicant: Shimadzu Corporation ,  OSAKA UNIVERSITY

Inventor： Akira HORIBA ,  Koichi TANABE ,  Toshinori YOSHIMUTA ,  Kenji KIMURA ,  Hiroyuki KISHIHARA ,  Yukihisa WADA ,  Takuro IZUMI ,  Taro SHIRAI ,  Takahiro DOKI ,  Satoshi SANO ,  Takayoshi SHIMURA ,  Heiji WATANABE ,  Takuji HOSOI

IPC: G01N23/041 ,  A61B6/00

Abstract: This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1), a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects X-rays, an adjustment mechanism (6), and a controller (7) that controls the adjustment mechanism (6) to adjust a misalignment of the first grating (3) or a misalignment of the second grating (4) based on Moire fringes detected by the detector (5).

公开(公告)号：US20190056336A1

公开(公告)日：2019-02-21

申请号：US16081249

申请日：2017-02-22

Applicant: SHIMADZU CORPORATION ,  OSAKA UNIVERSITY

Inventor： Takahiro DOKI ,  Koichi TANABE ,  Toshinori YOSHIMUTA ,  Kenji KIMURA ,  Akihiro NISHIMURA ,  Taro SHIRAI ,  Satoshi SANO ,  Akira HORIBA ,  Takayoshi SHIMURA ,  Heiji WATANABE ,  Takuji HOSOI

IPC: G01N23/041 ,  G01N23/20 ,  A61B6/00

Abstract: [PROBLEM TO BE SOLVED] To provide a radiation phase contrast imaging device having a small device configuration[SOLVING MEANS] The present invention focused on the findings that the distance between the phase grating 5 and the FPD 4 does not need to be the Talbot distance. The distance between the phase grating 5 and the FPD 4 can be more freely set. However, a self-image cannot be detected unless the self-image is sufficiently magnified with respect to the phase grating 5. The degree on how much the self-image is magnified on the FPD 4 with respect to the original phase grating 5 is determined by a magnification ratio X2/X1. Therefore, in the present invention, the magnification ratio is set to be the same as the magnification ratio in a conventional configuration. With this, even if the distance X2 between the radiation source 3 and the FPD 4 is reduced, a situation in which the self-image cannot be detected by the FPD 4 due to the excessively small size thereof does not occur.

公开(公告)号：US20190167219A1

公开(公告)日：2019-06-06

申请号：US16321297

申请日：2017-07-10

Applicant: Shimadzu Corporation ,  OSAKA UNIVERSITY

Inventor： Satoshi SANO ,  Koichi TANABE ,  Toshinori YOSHIMUTA ,  Kenji KIMURA ,  Hiroyuki KISHIHARA ,  Yukihisa WADA ,  Takuro IZUMI ,  Taro SHIRAI ,  Takahiro DOKI ,  Akira HORIBA ,  Takayoshi SHIMURA ,  Heiji WATANABE ,  Takuji HOSOI

IPC: A61B6/00

Abstract: This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1) that radiates continuous X-rays, a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects the continuous X-rays, and a third grating (2) arranged between the detector (5) and the first grating 3. The first grating (3), the second grating (4), and the third grating (2) are arranged so as to satisfy conditions of predetermined formulas.

公开(公告)号：US20180279972A1

公开(公告)日：2018-10-04

申请号：US15562777

申请日：2016-03-01

Applicant: SHIMADZU CORPORATION

Inventor： Koichi TANABE ,  Shingo FURUI ,  Toshinori YOSHIMUTA ,  Kenji KIMURA ,  Akihiro NISHIMURA ,  Taro SHIRAI ,  Takahiro DOKI ,  Satoshi SANO ,  Akira HORIBA ,  Toshiyuki SATO

IPC: A61B6/10 ,  G01T1/20 ,  A61B6/00

CPC classification number: G01T1/2018 ,  A61B6/4208 ,  A61B6/4233 ,  A61B6/484

Abstract: In an X-ray imaging device according to a first embodiment, an X-ray detector has a configuration in which scintillator elements are defined by light-shielding walls in a lattice shape. Among X-rays incident on the X-ray detector, X-rays incident on the light-shielding walls are not converted into scintillator light and are transmitted by the X-ray detector. Accordingly, by causing X-rays to be incident on the X-ray detector in which the scintillator elements are defined by the light-shielding walls in a lattice shape, an area in which X-rays 3a transmitted by a subject M are incident on the X-ray detector can be limited to an arbitrary range. Accordingly, since a detection mask can be omitted in the X-ray imaging device which is used for EI-XPCi, it is possible to reduce a manufacturing cost of the X-ray imaging device.

公开(公告)号：US20200337659A1

公开(公告)日：2020-10-29

申请号：US16834883

申请日：2020-03-30

Applicant: Shimadzu Corporation

Inventor： Satoshi SANO ,  Koichi TANABE ,  Yukihisa WADA ,  Satoshi TOKUDA ,  Akira HORIBA ,  Naoki MORIMOTO

IPC: A61B6/00 ,  G01N23/20

Abstract: In this X-ray phase imaging apparatus, at least one of a plurality of gratings is composed of a plurality of grating portions arranged along a third direction perpendicular to a first direction along which a subject or an imaging system is moved by a moving mechanism and a second direction along which an X-ray source, a detection unit, and a plurality of grating portions are arranged. The plurality of grating portions are arranged such that adjacent grating portions overlap each other when viewed in the first direction.

公开(公告)号：US20210161492A1

公开(公告)日：2021-06-03

申请号：US17008021

申请日：2020-08-31

Applicant: Shimadzu Corporation

Inventor： Satoshi SANO ,  Koichi TANABE ,  Yukihisa WADA ,  Satoshi TOKUDA ,  Akira HORIBA ,  Naoki MORIMOTO

IPC: A61B6/00

Abstract: An X-ray phase imaging method includes a step of correcting a gradation that occurred along an orthogonal direction to a translation direction as viewed from an optical axis direction of X-rays in a phase-contrast image based on a distribution state of the gradation.

公开(公告)号：US20180042571A1

公开(公告)日：2018-02-15

申请号：US15555663

申请日：2015-03-06

Applicant: Shimadzu Corporation

Inventor： Satoshi SANO ,  Toshiyuki SATO ,  Koichi TANABE ,  Shingo FURUI ,  Toshinori YOSHIMUTA ,  Hiroyuki KISHIHARA ,  Takahiro DOKI ,  Akira HORIBA

IPC: A61B6/00 ,  G01N23/04

CPC classification number: A61B6/5258 ,  A61B6/4035 ,  A61B6/484 ,  A61B6/487 ,  G01N23/043 ,  G01N23/20075

Abstract: Provided is a radiation phase difference imaging apparatus in which a separation distance between a phase grating and a radiation detector is optimized. The separation distance between the phase grating and a detection surface of an FPD is determined based on the magnitude of noise corruption in a self-image projected onto the detection surface. The magnitude of the effect of the noise is used as a basis for assessing the separation distance. It is determined whether a distance Zd is appropriate for imaging, based on the magnitude of noise corruption in the self-image in a self-image picture which is obtained when the distance Zd is the distance between the phase grating and the detection surface of the FPD. The separation distance can thus be optimized based on actual conditions of an actual X-ray source that emits a plurality of types of X-rays.

公开(公告)号：US20170343486A1

公开(公告)日：2017-11-30

申请号：US15538622

申请日：2015-11-20

Applicant: Shimadzu Corporation

Inventor： Koichi TANABE ,  Shingo FURUI ,  Hiroyuki KISHIHARA ,  Kenji KIMURA ,  Taro SHIRAI ,  Takahiro DOKI ,  Satoshi SANO ,  Akira HORIBA

IPC: G01N23/04 ,  G21K1/06 ,  G21K1/10

CPC classification number: G01N23/04 ,  A61B6/4291 ,  A61B6/4429 ,  A61B6/4476 ,  A61B6/484 ,  A61B6/487 ,  A61B6/5235 ,  G01N2223/1016 ,  G01N2223/501 ,  G21K1/067 ,  G21K1/10 ,  G21K2207/005

Abstract: Provided is a radiation phase-contrast imaging device capable of assuredly detecting a self-image and precisely imaging the internal structure of an object. According to the configuration of the present invention, the longitudinal direction of a detection surface of a flat panel detector is inclined with respect to the extending direction of an absorber in a phase grating. This causes variations in the position (phase) of a projected stripe pattern of a self-image at different positions on the detection surface. This is therefore expected to produce the same effects as those obtainable when a plurality of self-images are obtained by performing imaging a plurality of times in such a manner that the position of the projected self-images on the detection surface varies. This alone, however, results in a single self-image phase for a specific region of the object. Therefore, according to the present invention, it is configured such that imaging is performed while changing the relative position of the imaging system and the object.

公开(公告)号：US20210172885A1

公开(公告)日：2021-06-10

申请号：US17052486

申请日：2019-01-22

Applicant: Shimadzu Corporation

Inventor： Satoshi SANO ,  Koichi TANABE ,  Kenji KIMURA ,  Yukihisa WADA ,  Satoshi TOKUDA ,  Taro SHIRAI ,  Takahiro DOKI ,  Akira HORIBA ,  Naoki MORIMOTO

IPC: G01N23/041 ,  G06T5/50 ,  G06T7/33 ,  G06T7/73 ,  G01N23/083

Abstract: The X-ray imaging device (100) is provided with an X-ray source (1), a plurality of gratings, a moving mechanism (8), and an image processing unit (6). The image processing unit (6) is configured to generate a phase-contrast image (16) by associating a pixel value in each pixel of a subject (T) in a plurality of subject images (10) with phase values of a Moire fringe (30) at each pixel and aligning the pixel of the subject of the same position in the plurality of subject images.

公开(公告)号：US20190175126A1

公开(公告)日：2019-06-13

申请号：US16309820

申请日：2017-03-15

Applicant: Shimadzu Corporation

Inventor： Koichi TANABE ,  Toshinori YOSHIMUTA ,  Kenji KIMURA ,  Hiroyuki KISHIHARA ,  Yukihisa WADA ,  Takuro IZUMI ,  Taro SHIRAI ,  Takahiro DOKI ,  Satoshi SANO ,  Akira HORIBA

IPC: A61B6/00 ,  G01N23/046

Abstract: Provided is a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject. According to the present invention, it is possible to provide a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject immediately before. That is, the apparatus of the present invention is provided with a phase grating 5 provided with a subject area and a reference area. Both areas each have a predetermined pattern that absorbs radiation, but the patterns are different from each other. In this area, an image of the phase grating 5 is observed in a moire pattern of a long period. This moire image of a long period changes in the positions due to the minute change in the relative position between the phase grating 5 and the absorption grating 6, so it becomes possible to detect the minute change of the relative position between the radiation source, the phase grating 5, and the absorption grating 6 from the image of the reference area.