Solid-state imaging element and imaging device

    公开(公告)号:US12133008B2

    公开(公告)日:2024-10-29

    申请号:US17798460

    申请日:2021-01-26

    Inventor: Satoshi Azuhata

    CPC classification number: H04N25/75 H04N25/768 H04N25/772 H04N25/778 H04N25/79

    Abstract: To improve a frame rate in a solid-state imaging element that compares a reference signal and a pixel signal.
    The solid-state imaging element includes a differential amplifier circuit, a transfer transistor, and a source follower circuit. The differential amplifier circuit amplifies a difference between the potentials of a pair of input nodes and outputs the difference from an output node. The transfer transistor transfers charge from a photoelectric conversion element to a floating diffusion layer. The auto-zero transistor short-circuits the floating diffusion layer and the output node in a predetermined period. The source follower circuit supplies a potential to one of the pair of input nodes according to a potential of the floating diffusion layer.

    SOLID-STATE IMAGING ELEMENT AND IMAGING DEVICE

    公开(公告)号:US20230049629A1

    公开(公告)日:2023-02-16

    申请号:US17798460

    申请日:2021-01-26

    Inventor: Satoshi Azuhata

    Abstract: To improve a frame rate in a solid-state imaging element that compares a reference signal and a pixel signal.
    The solid-state imaging element includes a differential amplifier circuit, a transfer transistor, and a source follower circuit. The differential amplifier circuit amplifies a difference between the potentials of a pair of input nodes and outputs the difference from an output node. The transfer transistor transfers charge from a photoelectric conversion element to a floating diffusion layer. The auto-zero transistor short-circuits the floating diffusion layer and the output node in a predetermined period. The source follower circuit supplies a potential to one of the pair of input nodes according to a potential of the floating diffusion layer.

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