公开(公告)号：US20200158662A1

公开(公告)日：2020-05-21

申请号：US16319574

申请日：2017-07-10

Applicant: Shimadzu Corporation ,  OSAKA UNIVERSITY

Inventor： Akira HORIBA ,  Koichi TANABE ,  Toshinori YOSHIMUTA ,  Kenji KIMURA ,  Hiroyuki KISHIHARA ,  Yukihisa WADA ,  Takuro IZUMI ,  Taro SHIRAI ,  Takahiro DOKI ,  Satoshi SANO ,  Takayoshi SHIMURA ,  Heiji WATANABE ,  Takuji HOSOI

IPC: G01N23/041 ,  A61B6/00

Abstract: This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1), a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects X-rays, an adjustment mechanism (6), and a controller (7) that controls the adjustment mechanism (6) to adjust a misalignment of the first grating (3) or a misalignment of the second grating (4) based on Moire fringes detected by the detector (5).

公开(公告)号：US20190056336A1

公开(公告)日：2019-02-21

申请号：US16081249

申请日：2017-02-22

Applicant: SHIMADZU CORPORATION ,  OSAKA UNIVERSITY

Inventor： Takahiro DOKI ,  Koichi TANABE ,  Toshinori YOSHIMUTA ,  Kenji KIMURA ,  Akihiro NISHIMURA ,  Taro SHIRAI ,  Satoshi SANO ,  Akira HORIBA ,  Takayoshi SHIMURA ,  Heiji WATANABE ,  Takuji HOSOI

IPC: G01N23/041 ,  G01N23/20 ,  A61B6/00

Abstract: [PROBLEM TO BE SOLVED] To provide a radiation phase contrast imaging device having a small device configuration[SOLVING MEANS] The present invention focused on the findings that the distance between the phase grating 5 and the FPD 4 does not need to be the Talbot distance. The distance between the phase grating 5 and the FPD 4 can be more freely set. However, a self-image cannot be detected unless the self-image is sufficiently magnified with respect to the phase grating 5. The degree on how much the self-image is magnified on the FPD 4 with respect to the original phase grating 5 is determined by a magnification ratio X2/X1. Therefore, in the present invention, the magnification ratio is set to be the same as the magnification ratio in a conventional configuration. With this, even if the distance X2 between the radiation source 3 and the FPD 4 is reduced, a situation in which the self-image cannot be detected by the FPD 4 due to the excessively small size thereof does not occur.

公开(公告)号：US20190167219A1

公开(公告)日：2019-06-06

申请号：US16321297

申请日：2017-07-10

Applicant: Shimadzu Corporation ,  OSAKA UNIVERSITY

Inventor： Satoshi SANO ,  Koichi TANABE ,  Toshinori YOSHIMUTA ,  Kenji KIMURA ,  Hiroyuki KISHIHARA ,  Yukihisa WADA ,  Takuro IZUMI ,  Taro SHIRAI ,  Takahiro DOKI ,  Akira HORIBA ,  Takayoshi SHIMURA ,  Heiji WATANABE ,  Takuji HOSOI

IPC: A61B6/00

Abstract: This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1) that radiates continuous X-rays, a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects the continuous X-rays, and a third grating (2) arranged between the detector (5) and the first grating 3. The first grating (3), the second grating (4), and the third grating (2) are arranged so as to satisfy conditions of predetermined formulas.

公开(公告)号：US20190293577A1

公开(公告)日：2019-09-26

申请号：US16463305

申请日：2016-12-08

Applicant: Shimadzu Corporation

Inventor： Akira HORIBA ,  Taro SHIRAI ,  Takahiro DOKI ,  Satoshi SANO

IPC: G01N23/20025 ,  G01N23/20

Abstract: This X-ray phase imaging apparatus (100) includes a controller (5) that generates a dark field image (Iv) with respect to each of a plurality of relative positions between a subject (S) and an imaging grating (G1) changed by an adjustment mechanism (3) to acquire a contrast of a region of interest (ROI) in the dark field image (Iv), and controls the adjustment mechanism (3) to adjust a relative position between the subject (S) and the imaging grating (G1) based on the acquired contrast.

公开(公告)号：US20180368799A1

公开(公告)日：2018-12-27

申请号：US16002495

申请日：2018-06-07

Applicant: Shimadzu Corporation

Inventor： Satoshi SANO ,  Taro SHIRAI ,  Takahiro DOKI ,  Akira HORIBA ,  Naoki MORIMOTO

IPC: A61B6/00

CPC classification number: A61B6/5235 ,  A61B6/4035 ,  A61B6/4291 ,  A61B6/484 ,  A61B6/5264

Abstract: The X-ray imaging apparatus is equipped with an image processing unit for performing a position adjustment of a first dark field image and a second dark field image based on a positional difference amount between a first absorption image of an object and a second absorption image of the object.

公开(公告)号：US20180279972A1

公开(公告)日：2018-10-04

申请号：US15562777

申请日：2016-03-01

Applicant: SHIMADZU CORPORATION

Inventor： Koichi TANABE ,  Shingo FURUI ,  Toshinori YOSHIMUTA ,  Kenji KIMURA ,  Akihiro NISHIMURA ,  Taro SHIRAI ,  Takahiro DOKI ,  Satoshi SANO ,  Akira HORIBA ,  Toshiyuki SATO

IPC: A61B6/10 ,  G01T1/20 ,  A61B6/00

CPC classification number: G01T1/2018 ,  A61B6/4208 ,  A61B6/4233 ,  A61B6/484

Abstract: In an X-ray imaging device according to a first embodiment, an X-ray detector has a configuration in which scintillator elements are defined by light-shielding walls in a lattice shape. Among X-rays incident on the X-ray detector, X-rays incident on the light-shielding walls are not converted into scintillator light and are transmitted by the X-ray detector. Accordingly, by causing X-rays to be incident on the X-ray detector in which the scintillator elements are defined by the light-shielding walls in a lattice shape, an area in which X-rays 3a transmitted by a subject M are incident on the X-ray detector can be limited to an arbitrary range. Accordingly, since a detection mask can be omitted in the X-ray imaging device which is used for EI-XPCi, it is possible to reduce a manufacturing cost of the X-ray imaging device.

公开(公告)号：US20190072502A1

公开(公告)日：2019-03-07

申请号：US16121715

申请日：2018-09-05

Applicant: Shimadzu Corporation

Inventor： Satoshi SANO ,  Taro SHIRAI ,  Takahiro DOKI ,  Akira HORIBA ,  Naoki MORIMOTO

IPC: G01N23/046 ,  G01N23/20008

Abstract: The X-ray imaging apparatus is provided with an X-ray source, a plurality of gratings including a first grating and a second grating, a detector, a rotation mechanism for relatively rotating a subject including a fiber bundle and an imaging system, and an image processor for generating a dark field image. The image processor is configured to obtain a three-dimensional dark field image of the subject including at least the fiber bundle from a plurality of dark field images captured at a plurality of rotation angles.

公开(公告)号：US20190072501A1

公开(公告)日：2019-03-07

申请号：US16115875

申请日：2018-08-29

Applicant: Shimadzu Corporation

Inventor： Takahiro DOKI ,  Kenji KIMURA ,  Taro SHIRAI ,  Satoshi SANO ,  Akira HORIBA ,  Naoki MORIMOTO

IPC: G01N23/041

CPC classification number: G01N23/041 ,  A61B6/0407 ,  A61B6/4291 ,  A61B6/44 ,  A61B6/484 ,  A61B6/508 ,  A61B6/589 ,  G01N2223/3308 ,  G01N2223/40

Abstract: The radiation phase contrast imaging apparatus includes an X-ray source, a first grating, a second grating arranged between the X-ray source and the first grating, and a moving mechanism for moving an object stage for holding an object. The moving mechanism is configured to more the object stage to an X-ray source side of the first grating and a second grating side of the first grating opposite to the source side of the first grating.

公开(公告)号：US20180368795A1

公开(公告)日：2018-12-27

申请号：US16002517

申请日：2018-06-07

Applicant: Shimadzu Corporation

Inventor： Akira HORIBA ,  Taro SHIRAI ,  Takahiro DOKI ,  Satoshi SANO ,  Naoki MORIMOTO

IPC: A61B6/00 ,  G01N23/20 ,  G01N23/20008

Abstract: This X-ray phase-contrast imaging apparatus is equipped with a plurality of gratings and grating holders for holding the plurality of gratings. The plurality of gratings is arranged such that the extending direction of grating components of the plurality of gratings is oriented in a direction in which the positional displacement due to the grating holder becomes maximum in a plane orthogonal to an optical axis of the X-ray.

公开(公告)号：US20180306734A1

公开(公告)日：2018-10-25

申请号：US15958048

申请日：2018-04-20

Applicant: Shimadzu Corporation

Inventor： Naoki MORIMOTO ,  Taro SHIRAI ,  Takahiro DOKI ,  Satoshi SANO ,  Akira HORIBA

IPC: G01N23/041

Abstract: An X-ray phase contrast imaging system includes an X-ray source, a detector, a plurality of gratings including a first grating and a second grating, and a grating positional displacement acquisition section configured to obtain a positional displacement of the grating based on a Fourier transform image obtained by Fourier transforming an interference fringe image detected by the detector.