Photoresist composition
    2.
    发明授权
    Photoresist composition 有权
    光刻胶组成

    公开(公告)号:US08530135B2

    公开(公告)日:2013-09-10

    申请号:US12888243

    申请日:2010-09-22

    摘要: The present invention provides a photoresist composition comprising a resin having an acid-labile group and being insoluble or poorly soluble in an aqueous alkali solution but becoming soluble in an aqueous alkali solution by the action of an acid, an acid generator and a compound represented by the formula (I): wherein Z1 represents a C7-C20 alkylene group, a C3-C20 divalent saturated cyclic group or a divalent group formed by combining at least one C1-C6 alkylene group with at least one C3-C20 divalent saturated cyclic group.

    摘要翻译: 本发明提供了一种光致抗蚀剂组合物,其包含具有酸不稳定基团的树脂,并且在碱性水溶液中不溶或难溶,但是通过酸,酸产生剂和由 式(I):其中Z1表示C7-C20亚烷基,C3-C20二价饱和环状基团或通过将至少一个C 1 -C 6亚烷基与至少一个C 3 -C 20二价饱和环状基团结合形成的二价基团 。

    CHEMICALLY AMPLIFIED RESIST COMPOSITION AND SALT EMPLOYED THEREIN
    3.
    发明申请
    CHEMICALLY AMPLIFIED RESIST COMPOSITION AND SALT EMPLOYED THEREIN 有权
    化学稳定组合物和盐使用的盐

    公开(公告)号:US20110020749A1

    公开(公告)日:2011-01-27

    申请号:US12844557

    申请日:2010-07-27

    摘要: The object of the present invention is to provide a chemically amplified resist composition excellent in a resolution and a mask error enhancement factor.By employing the salt represented by the formulae (A1) as an acid generator of a resist composition, the above mentioned object is achieved. wherein Z+ represents an organic cation, Q1 and Q2 each independently represent a fluorine atom or a perfluoroalkyl group, Ra2 represents a divalent alicyclic hydrocarbon group pr the like, Ra2 represents an elimination group represented by the formulae (II-1) or (II-2). In the formulae (II-1) or (II-2), Ra3 and Ra4 each independently represent a hydrogen atom or an aliphatic hydrocarbon group, Ra5 represents an aliphatic hydrocarbon group, Ra6 represents a divalent aliphatic hydrocarbon group, and Ra7 represents an aliphatic hydrocarbon group.

    摘要翻译: 本发明的目的是提供一种分辨率和掩模误差增强因子优异的化学放大抗蚀剂组合物。 通过使用由式(A1)表示的盐作为抗蚀剂组合物的酸产生剂,实现了上述目的。 其中Z +表示有机阳离子,Q1和Q2各自独立地表示氟原子或全氟烷基,Ra2表示二价脂环族烃基,Ra2表示由式(II-1)或(II- 2)。 在式(II-1)或(II-2)中,Ra 3和Ra 4各自独立地表示氢原子或脂肪族烃基,Ra 5表示脂肪族烃基,Ra 6表示二价脂肪族烃基,Ra 7表示脂肪族 烃基。

    Resist composition and method for producing resist pattern
    4.
    发明授权
    Resist composition and method for producing resist pattern 有权
    抗蚀剂组合物和抗蚀剂图案的制造方法

    公开(公告)号:US08735047B2

    公开(公告)日:2014-05-27

    申请号:US13551864

    申请日:2012-07-18

    摘要: A resist composition having a resin having a structural unit represented by the formula (I), a resin being insoluble or poorly soluble in alkali aqueous solution, but becoming soluble in an alkali aqueous solution by the action of an acid and not including the structural unit represented by the formula (I), and an acid generator represented by the formula (II), wherein R1, A1, A13, A14, X12, Q1, Q2, L1, ring W1 and Z+ are defined in the specification.

    摘要翻译: 一种抗蚀剂组合物,其具有由式(I)表示的结构单元的树脂,树脂在碱性水溶液中不溶或难溶,但通过酸而不溶于碱性水溶液,不包括结构单元 由式(I)表示的酸式发生剂和由式(II)表示的酸产生剂,其中R1,A1,A13,A14,X12,Q1,Q2,L1,环W1和Z +在说明书中定义。

    Resist composition and method for producing resist pattern
    5.
    发明授权
    Resist composition and method for producing resist pattern 有权
    抗蚀剂组合物和抗蚀剂图案的制造方法

    公开(公告)号:US08728707B2

    公开(公告)日:2014-05-20

    申请号:US13551860

    申请日:2012-07-18

    摘要: A resist composition having a resin having a structural unit represented by the formula (I), a resin being insoluble or poorly soluble in alkali aqueous solution, but becoming soluble in an alkali aqueous solution by the action of an acid and not including the structural unit represented by the formula (I), an acid generator, and a compound represented by the formula (II), wherein R1, A1, A13, A14, X12, R23 and ring W21 are defined in the specification.

    摘要翻译: 一种抗蚀剂组合物,其具有由式(I)表示的结构单元的树脂,树脂在碱性水溶液中不溶或难溶,但通过酸而不溶于碱性水溶液,不包括结构单元 由式(I)表示的酸产生剂和由式(II)表示的化合物,其中R1,A1,A13,A14,X12,R23和环W21在说明书中定义。

    Resist composition and method for producing resist pattern
    7.
    发明授权
    Resist composition and method for producing resist pattern 有权
    抗蚀剂组合物和抗蚀剂图案的制造方法

    公开(公告)号:US08568956B2

    公开(公告)日:2013-10-29

    申请号:US13404140

    申请日:2012-02-24

    摘要: A resist composition contains (A1) a resin having a structural unit represented by the formula (I), (A2) a resin being insoluble or poorly soluble in alkali aqueous solution, but becoming soluble in an alkali aqueous solution by the action of an acid, (B) an acid generator, and (D) a compound represented by the formula (II), wherein R1 represents a hydrogen atom or a methyl group; A1 represents a C1 to C6 alkanediyl group; R2 represents a C1 to C10 hydrocarbon group having a fluorine atom; ring W1 represents a C2 to C36 substituted heterocyclic ring; R3 represents a C1 to C30 hydrocarbon group, and one or more —CH2— contained in the hydrocarbon group may be replaced by —O— or —CO—.

    摘要翻译: 抗蚀剂组合物含有(A1)具有由式(I)表示的结构单元的树脂,(A2)不溶于碱性水溶液或难溶于碱性水溶液的树脂,但通过酸的溶解而溶于碱性水溶液 ,(B)酸产生剂和(D)由式(II)表示的化合物,其中R1表示氢原子或甲基; A1表示C1〜C6烷二基; R2表示具有氟原子的C1〜C10烃基; 环W1表示C2〜C36取代的杂环; R3表示C1〜C30烃基,烃基中所含的一个或多个-CH 2可以被-O-或-CO-代替。

    Salt and photoresist composition containing the same
    9.
    发明授权
    Salt and photoresist composition containing the same 有权
    含有其的盐和光致抗蚀剂组合物

    公开(公告)号:US08460851B2

    公开(公告)日:2013-06-11

    申请号:US12985838

    申请日:2011-01-06

    摘要: A salt represented by the formula (I): wherein Q1 and Q2 each independently represent a fluorine atom or a C1-C6 perfluoroalkyl group, L1 represents *—CO—O-La- or *—CH2—O-Lb-, * represents a binding position to —C(Q1)(Q2)-, La and Lb independently represent a C1-C15 divalent saturated hydrocarbon group in which one or more —CH2— can be replaced by —O— or —CO—, ring W1 represents a C2-C36 nitrogen-containing heterocyclic group in which one or more —CH2— can be replaced by —O—, and Z1⊕ represents an organic counter ion.

    摘要翻译: 由式(I)表示的盐:其中Q1和Q2各自独立地表示氟原子或C1-C6全氟烷基,L1表示* -CO-O-La-或* -CH2-O-Lb-,*表示 对于-C(Q1)(Q2) - 的结合位置,La和Lb独立地表示其中一个或多个-CH 2 - 可被-O-或-CO-代替的C 1 -C 15二价饱和烃基, 其中一个或多个-CH 2 - 可以被-O-代替的C 2 -C 36含氮杂环基,Z 1表示有机抗衡离子。

    RESIN AND RESIST COMPOSITION
    10.
    发明申请
    RESIN AND RESIST COMPOSITION 有权
    树脂和树脂组合物

    公开(公告)号:US20100323296A1

    公开(公告)日:2010-12-23

    申请号:US12821008

    申请日:2010-06-22

    摘要: A resin comprises a structural unit derived from a compound represented by the formula (aa) wherein T represents a C4 to C36 alicyclic hydrocarbon group, the hydrogen atom contained in the alicyclic hydrocarbon group may be replaced by a halogen atom, a hydroxyl group, a C1 to C12 alkyl group optionally substituted with a halogen atom or a hydroxyl group, a C1 to C12 alkoxyl group, a C6 to C12 aryl group, a C7 to C12 aralkyl group, a glycidyloxy group, a C2 to C4 acyl group, an alkoxycarbonyl group, an alkanoyloxyalkyl group or a cyano group, and the —CH2— contained in the alicyclic hydrocarbon group is replaced by at least one —SO2— and furthermore may be replaced by —CO—, —O—, —S—, —SO2— or —N(Rc)—; Rc represents a hydrogen atom or a C1 to C6 alkyl group; R1 represents a hydrogen atom, a halogen atom, or a C1 to C6 alkyl group that may optionally has halogen atoms; and Z1 represents an optionally substituted C1 to C17 saturated hydrocarbon group, and the —CH2— contained in the saturated hydrocarbon group may be replaced by —CO—, —O—, —S— or —N(Rc)—.

    摘要翻译: 树脂包含衍生自由式(aa)表示的化合物的结构单元,其中T表示C4-C36脂环族烃基,脂环族烃基中所含的氢原子可以被卤素原子,羟基, 任选被卤素原子或羟基取代的C1〜C12烷基,C1〜C12烷氧基,C6〜C12芳基,C7〜C12芳烷基,缩水甘油氧基,C2〜C4酰基,烷氧基羰基 基团,烷酰氧基烷基或氰基,脂环族烃基中的-CH 2被至少一个-SO 2 - 代替,并且还可以被-CO - , - O - , - S - , - SO 2 - 或-N(Rc) - ; Rc表示氢原子或C1〜C6烷基; R1表示氢原子,卤素原子或可任选具有卤素原子的C1-C6烷基; Z 1表示任选取代的C 1〜C 17饱和烃基,饱和烃基中的-CH 2可以被-CO - , - O - , - S-或-N(R c) - 代替。