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1.Method for producing a p-n junction in a monocrystalline semiconductor member by etching and diffusion 失效
Title translation: 通过蚀刻和扩散在单晶半导体部件中制造p-n结的方法公开(公告)号:US3375146A
公开(公告)日:1968-03-26
申请号:US38304064
申请日:1964-07-16
Applicant: SIEMENS AG
Inventor: RICHARD WIESNER
CPC classification number: H01L21/00 , C30B25/02 , H01L29/00 , Y10S438/923
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2.Voltage-sensitive variable p-n junction capacitor with intermediate control zone 失效
Title translation: 具有中间控制区的电压敏感可变p-n结电容器公开(公告)号:US3411053A
公开(公告)日:1968-11-12
申请号:US54032166
申请日:1966-04-05
Applicant: SIEMENS AG
Inventor: RICHARD WIESNER
CPC classification number: H03F3/04 , H01L29/00 , H01L29/93 , Y10S438/901
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公开(公告)号:US3152294A
公开(公告)日:1964-10-06
申请号:US85517159
申请日:1959-11-24
Applicant: SIEMENS AG
Inventor: KARL SIEBERTZ , RICHARD WIESNER
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公开(公告)号:US3380154A
公开(公告)日:1968-04-30
申请号:US39545064
申请日:1964-09-10
Applicant: SIEMENS AG
Inventor: KARL SIEBERTZ , RICHARD WIESNER
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5.Method of producing a p-n junction in a monocrystalline semiconductor device 失效
Title translation: 在单晶半导体器件中制造p-n结的方法公开(公告)号:US3260624A
公开(公告)日:1966-07-12
申请号:US19327062
申请日:1962-05-08
Applicant: SIEMENS AG
Inventor: RICHARD WIESNER
CPC classification number: H01L21/00 , C30B25/02 , H01L29/00 , Y10S148/037 , Y10S148/039 , Y10S148/049 , Y10S148/151 , Y10S438/919 , Y10S438/923
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