METHOD OF PRODUCING SUBSTRATE HAVING ALIGNMENT MARK

    公开(公告)号:US20190072790A1

    公开(公告)日:2019-03-07

    申请号:US16055205

    申请日:2018-08-06

    Abstract: A method of producing a substrate having an alignment mark includes a process of forming a lower layer side metal film on a substrate and forming a lower layer side alignment mark base having a lower layer side alignment mark that is a hole, a process of forming an upper layer side metal film on the substrate and the lower layer side metal film, a process of forming a photoresist film on the upper layer side metal film and forming a lower layer side alignment mark overlapping portion overlapping a part of the lower layer side alignment mark with patterning, an etching process of removing with etching selectively portions of the lower and upper layer side metal films not overlapping the lower layer side alignment mark overlapping portion and forming an upper layer side alignment mark that is the upper layer side metal film, and a photoresist removing process.

    ACTIVE MATRIX SUBSTRATE AND METHOD FOR MANUFACTURING SAME

    公开(公告)号:US20210183899A1

    公开(公告)日:2021-06-17

    申请号:US17118666

    申请日:2020-12-11

    Abstract: An active matrix substrate includes a plurality of source bus lines, a lower insulating layer covering the source bus lines, a plurality of gate bus lines formed above the lower insulating layer, and an oxide semiconductor TFT disposed to correspond to each pixel area. The oxide semiconductor TFT includes an oxide semiconductor layer disposed on the lower insulating layer, and a gate electrode disposed above the oxide semiconductor layer. The gate electrode is formed in a different layer from the gate bus lines, and is disposed to be separated from another gate electrode disposed in an adjacent pixel area. The gate electrode is covered by an interlayer insulating layer. The gate bus line is disposed on the interlayer insulating layer and in a gate contact hole formed in the interlayer insulating layer, and is connected to the gate electrode in the gate contact hole.

    METHOD OF PRODUCING DISPLAY PANEL BOARD
    6.
    发明申请

    公开(公告)号:US20190079364A1

    公开(公告)日:2019-03-14

    申请号:US16124223

    申请日:2018-09-07

    Abstract: A method includes a pixel electrode forming process of forming a pixel electrode formed from a transparent electrode film on a gate insulation film that covers a gate electrode, a semiconductor film forming process being performed after the pixel electrode forming process and forming a semiconductor film on the gate insulation film such that a part of the semiconductor film covers the pixel electrode, an annealing process being performed after the semiconductor film forming process and processing the semiconductor film with annealing, and an etching process being performed after the annealing process and processing the semiconductor film with etching such that a channel section overlapping the gate electrode is formed in a same layer as the pixel electrode. The etching and the annealing performed on one of the transparent electrode film and the semiconductor film is less likely to adversely affect another one of the films.

    THIN-FILM TRANSISTOR ARRAY SUBSTRATE AND DISPLAY DEVICE

    公开(公告)号:US20210143184A1

    公开(公告)日:2021-05-13

    申请号:US16628048

    申请日:2018-06-28

    Abstract: The present invention provides a thin-film transistor array substrate that prevents semiconductor layers of thin-film transistor elements from having step disconnection even when the frame width is reduced. The thin-film transistor array substrate of the present invention includes a thin-film transistor element in a pixel region and a terminal in a terminal region. The thin-film transistor array substrate sequentially includes a support, an insulating layer, a gate electrode, a gate insulating layer, and a semiconductor layer in a cross-sectional view of the pixel region. A region with the insulating layer encompasses a region with the semiconductor layer in a plan view of the pixel region. The thin-film transistor array substrate sequentially includes the support, a lead line extending from the terminal, and the insulating layer in a cross-sectional view of the terminal region.

    ACTIVE MATRIX SUBSTRATE AND METHOD FOR MANUFACTURING SAME

    公开(公告)号:US20230307465A1

    公开(公告)日:2023-09-28

    申请号:US18199142

    申请日:2023-05-18

    CPC classification number: H01L27/124 H01L27/1225 H01L27/127

    Abstract: An active matrix substrate includes a plurality of source bus lines, a lower insulating layer covering the source bus lines, a plurality of gate bus lines formed above the lower insulating layer, and an oxide semiconductor TFT disposed to correspond to each pixel area. The oxide semiconductor TFT includes an oxide semiconductor layer disposed on the lower insulating layer, and a gate electrode disposed above the oxide semiconductor layer. The gate electrode is formed in a different layer from the gate bus lines, and is disposed to be separated from another gate electrode disposed in an adjacent pixel area. The gate electrode is covered by an interlayer insulating layer. The gate bus line is disposed on the interlayer insulating layer and in a gate contact hole formed in the interlayer insulating layer, and is connected to the gate electrode in the gate contact hole.

    ACTIVE MATRIX SUBSTRATE AND METHOD FOR MANUFACTURING SAME

    公开(公告)号:US20210384276A1

    公开(公告)日:2021-12-09

    申请号:US17338750

    申请日:2021-06-04

    Abstract: An active matrix substrate includes a first TFT and a second TFT, in which the first TFT includes a first oxide semiconductor layer and a first gate electrode arranged on a part of the first oxide semiconductor layer with a first gate insulating layer interposed therebetween, the first gate insulating layer has a layered structure including a first insulating film and a second insulating film arranged on the first insulating film, the second TFT includes a second oxide semiconductor layer having a higher mobility than the first oxide semiconductor layer and a second gate electrode arranged on a part of the second oxide semiconductor layer with a second gate insulating layer interposed therebetween, and the second gate insulating layer includes the second insulating film and does not include the first insulating film, and the second TFT further includes a lower insulating layer including the first insulating film arranged between the second oxide semiconductor layer and a substrate.

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