ELECTRONIC DEVICE FOR CONTROLLING COMMAND INPUT

    公开(公告)号:US20220293168A1

    公开(公告)日:2022-09-15

    申请号:US17830091

    申请日:2022-06-01

    Applicant: SK hynix Inc.

    Abstract: An electronic device includes a command generation circuit configured to generate a refresh command and a driving control signal, which are enabled during an all-bank refresh operation, according to a logic level combination of an internal chip selection signal and an internal command address. The electronic device also includes a buffer control circuit configured to generate, from the refresh command and the driving control signal, a first buffer enable signal for enabling a first group of buffers and a second buffer enable signal for enabling a second group of buffers.

    SYSTEM FOR PERFORMING A PHASE CONTROL OPERATION

    公开(公告)号:US20210359689A1

    公开(公告)日:2021-11-18

    申请号:US17005095

    申请日:2020-08-27

    Applicant: SK hynix Inc.

    Inventor: Geun Ho CHOI

    Abstract: A system for performing a phase control operation includes: an internal clock generation circuit configured to generate an internal clock by delaying a clock by a first delay variation, and generate a reference clock by delaying the clock by a second delay variation, wherein the internal clock generation circuit generates the internal clock by delaying the clock by the first delay variation which is controlled according to a phase difference between the internal clock and the reference clock; and a data input/output circuit configured to input/output data in synchronization with the internal clock.

    SEMICONDUCTOR DEVICES
    3.
    发明申请

    公开(公告)号:US20190325927A1

    公开(公告)日:2019-10-24

    申请号:US16212545

    申请日:2018-12-06

    Applicant: SK hynix Inc.

    Abstract: A semiconductor device includes a shift register and a control signal generation circuit. The shift register generates shifted pulses, wherein a number of the shifted pulses is controlled according to a mode of a burst length. The control signal generation circuit generates a control signal for setting a burst operation period according to a period during which the shifted pulses are created. The burst operation period is a period during which a burst operation is performed.

    SEMICONDUCTOR DEVICE
    4.
    发明申请

    公开(公告)号:US20200285532A1

    公开(公告)日:2020-09-10

    申请号:US16589984

    申请日:2019-10-01

    Applicant: SK hynix Inc.

    Abstract: A semiconductor device includes an error detection circuit configured to generate fixed data by fixing any one of a first group and a second group included in internal data to a preset level based on a burst chop signal and an internal command address in response to a read command, and generate an error detection signal by detecting an error of the fixed data; and a data output circuit configured to generate latch data by latching the internal data based on a first latch output control signal, and generate output data by serializing the latch data and the error detection signal based on a second latch output control signal.

    SYSTEM FOR PERFORMING PHASE MATCHING OPERATION

    公开(公告)号:US20210327478A1

    公开(公告)日:2021-10-21

    申请号:US16932077

    申请日:2020-07-17

    Applicant: SK hynix Inc.

    Abstract: A system for performing a phase matching operation includes a controller configured to output a clock, a command, and a strobe signal, and to input/output data. The system also includes a semiconductor device configured to generate an internal strobe signal by matching the phases of the command and the strobe signal according to the clock, and to input/output the data in synchronization with the internal strobe signal, wherein the semiconductor device generates the internal strobe signal from the strobe signal by compensating for a delay amount of a first path to which the command is inputted and a delay amount of a second path to which the strobe signal is inputted.

    SHIFT REGISTERS
    7.
    发明申请
    SHIFT REGISTERS 审中-公开

    公开(公告)号:US20200285269A1

    公开(公告)日:2020-09-10

    申请号:US16514666

    申请日:2019-07-17

    Applicant: SK hynix Inc.

    Inventor: Geun Ho CHOI

    Abstract: A shift register includes a latch clock generation circuit and a clock latch circuit. The latch clock generation circuit generates a latch clock signal and an inverted latch clock signal based on a first internal clock signal, a first inverted internal clock signal, a second internal clock signal, and a second inverted internal clock signal. The clock latch circuit latches a control signal in synchronization with one signal selected from the first internal clock signal, the first inverted internal clock signal, the second internal clock signal, and the second inverted internal clock signal. The clock latch circuit also latches the latched control signal in synchronization with the latch clock signal or the inverted latch clock signal to generate and output a shift control signal.

    PORTABLE TEST APPARATUS FOR A SEMICONDUCTOR APPARATUS, AND TEST METHOD USING THE SAME
    9.
    发明申请
    PORTABLE TEST APPARATUS FOR A SEMICONDUCTOR APPARATUS, AND TEST METHOD USING THE SAME 审中-公开
    半导体装置的便携式测试装置及使用其的测试方法

    公开(公告)号:US20160370428A1

    公开(公告)日:2016-12-22

    申请号:US14845010

    申请日:2015-09-03

    Applicant: SK hynix Inc.

    Inventor: Geun Ho CHOI

    CPC classification number: G01R31/2868 G01R31/2889 G01R31/2896 G01R31/2898

    Abstract: A portable test apparatus may be provided. The portable test apparatus may include a socket board configured to allow mounting of a semiconductor apparatus decapsulated for package testing. The portable test apparatus may include a test logic board electrically coupled to the socket board, the test logic board configured to perform a test on the semiconductor apparatus and for analyzing a test result. The test logic board may receive power through the socket board. The test logic board may be configured for receiving a command from outside the test apparatus, generating and analyzing a test pattern, and outputting the test result.

    Abstract translation: 可以提供便携式测试装置。 便携式测试装置可以包括插座板,其被配置为允许安装用于封装测试的半封装装置。 便携式测试装置可以包括电耦合到插座板的测试逻辑板,测试逻辑板被配置为对半导体设备执行测试并分析测试结果。 测试逻辑板可以通过插座板接收电源。 测试逻辑板可以被配置为从测试设备外部接收命令,生成和分析测试模式,并输出测试结果。

    ELECTRONIC DEVICE FOR CONTROLLING COMMAND INPUT

    公开(公告)号:US20210366535A1

    公开(公告)日:2021-11-25

    申请号:US17011496

    申请日:2020-09-03

    Applicant: SK hynix Inc.

    Abstract: An electronic device includes a command generation circuit configured to generate a refresh command and a driving control signal, which are enabled during an all-bank refresh operation, according to a logic level combination of an internal chip selection signal and an internal command address. The electronic device also includes a buffer control circuit configured to generate, from the refresh command and the driving control signal, a first buffer enable signal for enabling a first group of buffers and a second buffer enable signal for enabling a second group of buffers.

Patent Agency Ranking