公开(公告)号：US11898971B2

公开(公告)日：2024-02-13

申请号：US17622535

申请日：2020-06-24

Applicant: SMS group GmbH ,  IMS Messsysteme GmbH

Inventor： Christian Klinkenberg ,  Ulrich Sommers ,  Helmut Klein ,  Alexandre Lhoest ,  Olivier Pensis ,  Horst Krauthäuser

IPC: G01N23/20008 ,  G01N23/205 ,  G01N23/207 ,  G01N23/20091 ,  H01J35/08 ,  H01J35/10

CPC classification number: G01N23/20008 ,  G01N23/205 ,  G01N23/207 ,  G01N23/20091 ,  H01J35/08 ,  H01J35/10 ,  H01J35/112 ,  H01J35/116 ,  G01N2223/056 ,  G01N2223/1016 ,  G01N2223/20 ,  G01N2223/315 ,  G01N2223/316 ,  G01N2223/606 ,  G01N2223/624

Abstract: A method and a device for determining the material properties of a polycrystalline, in particular metallic, product during production or quality control of the polycrystalline, in particular metallic, product by means of X-ray diffraction using at least one X-ray source and at least one X-ray detector. In this case, an X-ray generated by the X-ray source is directed onto a surface of the polycrystalline product and the resulting diffraction image of the X-ray is recorded by the X-ray detector. After exiting the X-ray source, the X-ray is passed through an X-ray mirror, wherein the X-ray is both monochromatized and focused, by the X-ray mirror, in the direction of the polycrystalline product and/or the X-ray detector, and then reaches a surface of the metallic product.

公开(公告)号：US11249037B2

公开(公告)日：2022-02-15

申请号：US16304626

申请日：2017-05-24

Applicant: SMS GROUP GMBH

Inventor： Mostafa Biglari ,  Ulrich Sommers ,  Christian Klinkenberg ,  Michel Renard ,  Guy Raymond ,  Oliver Pensis ,  Tobias Terlau ,  Horst Krauthäuser

IPC: G01N23/20008 ,  C21D9/56 ,  C21D11/00 ,  G01N23/20 ,  G01N33/204 ,  B21B1/00 ,  B21B38/02

Abstract: A device for determining the microstructure of a metal product during metallurgical production of the metal product, the device having at least one X-ray source, at least one X-ray detector and at least one accommodating chamber, inside which the X-ray source and/or the X-ray detector is/are arranged and which has at least one window which is transparent to X-ray radiation. To allow reliable determination of the microstructure of a metal product during the metallurgical production thereof, the device includes at least one cooling installation for actively cooling the accommodating chamber.