公开(公告)号：US20150303933A1

公开(公告)日：2015-10-22

申请号：US14683325

申请日：2015-04-10

Applicant: STMICROELECTRONICS S.r.l.

Inventor： Mauro GIACOMINI ,  Carmelo BURGIO

IPC: H03M1/08 ,  H03M1/46 ,  H03M1/12 ,  H03M1/10

CPC classification number: H03M1/0809 ,  H03M1/1033 ,  H03M1/1057 ,  H03M1/1245 ,  H03M1/464 ,  H03M1/466 ,  H03M1/687 ,  H03M1/804 ,  H03M1/806

Abstract: A method of calibrating a thermometer-code SAR-A/D converter is provided. The thermometer-code SAR-A/D converter includes an Nbit-bit digital-to-analog converter (DAC) for outputting an Nbit-bit output code. The DAC includes a first subconverter having a plurality of NTh thermometer elements Tj and a second subconverter having a plurality of NBin binary-weighted elements. The Nbit output code is equal to the sum of NBitTh and NBitBin where NTh=2NBitTh and NBitBin is equal to NBin=NBitBin. The calibration method includes determining an Integral Non-Linearity error value (εR) of an Rth thermometer-code level of the thermometer elements. The method further includes reducing the highest of the error value εR to obtain a reduced error value, and generating the output code according to said reduced error.

Abstract translation: 提供了一种校准温度计编码SAR-A / D转换器的方法。 温度计编码SAR-A / D转换器包括用于输出N位位输出代码的N位位数/模转换器（DAC）。 DAC包括具有多个NTh温度计元件Tj的第一子转换器和具有多个NBin二进制加权元件的第二子转换器。 Nbit输出代码等于NBitTh和NBitBin之和，其中NTh = 2NBitTh和NBitBin等于NBin = NBitBin。 校准方法包括确定温度计元件的Rth温度计代码电平的积分非线性误差值（＆amp; R）。 该方法还包括减小误差值的最高值，以获得减小的误差值，并根据所述减小的误差产生输出代码。

公开(公告)号：US20230168300A1

公开(公告)日：2023-06-01

申请号：US18053688

申请日：2022-11-08

Applicant: STMICROELECTRONICS S.r.l. ,  STMicroelectronics International N.V.

Inventor： Mauro GIACOMINI ,  Fabio Enrico Carlo DISEGNI ,  Rajesh NARWAL ,  Pravesh Kumar SAINI ,  Mayankkumar HARESHBHAI NIRANJANI

IPC: G01R31/315 ,  H01L21/66

CPC classification number: G01R31/315 ,  H01L22/12

Abstract: An assembly for detecting a structural defect in a semiconductor die is provided. The assembly includes a defect-detection sensor and a microcontroller. The defect-detection sensor includes a plurality of resistive paths of electrical-conductive material in the semiconductor die, each of which has a first end and a second end and extends proximate a perimeter of the semiconductor die. The defect-detection sensor includes a plurality of signal-generation structures, each coupled to a respective resistive path and configured to supply a test signal to the resistive path. The microcontroller is configured to control the signal-generation structures to generate the test signals, acquire the test signals in each resistive paths, test an electrical feature of the resistive paths by performing an analysis of the test signals acquired and detect the presence of the structural defect in the semiconductor die based on a result of the analysis of the test signals acquired.

公开(公告)号：US20160149583A1

公开(公告)日：2016-05-26

申请号：US14835110

申请日：2015-08-25

Applicant: STMICROELECTRONICS S.R.L.

Inventor： Carmelo BURGIO ,  Mauro GIACOMINI

IPC: H03M1/10 ,  H03M1/12 ,  H03M1/80 ,  H03M1/46

CPC classification number: H03M1/1047 ,  H03M1/00 ,  H03M1/0695 ,  H03M1/1033 ,  H03M1/12 ,  H03M1/1245 ,  H03M1/462 ,  H03M1/466 ,  H03M1/687 ,  H03M1/802 ,  H03M1/804 ,  H03M1/806 ,  H03M1/808

Abstract: The present disclosure relates to a method of self-calibration of a successive approximation register-analog-to-digital converter. The method includes measuring an error value for each thermometer element of a plurality of thermometer elements and determining a mean value of measured error values. The method also includes generating a thermometer scale where each level of the thermometer scale will be an incremental sum of each value of a first subset, and each further level of the thermometer scale will be a sum of all values of a second subset plus the incremental sum of the elements of the first subset in any order. In addition, the method includes generating the output code according to the thermometer scale.

Abstract translation: 本公开涉及逐次逼近寄存器 - 模数转换器的自校准方法。 该方法包括测量多个温度计元件中每个温度计元件的误差值，并确定测量误差值的平均值。 该方法还包括生成温度计量表，其中温度计量表的每个水平将是第一子集的每个值的增量和，并且温度计量度的每个进一步水平将是第二子集的所有值加上增量 任何顺序的第一个子集元素的总和。 此外，该方法包括根据温度计量程生成输出代码。