Resist composition
    2.
    发明授权
    Resist composition 失效
    抗蚀组成

    公开(公告)号:US08088547B2

    公开(公告)日:2012-01-03

    申请号:US11665506

    申请日:2005-09-20

    CPC分类号: G03F7/0757

    摘要: A resist composition comprising (A) a hydrogen silsesquioxane resin, (B) an acid dissociable group-containing compound, (C) a photo-acid generator, (D) an organic solvent and optionally (E) additives. The resist composition has improved lithographic properties (such as high etch-resistance, transparency, resolution, sensitivity, focus latitude, line edge roughness, and adhesion) suitable as a photoresist.

    摘要翻译: 一种抗蚀剂组合物,其包含(A)氢倍半硅氧烷树脂,(B)含酸解离基团的化合物,(C)光酸产生剂,(D)有机溶剂和任选的(E)添加剂。 抗蚀剂组合物具有改进的适合作为光致抗蚀剂的光刻性能(例如高耐蚀刻性,透明度,分辨率,灵敏度,聚焦宽度,线边缘粗糙度和粘附)。

    Silsesquioxane resin systems with base additives bearing electron-attracting functionalities
    3.
    发明授权
    Silsesquioxane resin systems with base additives bearing electron-attracting functionalities 有权
    倍半硅氧烷树脂体系,具有电子吸引功能的基础添加剂

    公开(公告)号:US08524439B2

    公开(公告)日:2013-09-03

    申请号:US12304263

    申请日:2007-06-27

    IPC分类号: G03F7/039

    CPC分类号: C08K5/5435

    摘要: A silsesquioxane-based composition that contains (a) silsesquioxane resins that contain HSiO3/2 units and RSiO3/2 units wherein; R is an acid dissociable group, and (b) 7-diethylamino-4-methylcoumarin. The silsesquioxane-based compositions are useful as positive resist compositions in forming patterned features on substrate, particularly useful for multi-layer layer (i.e. bilayer) 193 nm & 157 nm photolithographic applications.

    摘要翻译: 含有(a)含有HSiO3 / 2单元和RSiO3 / 2单元的倍半硅氧烷树脂的倍半硅氧烷基组合物,其中: R是酸解离基团,和(b)7-二乙基氨基-4-甲基香豆素。 基于倍半硅氧烷的组合物可用作在衬底上形成图案特征的正性抗蚀剂组合物,特别适用于193nm和157nm多层(即双层)光刻应用。

    Silsesquioxane resin systems with base additives bearing electron-attracting functionalities
    4.
    发明授权
    Silsesquioxane resin systems with base additives bearing electron-attracting functionalities 有权
    倍半硅氧烷树脂体系,具有电子吸引功能的基础添加剂

    公开(公告)号:US08148043B2

    公开(公告)日:2012-04-03

    申请号:US12304162

    申请日:2007-06-27

    IPC分类号: G03F7/039 G03F7/075

    摘要: Silsesquioxane-based compositions that contain (a) silsesquioxane resins that contain HSiO3/2 units and RSiO3/2 units wherein; R is an acid dissociable group, and (b) least one organic base additive selected from bulky tertiary amines, imides, amides and the polymeric amines wherein the organic base additive contains an electron-attracting group with the provision that the organic base additive is not 7-diethylamino-4-methylcoumarin. The silsesquioxane-based compositions are useful as positive resist compositions in forming patterned features on substrate, particularly useful for multi-layer layer (i.e. bilayer) 193 nm & 157 nm photolithographic applications.

    摘要翻译: 含有(a)含有HSiO3 / 2单元和RSiO3 / 2单元的倍半硅氧烷树脂的倍半硅氧烷基组合物,其中: R是酸解离基团,和(b)选自大体积叔胺,酰亚胺,酰胺和聚合胺的至少一种有机碱添加剂,其中有机碱添加剂含有吸电子基团,条件是有机碱添加剂不是 7-二乙基氨基-4-甲基香豆素。 基于倍半硅氧烷的组合物可用作在衬底上形成图案特征的正性抗蚀剂组合物,特别适用于193nm和157nm多层(即双层)光刻应用。

    SILSESQUIOXANE RESIN SYSTEMS WITH BASE ADDITIVES BEARING ELECTRON-ATTRACTING FUNCTIONALITIES
    5.
    发明申请
    SILSESQUIOXANE RESIN SYSTEMS WITH BASE ADDITIVES BEARING ELECTRON-ATTRACTING FUNCTIONALITIES 有权
    带有电子吸附功能的基础添加剂的SILSESQUIOXANE树脂体系

    公开(公告)号:US20090312467A1

    公开(公告)日:2009-12-17

    申请号:US12304263

    申请日:2007-06-27

    IPC分类号: C08K5/1545 C08L83/04

    CPC分类号: C08K5/5435

    摘要: A silsesquioxane-based composition that contains (a) silsesquioxane resins that contain HSiO3/2 units and RSiO3/2 units wherein; R is an acid dissociable group, and (b) 7-diethylamino-4-methylcoumarin. The silsesquioxane-based compositions are useful as positive resist compositions in forming patterned features on substrate, particularly useful for multi-layer layer (i.e. bilayer) 193 nm & 157 nm photolithographic applications.

    摘要翻译: 含有(a)含有HSiO3 / 2单元和RSiO3 / 2单元的倍半硅氧烷树脂的倍半硅氧烷基组合物,其中: R是酸解离基团,和(b)7-二乙基氨基-4-甲基香豆素。 基于倍半硅氧烷的组合物可用作在衬底上形成图案特征的正性抗蚀剂组合物,特别适用于193nm和157nm多层(即双层)光刻应用。

    SILSESQUIOXANE RESIN SYSTEMS WITH BASE ADDITIVES BEARING ELECTRON-ATTRACTING FUNCTIONALITIES
    6.
    发明申请
    SILSESQUIOXANE RESIN SYSTEMS WITH BASE ADDITIVES BEARING ELECTRON-ATTRACTING FUNCTIONALITIES 有权
    带有电子吸附功能的基础添加剂的SILSESQUIOXANE树脂体系

    公开(公告)号:US20090202941A1

    公开(公告)日:2009-08-13

    申请号:US12304162

    申请日:2007-06-27

    IPC分类号: G03F7/075

    摘要: Silsesquioxane-based compositions that contain (a) silsesquioxane resins that contain HSiO3/2 units and RSiO3/2 units wherein; R is an acid dissociable group, and (b) least one organic base additive selected from bulky tertiary amines, imides, amides and the polymeric amines wherein the organic base additive contains an electron-attracting group with the provision that the organic base additive is not 7-diethylamino-4-methylcoumarin. The silsesquioxane-based compositions are useful as positive resist compositions in forming patterned features on substrate, particularly useful for multi-layer layer (i.e. bilayer) 193 nm & 157 nm photolithographic applications.

    摘要翻译: 含有(a)含有HSiO3 / 2单元和RSiO3 / 2单元的倍半硅氧烷树脂的倍半硅氧烷基组合物,其中: R是酸解离基团,和(b)选自大体积叔胺,酰亚胺,酰胺和聚合胺的至少一种有机碱添加剂,其中有机碱添加剂含有吸电子基团,条件是有机碱添加剂不是 7-二乙基氨基-4-甲基香豆素。 基于倍半硅氧烷的组合物可用作在衬底上形成图案特征的正性抗蚀剂组合物,特别适用于193nm和157nm多层(即双层)光刻应用。

    Resist Composition
    7.
    发明申请
    Resist Composition 失效
    抵抗组成

    公开(公告)号:US20070264587A1

    公开(公告)日:2007-11-15

    申请号:US11665506

    申请日:2005-09-20

    IPC分类号: G03F7/075

    CPC分类号: G03F7/0757

    摘要: A resist composition comprising (A) a hydrogen silsesquioxane resin, (B) an acid dissociable group-containing compound, (C) a photo-acid generator, (D) an organic solvent and optionally (E) additives. The resist composition has improved lithographic properties (such as high etch-resistance, transparency, resolution, sensitivity, focus latitude, line edge roughness, and adhesion) suitable as a photoresist.

    摘要翻译: 一种抗蚀剂组合物,其包含(A)氢倍半硅氧烷树脂,(B)含酸解离基团的化合物,(C)光酸产生剂,(D)有机溶剂和任选的(E)添加剂。 抗蚀剂组合物具有改进的适合作为光致抗蚀剂的光刻性能(例如高耐蚀刻性,透明度,分辨率,灵敏度,聚焦宽度,线边缘粗糙度和粘附)。

    Silsesquioxane Resin
    8.
    发明申请
    Silsesquioxane Resin 有权
    倍半硅氧烷树脂

    公开(公告)号:US20070281242A1

    公开(公告)日:2007-12-06

    申请号:US10555594

    申请日:2004-06-30

    IPC分类号: C08L83/04

    摘要: This invention pertains to a silsesquioxane resin with improved lithographic properties (such as etch-resistance, transparency, resolution, sensitivity, focus latitude, line edge roughness, and adhesion) suitable as a photoresist; a method for incorporating the fluorinated or non-fluorinated functional groups onto silsesquioxane backbone. The silsesquioxane resins of this invention has the general structure (HSiO3/2)a(RSiO3/2)b wherein; R is an acid dissociable group, a has a value of 0.2 to 0.9 and b has a value of 0.1 to 0.8 and 0.9≦a+b≦1.0.

    摘要翻译: 本发明涉及适合作为光致抗蚀剂的具有改进的光刻性质(例如耐蚀刻性,透明度,分辨率,灵敏度,聚焦宽度,线边缘粗糙度和粘合)的倍半硅氧烷树脂; 将氟化或非氟化官能团引入倍半硅氧烷主链上的方法。 本发明的倍半硅氧烷树脂具有通式(HSiO 3/2/2)a(RS 3 O 3/2) 其中; R为酸解离基,a为0.2〜0.9,b为0.1〜0.8,0.9 <= a + b <= 1.0。