-
公开(公告)号：US20220060358A1
公开(公告)日：2022-02-24
申请号：US17368459
申请日：2021-07-06
Applicant: Samsung Electronics Co., Ltd.
Inventor： Seongkwan Lee , Minho Kang , Cheolmin Park
Abstract: A receiver, which is compatible with a mobile industry processor interface (MIPI) C-PHY physical layer, includes a plurality of variable-gain amplifiers responsive to respective multi-level signals (e.g., 3-level signals), and a plurality of filters having variable cutoff frequencies. The plurality of filters are responsive to respective signals generated by the plurality of amplifiers. An array of comparators is provided, which is responsive to signals generated by the plurality of filters. A jitter detection circuit is provided, which is configured to set respective gains of the plurality of variable-gain amplifiers and respective cutoff frequencies of the plurality of filters (e.g., high-pass filters), in response to signals generated by the array of comparators.
-
Patent Agency Ranking
公开(公告)号：US11169449B2
公开(公告)日：2021-11-09
申请号：US16655973
申请日：2019-10-17
Applicant: Samsung Electronics Co., Ltd.
Inventor： Daesung Jung , Younsok Choi , Jongmin Song , Minho Kang , Sangyoon Soh , Hohyun Lee
Abstract: A measuring apparatus for a vacuum chamber capable of accurately measuring physical properties or quantities in the vacuum chamber in an exposure process in real time, and a measuring system including the measuring apparatus are described herein. The measuring apparatus includes: a body having a shape of an exposure mask used in an exposure process; and a measuring element in an interior of the body or on a first surface of the body. When the measuring apparatus is positioned in a vacuum chamber during the exposure process, the measuring apparatus is configured to measure physical properties in the vacuum chamber using the measuring element. The body or the measuring element is configured to withstand a vacuum in the vacuum chamber including resisting or preventing physical deformation of the body or the measuring element due to the vacuum.
-
公开(公告)号：US11843487B2
公开(公告)日：2023-12-12
申请号：US17368459
申请日：2021-07-06
Applicant: Samsung Electronics Co., Ltd.
Inventor： Seongkwan Lee , Minho Kang , Cheolmin Park
CPC classification number: H04L25/4917 , G09G3/2096 , H04N5/06
Abstract: A receiver, which is compatible with a mobile industry processor interface (MIPI) C-PHY physical layer, includes a plurality of variable-gain amplifiers responsive to respective multi-level signals (e.g., 3-level signals), and a plurality of filters having variable cutoff frequencies. The plurality of filters are responsive to respective signals generated by the plurality of amplifiers. An array of comparators is provided, which is responsive to signals generated by the plurality of filters. A jitter detection circuit is provided, which is configured to set respective gains of the plurality of variable-gain amplifiers and respective cutoff frequencies of the plurality of filters (e.g., high-pass filters), in response to signals generated by the array of comparators.
-
公开(公告)号：US20230362350A1
公开(公告)日：2023-11-09
申请号：US18071021
申请日：2022-11-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Seongkwan Lee , Minho Kang , Cheolmin Park , Hyungsun Ryu , Jaemoo Choi
CPC classification number: H04N17/002 , H04N25/76
Abstract: An image sensor test system includes a test device configured to transmit an input signal and a control signal to at least one image sensor through a probe card, and an interface board configured to map the probe card and the test device to each other. The interface board includes a signal receiver configured to receive an image signal from the at least one image sensor, amplify the image signal, and output the image signal to the test device, and the signal receiver includes an operational amplifier configured to amplify the image signal, and a low-frequency attenuator connected to an output terminal of the operational amplifier.
-
公开(公告)号：US20200333716A1
公开(公告)日：2020-10-22
申请号：US16655973
申请日：2019-10-17
Applicant: Samsung Electronics Co., Ltd.
Inventor： Daesung Jung , Younsok Choi , Jongmin Song , Minho Kang , Sangyoon Soh , Hohyun Lee
Abstract: A measuring apparatus for a vacuum chamber capable of accurately measuring physical properties or quantities in the vacuum chamber in an exposure process in real time, and a measuring system including the measuring apparatus are described herein. The measuring apparatus includes: a body having a shape of an exposure mask used in an exposure process; and a measuring element in an interior of the body or on a first surface of the body. When the measuring apparatus is positioned in a vacuum chamber during the exposure process, the measuring apparatus is configured to measure physical properties in the vacuum chamber using the measuring element. The body or the measuring element is configured to withstand a vacuum in the vacuum chamber including resisting or preventing physical deformation of the body or the measuring element due to the vacuum.
-
公开(公告)号：US20240053391A1
公开(公告)日：2024-02-15
申请号：US18183446
申请日：2023-03-14
Applicant: Samsung Electronics Co., Ltd.
Inventor： Seongkwan Lee , Minho Kang , Hyungsun Ryu , Cheolmin Park , Jaemoo Choi
CPC classification number: G01R27/08 , G01R35/005 , G01R31/2851
Abstract: An apparatus for testing an image sensor includes a load resistor, a first switch configured to be electrically connected to a first signal line of a device under test and a first end of the load resistor, a second switch configured to be electrically connected to a second signal line of the device under test and a second end of the load resistor, a first parametric measuring unit electrically connected to the first switch, and a second parametric measuring unit electrically connected to the second switch. At least one of the first parametric measuring unit and the second parametric unit is configured to correct an error of the load resistor during a testing operation of an output voltage of the device under test.
-
-
-
-
-
Search Results
6
records
(took 0.02 seconds)
