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公开(公告)号：US20170363469A1
公开(公告)日：2017-12-21
申请号：US15623961
申请日：2017-06-15
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Diaa Abdel Maged Khalil , Mostafa Medhat , Hisham Haddara , Bassam Saadany , Khaled Hassan
CPC classification number: G01J3/0208 , G01J3/021 , G01J3/0229 , G01J3/0256 , G01J3/0259 , G01J3/0291 , G01J3/26 , G01J3/45 , G01J3/4532
Abstract: Aspects of the disclosure relate to an integrated spectral unit including a micro-electro-mechanical systems (MEMS) interferometer fabricated within a first substrate and a light redirecting structure integrated on a second substrate, where the second substrate is coupled to the first substrate. The light redirecting structure includes at least one mirror for receiving an input light beam propagating in an out-of-plane direction with respect to the first substrate and redirecting the input light beam to an in-plane direction with respect to the first substrate towards the MEMS interferometer.
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Patent Agency Ranking
公开(公告)号：US11841268B2
公开(公告)日：2023-12-12
申请号：US17590781
申请日：2022-02-01
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Bassem A. Mortada , Khaled Hassan , Abdelrahman Ahmed Maher Mohamed Elsayed Salem , Diaa Khalil , Mohamed H. Al Haron , Mohammed Ahmed Elsheikh , Ahmed Shebl , Bassam Saadany , Mostafa Medhat , Botros George Iskander Shenouda
CPC classification number: G01J3/0256 , G01J3/0216 , G02B19/0019
Abstract: Aspects relate to a compact material analyzer including a light source, a detector, and a module including a first optical window on a first side of the module, a second optical window on a second side of the module opposite the first side, and a light modulator. The light source produces input light at a high power that is passed through the first optical window to the light modulator. The light modulator is configured to attenuate the input light, produce modulated light based on the input light, and direct the modulated light through the second optical window to the sample. The modulated light produced by the light modulator is at a lower power safe for the sample. The detector is configured to receive output light from the sample produced from interaction with the modulated light through the second optical window and to detect a spectrum of the output light.
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公开(公告)号：US20220244101A1
公开(公告)日：2022-08-04
申请号：US17590781
申请日：2022-02-01
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Bassem A. Mortada , Khaled Hassan , Abdelrahman Ahmed Maher Mohamed Elsayed Salem , Diaa Khalil , Mohamed H. Al Haron , Mohammed Ahmed Elsheikh , Ahmed Shebl , Bassam Saadany , Mostafa Medhat , Botros George Iskander Shenouda
Abstract: Aspects relate to a compact material analyzer including a light source, a detector, and a module including a first optical window on a first side of the module, a second optical window on a second side of the module opposite the first side, and a light modulator. The light source produces input light at a high power that is passed through the first optical window to the light modulator. The light modulator is configured to attenuate the input light, produce modulated light based on the input light, and direct the modulated light through the second optical window to the sample. The modulated light produced by the light modulator is at a lower power safe for the sample. The detector is configured to receive output light from the sample produced from interaction with the modulated light through the second optical window and to detect a spectrum of the output light.
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公开(公告)号：US10060791B2
公开(公告)日：2018-08-28
申请号：US15623961
申请日：2017-06-15
Applicant: Si-Ware Systems
Inventor： Yasser M. Sabry , Diaa Abdel Maged Khalil , Mostafa Medhat , Hisham Haddara , Bassam Saadany , Khaled Hassan
CPC classification number: G01J3/0208 , G01J3/021 , G01J3/0229 , G01J3/0256 , G01J3/0259 , G01J3/0291 , G01J3/26 , G01J3/45 , G01J3/4532
Abstract: Aspects of the disclosure relate to an integrated spectral unit including a micro-electro-mechanical systems (MEMS) interferometer fabricated within a first substrate and a light redirecting structure integrated on a second substrate, where the second substrate is coupled to the first substrate. The light redirecting structure includes at least one mirror for receiving an input light beam propagating in an out-of-plane direction with respect to the first substrate and redirecting the input light beam to an in-plane direction with respect to the first substrate towards the MEMS interferometer.
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5.发明申请MICRO-OPTICAL BENCH DEVICE WITH HIGHLY/SELECTIVELY-CONTROLLED OPTICAL SURFACES 审中-公开具有高/可选光控表面的微光学设备公开(公告)号：US20160246002A1
公开(公告)日：2016-08-25
申请号：US15047205
申请日：2016-02-18
Applicant: Si-Ware Systems
Inventor： Bassam Saadany , Yasser M. Sabry , Mostafa Medhat , Bassem Mortada , Muhammed Nagi , Mohamed Sadek , Yasseen Nada , Khaled Hassan
CPC classification number: G02B6/136 , B81B2201/047 , B81C1/00833 , G01B9/02051 , G01J3/0259 , G01J3/453 , G02B6/3692
Abstract: A micro-optical bench device is fabricated by a process that provides control over one or more properties of the micro-optical bench device and/or one or more properties of optical surfaces in the micro-optical bench device. The process includes etching a substrate to form a permanent structure including optical elements and a temporary structure. The shape of the temporary structure and gaps between the temporary structure and permanent structure facilitate control of a property of the micro-optical bench and/or optical surfaces therein. The process further includes removing the temporary structure from an optical path of the micro-optical bench device.
Abstract translation: 通过提供对微型光学台装置的一个或多个特性的控制和/或微型光学台装置中的光学表面的一个或多个特性的方法制造微型光学台装置。 该方法包括蚀刻衬底以形成包括光学元件和临时结构的永久结构。 临时结构的形状和临时结构和永久结构之间的间隙便于控制微光学台和/或其中的光学表面的性质。 该方法还包括从微型光学平台装置的光路中移除临时结构。
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公开(公告)号：US10120134B2
公开(公告)日：2018-11-06
申请号：US15047205
申请日：2016-02-18
Applicant: Si-Ware Systems
Inventor： Bassam Saadany , Yasser M. Sabry , Mostafa Medhat , Bassem Mortada , Muhammed Nagi , Mohamed Sadek , Yasseen Nada , Khaled Hassan
Abstract: A micro-optical bench device is fabricated by a process that provides control over one or more properties of the micro-optical bench device and/or one or more properties of optical surfaces in the micro-optical bench device. The process includes etching a substrate to form a permanent structure including optical elements and a temporary structure. The shape of the temporary structure and gaps between the temporary structure and permanent structure facilitate control of a property of the micro-optical bench and/or optical surfaces therein. The process further includes removing the temporary structure from an optical path of the micro-optical bench device.
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