Abstract:
An interleaved memory having an interleaved data path includes an array of memory cells divided into a first bank of memory cells and a second bank of memory cells, first and second arrays of sense amplifiers respectively coupled to the first and second bank of memory cells, and first and second read registers respectively coupled to the first and second arrays of sense amplifiers. A control and timing circuit is connected to the first and second arrays of sense amplifiers and has inputs for receiving externally generated command signals, and outputs for providing path selection signals and a control signal. A third register is connected to the first and second read registers and has inputs for receiving read data therein as a function of the path selection signals. An array of pass-gates are connected to the third register and are controlled in common by the control signal for enabling a transfer of the read data stored in the third register to an array of output buffers.
Abstract:
An effective Electric Wafer Sort (EWS) flow is implemented by expanding the functions of the micro-controller embedded in a FLASH EPROM memory device and of the integrated test structures. The architecture provides for executing test routines internally without involving any external complex or expensive test equipment to control the test program. The processes are executed by the onboard micro-controllers (that may be reading either from an embedded ROM or from a GLOBAL CACHE provided). Managing test routines by an internal process permits the device architecture to be transparent from a tester point of view, by purposely creating a standard interface with a set of defined commands and instructions to be interpreted by the on board microcontroller and internally executed.
Abstract:
A multipurpose memory device suitable for a broader range of applications, whether requiring the reading of data in an asynchronous mode with random access (as in a standard memory) or in a synchronous sequential mode with sequential or burst type access, is capable of recognizing the mode of access and the mode of reading that is currently required by the microprocessor. The memory device self-conditions its internal circuitry as a function of such a recognition in order to read data in the requested mode without requiring the use of additional external control signals and/or implying a penalization in terms of access time and reading time compared to those which, for the same fabrication technology and state of the art design, may be attained with memory devices specifically designed for either one or the other mode of operation.