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公开(公告)号:US20230027837A1
公开(公告)日:2023-01-26
申请号:US17812375
申请日:2022-07-13
Applicant: SUNRISE MEMORY CORPORATION
Inventor: Christopher J. Petti , Vinod Purayath , George Samachisa , Wu-Yi Henry Chien , Eli Harari
IPC: H01L27/1159 , H01L27/11597 , G11C11/22
Abstract: Thin-film Ferroelectric field-effect transistor (FeFET) may be organized as 3-dimensional NOR memory string arrays. Each 3-dimensional NOR memory string array includes a row of active stack each including a predetermined number of active strips each provided one on top of another and each being spaced apart from another by an isolation layer. Each active strip may include a shared source layer and a shared drain layer shared by the FeFETs provided along the active strip. Data storage in the active strip is provided by ferroelectric elements that can individually electrically set into one of two polarization states. FeFETs on separate active strips may be configured for read, programming or erase operations in parallel.
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公开(公告)号:US11515309B2
公开(公告)日:2022-11-29
申请号:US17125477
申请日:2020-12-17
Applicant: SUNRISE MEMORY CORPORATION
Inventor: Vinod Purayath , Jie Zhou , Wu-Yi Henry Chien , Eli Harari
IPC: H01L29/66 , H01L27/105 , H01L29/786 , H01L21/3065
Abstract: A process includes (a) providing a semiconductor substrate having a planar surface; (b) forming a plurality of thin-film layers above the planar surface of the semiconductor substrate, one on top of another, including among the thin-film layers first and second isolation layers, wherein a significantly greater concentration of a first dopant specie is provided in the first isolation layer than in the second isolation layer; (c) etching along a direction substantially orthogonal to the planar surface through the thin-films to create a trench having sidewalls that expose the thin-film layers; (d) depositing conformally a semiconductor material on the sidewalls of the trench; (e) annealing the first isolation layer at a predetermined temperature and a predetermined duration such that the first isolation layer act as a source of the first dopant specie which dopes a portion of the semiconductor material adjacent the first isolation layer; and (f) selectively etching the semiconductor material to remove the doped portion of the semiconductor material without removing the remainder of the semiconductor material.
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公开(公告)号:US11282855B2
公开(公告)日:2022-03-22
申请号:US16707920
申请日:2019-12-09
Applicant: SUNRISE MEMORY CORPORATION
Inventor: Scott Brad Herner , Wu-Yi Henry Chien , Jie Zhou , Eli Harari
IPC: H01L27/11582 , H01L21/311 , H01L21/3213
Abstract: A method for forming 3-dimensional vertical NOR-type memory string arrays uses damascene local bit lines is provided. The method of the present invention also avoids ribboning by etching local word lines in two steps. By etching the local word lines in two steps, the aspect ratio in the patterning and etching of stack of local word lines (“word line stacks”) is reduced, which improves the structural stability of the word line stacks.
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公开(公告)号:US20220028871A1
公开(公告)日:2022-01-27
申请号:US17494549
申请日:2021-10-05
Applicant: SUNRISE MEMORY CORPORATION
Inventor: Scott Brad Herner , Christopher J. Petti , George Samachisa , Wu-Yi Henry Chien
IPC: H01L27/1157 , H01L27/11578 , G11C16/04
Abstract: A thin-film storage transistor in a NOR memory string has a gate dielectric layer that includes a silicon oxide nitride (SiON) tunnel dielectric layer. In one embodiment, the SiON tunnel dielectric layer has a thickness between 0.5 to 5.0 nm thick and an index of refraction between 1.5 and 1.9. The SiON tunnel dielectric layer may be deposited at between 720° C. and 900° C. and between 100 and 800 mTorr vapor pressure, using an LPCVD technique under DCS, N2O, and NH3 gas flows. The SiON tunnel dielectric layer may have a nitrogen content of 1-30 atomic percent (at %).
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公开(公告)号:US20210226071A1
公开(公告)日:2021-07-22
申请号:US17155673
申请日:2021-01-22
Applicant: SUNRISE MEMORY CORPORATION
Inventor: Sayeef Salahuddin , George Samachisa , Wu-Yi Henry Chien , Eli Harari
IPC: H01L29/792 , H01L27/11568 , H01L29/423 , H01L29/51
Abstract: A storage transistor has a tunnel dielectric layer and a charge-trapping layer between a channel region and a gate electrode, wherein the charge-tapping layer has a conduction band offset that is less than the lowering of the tunneling barrier in the tunnel dielectric layer when a programming voltage is applied, such that electrons direct tunnel into the charge-trapping layer. The conduction band of the charge-trapping layer is has a value between −1.0 eV and 2.3 eV. The storage transistor may further include a barrier layer between the tunnel dielectric layer and the charge-trapping layer, the barrier layer having a conduction band offset less than the conduction band offset of the charge-trapping layer.
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公开(公告)号:US20200185411A1
公开(公告)日:2020-06-11
申请号:US16707920
申请日:2019-12-09
Applicant: SUNRISE MEMORY CORPORATION
Inventor: Scott Brad Herner , Wu-Yi Henry Chien , Jie Zhou , Eli Harari
IPC: H01L27/11582 , H01L21/311 , H01L21/3213
Abstract: A method for forming 3-dimensional vertical NOR-type memory string arrays uses damascene local bit lines is provided. The method of the present invention also avoids ribboning by etching local word lines in two steps. By etching the local word lines in two steps, the aspect ratio in the patterning and etching of stack of local word lines (“word line stacks”) is reduced, which improves the structural stability of the word line stacks.
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公开(公告)号:US12160996B2
公开(公告)日:2024-12-03
申请号:US18483322
申请日:2023-10-09
Applicant: SUNRISE MEMORY CORPORATION
Inventor: Christopher J. Petti , Vinod Purayath , George Samachisa , Wu-Yi Henry Chien , Eli Harari
Abstract: Thin-film Ferroelectric field-effect transistor (FeFET) may be organized as 3-dimensional NOR memory string arrays. Each 3-dimensional NOR memory string array includes a row of active stack each including a predetermined number of active strips each provided one on top of another and each being spaced apart from another by an isolation layer. Each active strip may include a shared source layer and a shared drain layer shared by the FeFETs provided along the active strip. Data storage in the active strip is provided by ferroelectric elements that can individually electrically set into one of two polarization states. FeFETs on separate active strips may be configured for read, programming or erase operations in parallel.
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公开(公告)号:US12150304B2
公开(公告)日:2024-11-19
申请号:US18499091
申请日:2023-10-31
Applicant: SUNRISE MEMORY CORPORATION
Inventor: Scott Brad Herner , Wu-Yi Henry Chien , Jie Zhou , Eli Harari
IPC: H10B43/27 , H01L21/311 , H01L21/3213
Abstract: A method for forming 3-dimensional vertical NOR-type memory string arrays uses damascene local bit lines is provided. The method of the present invention also avoids ribboning by etching local word lines in two steps. By etching the local word lines in two steps, the aspect ratio in the patterning and etching of stack of local word lines (“word line stacks”) is reduced, which improves the structural stability of the word line stacks.
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公开(公告)号:US11839086B2
公开(公告)日:2023-12-05
申请号:US17812375
申请日:2022-07-13
Applicant: SUNRISE MEMORY CORPORATION
Inventor: Christopher J. Petti , Vinod Purayath , George Samachisa , Wu-Yi Henry Chien , Eli Harari
CPC classification number: H10B51/30 , G11C11/223 , G11C11/2273 , G11C11/2275 , H10B51/20
Abstract: Thin-film Ferroelectric field-effect transistor (FeFET) may be organized as 3-dimensional NOR memory string arrays. Each 3-dimensional NOR memory string array includes a row of active stack each including a predetermined number of active strips each provided one on top of another and each being spaced apart from another by an isolation layer. Each active strip may include a shared source layer and a shared drain layer shared by the FeFETs provided along the active strip. Data storage in the active strip is provided by ferroelectric elements that can individually electrically set into one of two polarization states. FeFETs on separate active strips may be configured for read, programming or erase operations in parallel.
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公开(公告)号:US11557606B2
公开(公告)日:2023-01-17
申请号:US17329007
申请日:2021-05-24
Applicant: SUNRISE MEMORY CORPORATION
Inventor: Chenming Hu , Wu-Yi Henry Chien , Eli Harari
IPC: H01L27/11582 , H01L27/11568 , H01L21/02 , H01L21/28
Abstract: A thin-film storage transistor includes (a) first and second semiconductor regions comprising polysilicon of a first conductivity; and (b) a channel region between the first and second semiconductor regions, the channel region comprising single-crystal epitaxial grown silicon, and wherein the thin-film storage transistor is formed above a monocrystalline semiconductor substrate.
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