MEMORY DEVICES
    1.
    发明申请

    公开(公告)号:US20220319575A1

    公开(公告)日:2022-10-06

    申请号:US17705915

    申请日:2022-03-28

    Abstract: Disclosed is a memory device including a row decoder generating word line (WL) control signals based on a row address from an external device, a first sub-array including memory cells connected to word lines, a first sub-word line driver (SWD) providing a selection voltage or a non-selection voltage to odd-numbered word lines of the word lines based on odd-numbered WL control signals corresponding to the odd-numbered word lines, and a second SWD providing the selection voltage or the non-selection voltage to even-numbered word lines of the word lines based on even-numbered WL control signals corresponding to the even-numbered word lines. The first SWD applies the non-selection voltage to non-selection word lines of the even-numbered word lines, in response to the even-numbered WL control signals, and the second SWD applies the non-selection voltage to non-selection word lines of the odd-numbered word lines, in response to the odd-numbered WL control signals.

    Semiconductor memory device
    2.
    发明授权

    公开(公告)号:US12075611B2

    公开(公告)日:2024-08-27

    申请号:US17481583

    申请日:2021-09-22

    CPC classification number: H10B12/315 G11C5/063 H01L29/0607 H10B12/05 H10B12/50

    Abstract: A semiconductor memory includes a bit line extending in a first direction, first and second active patterns, which are alternately disposed in the first direction and on the bit line, and each of which includes a horizontal portion and a vertical portion, first word lines disposed on the horizontal portions of the first active patterns to cross the bit line, second word lines disposed on the horizontal portions of the second active patterns to cross the bit line, and an intermediate structure provided in a first gap region between the first and second word lines or in a second gap region between the vertical portions of the first and second active patterns. The first and second active patterns, which are adjacent to each other, may be disposed to be symmetric with respect to each other.

    Semiconductor memory device and method for fabricating the same

    公开(公告)号:US12080791B2

    公开(公告)日:2024-09-03

    申请号:US17400218

    申请日:2021-08-12

    CPC classification number: H01L29/7813 H01L27/088 H01L29/24 H10B12/30

    Abstract: A semiconductor memory device with improved performance by improving interface characteristics while reducing a leakage current, and a method for fabricating the same are provided. The semiconductor memory device includes a conductive line on a substrate, a first interlayer insulating layer exposing the conductive line and defining a channel trench on the substrate, a channel layer extending along a bottom and side surface of the channel trench, a first gate electrode and a second gate electrode spaced apart from each other in the channel trench, a first gate insulating layer between the channel layer and the first gate electrode, and a second gate insulating layer between the channel layer and the second gate electrode. The channel layer includes a first oxide semiconductor layer and a second oxide semiconductor layer sequentially stacked on the conductive line. The first oxide semiconductor layer has a greater crystallinity than the second oxide semiconductor layer.

    Memory devices
    4.
    发明授权

    公开(公告)号:US11887653B2

    公开(公告)日:2024-01-30

    申请号:US17705915

    申请日:2022-03-28

    CPC classification number: G11C11/4085 G11C11/4087 H10B12/315

    Abstract: Disclosed is a memory device including a row decoder generating word line (WL) control signals based on a row address from an external device, a first sub-array including memory cells connected to word lines, a first sub-word line driver (SWD) providing a selection voltage or a non-selection voltage to odd-numbered word lines of the word lines based on odd-numbered WL control signals corresponding to the odd-numbered word lines, and a second SWD providing the selection voltage or the non-selection voltage to even-numbered word lines of the word lines based on even-numbered WL control signals corresponding to the even-numbered word lines. The first SWD applies the non-selection voltage to non-selection word lines of the even-numbered word lines, in response to the even-numbered WL control signals, and the second SWD applies the non-selection voltage to non-selection word lines of the odd-numbered word lines, in response to the odd-numbered WL control signals.

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