Abstract:
A transistor and method of fabricating the transistor are disclosed. The transistor is disposed in an active region of a substrate defined by an isolation region and includes a gate electrode and associated source/drain regions. The isolation region includes an upper isolation region and an lower isolation region, wherein the upper isolation region is formed with sidewalls having, at least in part, a positive profile.
Abstract:
A transistor and method of fabricating the transistor are disclosed. The transistor is disposed in an active region of a substrate defined by an isolation region and includes a gate electrode and associated source/drain regions. The isolation region includes an upper isolation region and an lower isolation region, wherein the upper isolation region is formed with sidewalls having, at least in part, a positive profile.
Abstract:
Recessed gate transistor structures and methods for making the same prevent a short between a gate conductive layer formed on a non-active region and an active region by forming an insulation layer therebetween, even though a misalignment is generated in forming a gate. The method and structure reduce the capacitance between gates. The method includes forming a device isolation film for defining an active region and a non-active region, on a predetermined region of a semiconductor substrate. First and second insulation layers are formed on an entire face of the substrate. A recess is formed in a portion of the active region. A gate insulation layer is formed within the recess, and then a first gate conductive layer is formed within the recess. A second gate conductive layer is formed on the second insulation layer and the first gate conductive layer. Subsequently, source/drain regions are formed.
Abstract:
An apparatus and method for retransmission in a wireless communication system. The method includes transmitting data to a Mobile Station (MS), identifying if there is an error in the transmitted data through a control message, if there occurs an error in the data, allocating resources for retransmitting data for erroneous data, transmitting information on the resources allocated for retransmission, to the MS, and retransmitting the data for the erroneous data to the MS.
Abstract:
A method and system for allocating feedback resources in a communication system are provided, in which a Base Station (BS) allocates a first feedback resource area for ACKnowledgment/Negative ACKnowledgment (ACK/NACK) messages for general packets and a second feedback resource area for ACK/NACK messages for fixed packets, transmits the general packets and the fixed packets to at least one Mobile Station (MS), receives ACK/NACK messages in the first and second feedback resource areas, and when at least one of the fixed packets is canceled from transmission after the transmission of the general packets and the fixed packets, transmits a bitmap message to the at least one MS indicating use or non-use of the second feedback resource area for each packet, to enable a feedback resource area allocated for the canceled fixed packet to be allocated to an ACK/NACK message for an additionally generated general packet.
Abstract:
A semiconductor device includes a dual gate dielectric layer that increases a performance of a semiconductor device. The semiconductor device includes a first dielectric layer having a predetermined thickness on a semiconductor substrate. The first dielectric layer is formed on a first region. The semiconductor device also includes a second dielectric layer having a dielectric constant higher than that of the first dielectric layer. The second dielectric layer is formed on both the first region and a second region.
Abstract:
An apparatus and method for Hybrid Automatic Repeat reQuest (HARQ) signaling in a broadband wireless communication system are provided. A communication method of a Base Station (BS) includes transmitting a Fixed Allocation (FA) message containing bitmap index information for all Mobile Stations (MSs) allocated with fixed resources; and transmitting bitmap information indicating whether packets to be transmitted to the MSs are Retransmission (Rtx) packets or new packets. Accordingly, when HARQ is carried out using a fixed resource allocation scheme, a bitmap is used to indicate whether HARQ packets transmitted in a current frame are new packets or Rtx packets. Therefore, a receiving end can be prevented from incorrectly decoding the packets.
Abstract:
An apparatus and method for preventing errors in an HARQ operation and improving HARQ performance are provided. In the apparatus and method, upon receipt of HARQ feedback information, an information interpreter interprets the HARQ feedback information and determines whether the HARQ feedback information includes an error. If the HARQ feedback information includes an error, a scheduler controls a data pattern with the receiver to be generated.
Abstract:
A semiconductor device includes an active region in a semiconductor substrate, having first, second and third regions sequentially arranged in the active region. An inactive region in the semiconductor substrate defines the active region. Gate patterns, partially buried in the active and inactive regions, are positioned between the first and second regions or between the second and third regions, intersecting the active region at right angles. A bit line pattern intersects the gate patterns at right angles and overlaps the inactive region, the bit line pattern including a region electrically connected to the second region of the active region. An interlayer insulating layer covers the gate patterns. Storage nodes on the interlayer insulating layer are electrically connected to the active region. A first storage node overlaps the first region and the inactive region and a second storage node overlaps the third region, the inactive region and the bit line pattern.
Abstract:
A semiconductor device having a recessed active edge is provided. The semiconductor devices include an isolation layer disposed in a substrate to define an active region. A gate electrode is disposed to cross over the active region. A source region and a drain region are disposed in the active region on both sides of the gate electrode. A recessed region is disposed under the gate electrode and on an edge of the active region adjacent to the isolation layer. A bottom of the recessed region may be sloped down toward the isolation layer. The gate electrode may further extend into and fill the recessed region. That is, a gate extension may be disposed in the recessed region. A method of fabricating the semiconductor device is also provided.