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    Solar metrology methods and apparatus
    1.
    发明授权
    Solar metrology methods and apparatus 失效
    太阳能计量方法和装置

    公开(公告)号：US08604447B2

    公开(公告)日：2013-12-10

    申请号：US13557047

    申请日：2012-07-24

    申请人： Scott Young ,  Guoheng Zhao ,  Ady Levy ,  Marco Guevremont ,  Neeraj Khanna

    发明人： Scott Young ,  Guoheng Zhao ,  Ady Levy ,  Marco Guevremont ,  Neeraj Khanna

    IPC分类号： G01N21/64

    CPC分类号： G01N21/6489 ,  G01N21/9501 ,  H02S50/10

    摘要： Methods and apparatus are presented to measure the photoluminescence of incoming wafers and extract parameters such as minority carrier life time, diffusion length, and defect density that may be used to predict final solar cell efficiency. In some examples, illumination light is supplied to a side of an as-cut silicon wafer and the induced luminescence measured from the same side and the opposite side of the wafer is used to determine an indication of the minority carrier lifetime. In another example, the luminescence induced by two instances of illumination light of different wavelength is used to determine an indication of the minority carrier lifetime. In another example, the spatial distribution of luminescence intensity over an area surrounding a focused illumination spot is used to determine an indication of the minority carrier lifetime. Other apparatus useful to passivate the surface of a wafer for inspection are also presented.

    摘要翻译： 提出了测量进入晶片的光致发光的方法和装置，并提取可用于预测最终太阳能电池效率的参数，例如少数载流子寿命，扩散长度和缺陷密度。 在一些示例中，将照明光提供给切割硅晶片的一侧，并且使用从晶片的相同侧和相对侧测量的感应发光来确定少数载流子寿命的指示。 在另一示例中，由两个不同波长的照明光实例引起的发光用于确定少数载流子寿命的指示。 在另一示例中，使用聚焦照明点周围的区域上的发光强度的空间分布来确定少数载流子寿命的指示。 还提出了可用于钝化晶片表面以进行检查的其它装置。

    Solar Metrology Methods And Apparatus
    2.
    发明申请
    Solar Metrology Methods And Apparatus 失效
    太阳能计量方法与装置

    公开(公告)号：US20130048873A1

    公开(公告)日：2013-02-28

    申请号：US13557047

    申请日：2012-07-24

    申请人： Scott Young ,  Guoheng Zhao ,  Ady Levy ,  Marco Guevremont ,  Neeraj Khanna

    发明人： Scott Young ,  Guoheng Zhao ,  Ady Levy ,  Marco Guevremont ,  Neeraj Khanna

    IPC分类号： G01N21/64

    CPC分类号： G01N21/6489 ,  G01N21/9501 ,  H02S50/10

    摘要： Methods and apparatus are presented to measure the photoluminescence of incoming wafers and extract parameters such as minority carrier life time, diffusion length, and defect density that may be used to predict final solar cell efficiency. In some examples, illumination light is supplied to a side of an as-cut silicon wafer and the induced luminescence measured from the same side and the opposite side of the wafer is used to determine an indication of the minority carrier lifetime. In another example, the luminescence induced by two instances of illumination light of different wavelength is used to determine an indication of the minority carrier lifetime. In another example, the spatial distribution of luminescence intensity over an area surrounding a focused illumination spot is used to determine an indication of the minority carrier lifetime. Other apparatus useful to passivate the surface of a wafer for inspection are also presented.

    摘要翻译： 提出了测量进入晶片的光致发光的方法和装置，并提取可用于预测最终太阳能电池效率的参数，例如少数载流子寿命，扩散长度和缺陷密度。 在一些示例中，将照明光提供给切割硅晶片的一侧，并且使用从晶片的相同侧和相对侧测量的感应发光来确定少数载流子寿命的指示。 在另一示例中，由两个不同波长的照明光实例引起的发光用于确定少数载流子寿命的指示。 在另一示例中，使用聚焦照明点周围的区域上的发光强度的空间分布来确定少数载流子寿命的指示。 还提出了可用于钝化晶片表面以进行检查的其它装置。

    Dark field inspection system with ring illumination
    3.
    发明授权
    Dark field inspection system with ring illumination 有权
    具有环形照明的暗场检查系统

    公开(公告)号：US09176072B2

    公开(公告)日：2015-11-03

    申请号：US12919760

    申请日：2010-07-16

    申请人： Guoheng Zhao ,  Mehdi Vaez-Iravani ,  Scott Young ,  Kris Bhaskar

    发明人： Guoheng Zhao ,  Mehdi Vaez-Iravani ,  Scott Young ,  Kris Bhaskar

    IPC分类号： H04N7/18 ,  G01N21/95 ,  G01N21/88

    CPC分类号： G01N21/9501 ,  G01N21/8806 ,  G01N2021/8822

    摘要： A dark field inspection system that minimizes the speckle noise due to sample surface roughness can include a plurality of beam shaping paths for generating a composite, focused illumination line on a wafer. Each beam shaping path can illuminate the wafer at an oblique angle. The plurality of beam shaping paths can form a ring illumination. This ring illumination can reduce the speckle effect, thereby improving SNR. An objective lens can capture scattered light from the wafer and an imaging sensor can receive an output of the objective lens. Because the wafer illumination occurs at oblique angles, the objective lens can have a high NA, thereby improving optical resolution of the imaging sensor, and the resulting signal level.

    摘要翻译： 使样品表面粗糙度引起的斑点噪声最小化的暗场检查系统可以包括用于在晶片上产生复合聚焦照明线的多个光束整形路径。 每个光束成形路径可以倾斜角度照射晶片。 多个光束成形路径可以形成环形照明。 这种环形照明可以减少斑点效应，从而提高SNR。 物镜可以捕获来自晶片的散射光，成像传感器可以接收物镜的输出。 由于晶片照明以倾斜角度发生，所以物镜可以具有高NA，从而提高成像传感器的光学分辨率和所得到的信号电平。

    Dark Field Inspection System With Ring Illumination
    4.
    发明申请
    Dark Field Inspection System With Ring Illumination 有权
    暗场检测系统与环照明

    公开(公告)号：US20110169944A1

    公开(公告)日：2011-07-14

    申请号：US12919760

    申请日：2010-07-16

    申请人： Guoheng Zhao ,  Mehdi Vaez-Iravani ,  Scott Young ,  Kris Bhaskar

    发明人： Guoheng Zhao ,  Mehdi Vaez-Iravani ,  Scott Young ,  Kris Bhaskar

    IPC分类号： H04N7/18 ,  G01N21/88

    CPC分类号： G01N21/9501 ,  G01N21/8806 ,  G01N2021/8822

    摘要： A dark field inspection system that minimizes the speckle noise due to sample surface roughness can include a plurality of beam shaping paths for generating a composite, focused illumination line on a wafer. Each beam shaping path can illuminate the wafer at an oblique angle. The plurality of beam shaping paths can form a ring illumination. This ring illumination can reduce the speckle effect, thereby improving SNR. An objective lens can capture scattered light from the wafer and an imaging sensor can receive an output of the objective lens. Because the wafer illumination occurs at oblique angles, the objective lens can have a high NA, thereby improving optical resolution of the imaging sensor, and the resulting signal level.

    摘要翻译： 使样品表面粗糙度引起的斑点噪声最小化的暗场检查系统可以包括用于在晶片上产生复合聚焦照明线的多个光束整形路径。 每个光束成形路径可以倾斜角度照射晶片。 多个光束成形路径可以形成环形照明。 这种环形照明可以减少斑点效应，从而提高SNR。 物镜可以捕获来自晶片的散射光，成像传感器可以接收物镜的输出。 由于晶片照明以倾斜角度发生，所以物镜可以具有高NA，从而提高成像传感器的光学分辨率和所得到的信号电平。

    Bicycle advertising and garphic display medium
    6.
    发明申请
    Bicycle advertising and garphic display medium 审中-公开
    自行车广告和外观显示介质

    公开(公告)号：US20060005440A1

    公开(公告)日：2006-01-12

    申请号：US11066023

    申请日：2005-02-25

    申请人： Scott Young ,  Mark Young ,  Todd Hutcheson

    发明人： Scott Young ,  Mark Young ,  Todd Hutcheson

    IPC分类号： G09F21/04

    CPC分类号： G09F21/04

    摘要： The present invention discloses a bicycle as an advertising and graphic display medium encompassing the frame and wheel disks as a whole. The bicycle and non-rotating wheel displays, front and back, traverse the landscape as one unit and while in a motionless state. The bicycle becomes a solid unit, frame and non-rotating display wheels become one surface.

    摘要翻译： 本发明公开了一种作为广告和图形显示介质的自行车，其包括框架和轮盘整体。 前后自行车和非旋转轮显示器作为一个单元横向移动，同时处于静止状态。 自行车成为一个坚实的单位，框架和非旋转显示轮成为一个表面。

    Digital pathology system
    7.
    发明授权
    Digital pathology system 有权
    数字病理系统

    公开(公告)号：US09041930B1

    公开(公告)日：2015-05-26

    申请号：US13112956

    申请日：2011-05-20

    申请人： Scott Young ,  Eliezer Rosengaus ,  Ashok Kulkarni

    发明人： Scott Young ,  Eliezer Rosengaus ,  Ashok Kulkarni

    IPC分类号： G01N21/25 ,  G01J3/51 ,  G01J3/02 ,  G01J3/28

    CPC分类号： G01J3/51 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/2803 ,  G01J3/36 ,  G01J3/513 ,  G01J2003/1213 ,  G02B7/28 ,  G02B21/244 ,  G02B21/365 ,  G02B27/40

    摘要： The present invention may include an illumination source; a TDI sensor having a plurality of rows of TDI pixels, wherein each of the TDI pixels have a 1:1 aspect ratio; a multicolor filter contacted to the surface of the TDI sensor, wherein the multicolor filter has alternating sections of a first color filter, a second color filter, and at least a third color, wherein adjacent rows of TDI pixels are grouped in order to form a plurality of rows of integrated multicolor pixels; an objective having a first end positioned proximate to the specimen; a second lens configured to focus light from the image path onto the TDI sensor; and an anamorphic optics element configured to magnify an image of the one or more specimens such that the image is magnified by a factor of three along a direction orthogonal to an integrating direction of the TDI sensor.

    摘要翻译： 本发明可以包括照明源; 具有多行TDI像素的TDI传感器，其中每个TDI像素具有1:1的纵横比; 与TDI传感器的表面接触的多色过滤器，其中所述多色过滤器具有第一滤色器，第二滤色器和至少第三颜色的交替部分，其中相邻的TDI像素行被分组以形成 多行集成多色像素; 具有靠近所述样本定位的第一端的物镜; 第二透镜，被配置为将来自图像路径的光聚焦到TDI传感器上; 以及变形光学元件，被配置为放大一个或多个样本的图像，使得图像沿着与TDI传感器的积分方向正交的方向被放大三倍。

    Method of selecting operation in a line-powered module
    8.
    发明申请
    Method of selecting operation in a line-powered module 失效
    在线路供电模块中选择操作的方法

    公开(公告)号：US20070290833A1

    公开(公告)日：2007-12-20

    申请号：US11445575

    申请日：2006-06-02

    申请人： Kirby W. Cartwright ,  Scott Young

    发明人： Kirby W. Cartwright ,  Scott Young

    IPC分类号： G08B1/08

    CPC分类号： G08B25/04 ,  G08B7/06

    摘要： A line-powered module that is selectively operable in one of a plurality of modes of operation based upon the value of a selection signal. The line-powered module includes a control unit that selectively operates the module in one of the plurality of modes of operation based upon the value of a selection signal received by the control unit. The line-powered module includes a selection input that is coupled to the control unit such that the selection signal can be received at the selection input. Preferably, the selection input receives a selection wire that can be moved between different points of connection to define the plurality of states of the selection signal. Based upon the connection of the selection wire, the control unit operates the line-powered module in one of the plurality of modes of operation.

    摘要翻译： 一种线路供电模块，其可以基于选择信号的值选择性地以多种操作模式中的一种操作。 线路供电模块包括控制单元，其基于由控制单元接收的选择信号的值，以多种操作模式中的一种模式选择性地操作该模块。 线路供电模块包括耦合到控制单元的选择输入，使得可以在选择输入处接收选择信号。 优选地，选择输入接收可以在不同连接点之间移动的选择线，以限定选择信号的多个状态。 基于选择线的连接，控制单元以多种操作模式之一操作线路供电的模块。

    APPLICATION OF HARDWARE-BASED MAILBOXES IN NETWORK TRANSCEIVERS AND DISTRIBUTED APPROACH FOR PREDICTABLE SOFTWARE-BASED PROTECTION SWITCHING
    9.
    发明申请
    APPLICATION OF HARDWARE-BASED MAILBOXES IN NETWORK TRANSCEIVERS AND DISTRIBUTED APPROACH FOR PREDICTABLE SOFTWARE-BASED PROTECTION SWITCHING 有权
    基于硬件的电子邮件在网络收发器中的应用和分布式方法用于可预测的基于软件的保护切换

    公开(公告)号：US20070211742A1

    公开(公告)日：2007-09-13

    申请号：US11669151

    申请日：2007-01-30

    申请人： Tjandra Trisno ,  Edward Sprague ,  Scott Young

    发明人： Tjandra Trisno ,  Edward Sprague ,  Scott Young

    IPC分类号： H04L12/56

    CPC分类号： H04Q11/0062 ,  H04J14/0283 ,  H04J14/0287 ,  H04J14/0295 ,  H04L45/22 ,  H04L45/28 ,  H04L45/62 ,  H04Q2011/0016 ,  H04Q2011/0081 ,  H04Q2011/0092

    摘要： A line card in a network node having a local memory coupled to a local controller and local logic circuit. The local memory in the line card stores state information for signals processed by the line card itself, as well as state information for signals processed by other line cards. The logic circuit and controller implement a same fault detection and signal processing algorithms as all other line cards in the group, to essentially effectuate a distributed and local hardware based control of automatic protection switching (APS) without interrupting a central processor. The line card also performs error checking and supervisory functions to ensure consistency of state among the line cards.

    摘要翻译： 网络节点中的线卡，其具有耦合到本地控制器和本地逻辑电路的本地存储器。 线路卡中的本地存储器存储由线路卡本身处理的信号的状态信息，以及由其他线路卡处理的信号的状态信息。 逻辑电路和控制器实现与组中所有其他线卡相同的故障检测和信号处理算法，从而基本上实现了分布式和本地基于硬件的自动保护切换（APS）控制，而不中断中央处理器。 线卡还执行错误检查和监控功能，以确保线路卡之间状态的一致性。