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Patent Agency Ranking
公开(公告)号：US20130200914A1
公开(公告)日：2013-08-08
申请号：US13749066
申请日：2013-01-24
Applicant: Samsung Electronics Co., Ltd.
Inventor： Do-Yun Kim , In-Seok Hwang , Sang-Boo Kang
IPC: G01R1/073
CPC classification number: G01R1/07342 , G01R3/00
Abstract: A method of cleaning needles of a probe card in a test system includes mounting the probe card, which has a plurality of device under tests (DUTs) and needles, in a card mounting part. The DUTs and needles are scanned using a camera positioned in the test system to provide a scan result. A laser beam is focused on at least one of the needles based on the scan result and the laser beam is irradiated on the at least one of the needles to clean the at least one of the needles.
Abstract translation: 在测试系统中清洁探针卡的针的方法包括将具有多个测试装置（DUT）和针的探针卡安装在卡安装部分中。 使用位于测试系统中的摄像机对DUT和针进行扫描，以提供扫描结果。 激光束基于扫描结果聚焦在至少一个针上，并且激光束被照射在至少一个针上以清洁至少一个针。
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公开(公告)号：US11775807B2
公开(公告)日：2023-10-03
申请号：US16367662
申请日：2019-03-28
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Jae-Gon Kim , Kyoung-Young Kim , Do-Yun Kim , Jun-Seok Park , Sang-Hyuck Ha
CPC classification number: G06N3/063 , G06F7/4991 , G06F17/18
Abstract: An artificial neural network (ANN) system includes a processor, a virtual overflow detection circuit and a data format controller. The processor performs node operations with respect to a plurality of nodes included in each layer of an ANN to obtain a plurality of result values of the node operations and performs a quantization operation on the obtained plurality of result values based on a k-th fixed-point format for a current quantization of the each layer to obtain a plurality of quantization values. The virtual overflow detection circuit generates a virtual overflow information indicating a distribution of valid bit numbers of the obtained plurality of quantization values. The data format controller determines a (k+1)-th fixed-point format for a next quantization of the each layer based on the generated virtual overflow information. An overflow and/or an underflow are prevented efficiently by controlling the fixed-point format using the virtual overflow.
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公开(公告)号：US11341305B2
公开(公告)日：2022-05-24
申请号：US16433266
申请日：2019-06-06
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Kwang-Hoon Kim , Do-Yun Kim , Ki-Wook Song , Sung-Bo Shim , Ji-Hye Lee , Dong-Chul Ihm , Woo-Young Cheon
IPC: G01N21/95 , G06F30/367 , H01L21/66 , G06F30/398
Abstract: A method of predicting a shape of a semiconductor device includes implementing a modeled semiconductor shape with respect to a designed semiconductor layout, extracting a plurality of samples by independently linearly combining process variables with respect to the modeled semiconductor shape; generating virtual spectrums with respect to ones of the extracted plurality of samples through optical analysis, indexing the virtual spectrums to produce indexed virtual spectrums, generating a shape prediction model by using the indexed virtual spectrums as an input and the modeled semiconductor shape as an output, and indexing a spectrum measured from a manufactured semiconductor device and inputting the spectrum to the shape prediction model to predict a shape of the manufactured semiconductor device.
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公开(公告)号：US09705583B2
公开(公告)日：2017-07-11
申请号：US15130317
申请日：2016-04-15
Applicant: Samsung Electronics Co., Ltd.
Inventor： Hyun-Seok Yu , Do-Yun Kim , Beom-Kon Kim , Hwan-Min Park , Chae-Hag Yi
IPC: H04B17/00 , H04B7/08 , H04B17/318 , H04B17/21
CPC classification number: H04B7/0814 , H04B17/12 , H04B17/21 , H04B17/318
Abstract: A communication device and a method of controlling the same. The communication device includes at least one receiver configured to connect to a first antenna for receiving a first signal and a second antenna for receiving a second signal; and a processor electrically coupled to the at least one receiver, wherein the processor is configured to measure received signal strengths of the first signal and the second signal based on calibration operation for the first antenna and the second antenna, select one of the first antenna and the second antenna based on the measured received signal strengths, and control the at least one receiver to receive a signal through the selected one of the first antenna and the second antenna.
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公开(公告)号：US09322849B2
公开(公告)日：2016-04-26
申请号：US13749066
申请日：2013-01-24
Applicant: Samsung Electronics Co., Ltd.
Inventor： Do-Yun Kim , In-Seok Hwang , Sang-Boo Kang
CPC classification number: G01R1/07342 , G01R3/00
Abstract: A method of cleaning needles of a probe card in a test system includes mounting the probe card, which has a plurality of device under tests (DUTs) and needles, in a card mounting part. The DUTs and needles are scanned using a camera positioned in the test system to provide a scan result. A laser beam is focused on at least one of the needles based on the scan result and the laser beam is irradiated on the at least one of the needles to clean the at least one of the needles.
Abstract translation: 在测试系统中清洁探针卡的针的方法包括将具有多个测试装置（DUT）和针的探针卡安装在卡安装部分中。 使用位于测试系统中的摄像机对DUT和针进行扫描，以提供扫描结果。 激光束基于扫描结果聚焦在至少一个针上，并且激光束被照射在至少一个针上以清洁至少一个针。
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