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公开(公告)号:US11450395B2
公开(公告)日:2022-09-20
申请号:US17237688
申请日:2021-04-22
发明人: Gu-Huan Li , Chen-Ming Hung , Yu-Der Chih
摘要: A memory circuit includes a first bank of non-volatile memory (NVM) devices, a first plurality of decoders, a first plurality of high-voltage (HV) drivers corresponding to the first plurality of decoders, and a first plurality of HV power switches. A first HV power switch is coupled to each HV driver of the first plurality of HV drivers, and each decoder is configured to generate an enable signal corresponding to a column of the first bank of NVM devices. Each HV driver is configured to output a HV activation signal to the corresponding column of the first bank of NVM devices responsive to a power signal of the first HV power switch and to the enable signal of the corresponding decoder.
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公开(公告)号:US11915752B2
公开(公告)日:2024-02-27
申请号:US17709662
申请日:2022-03-31
发明人: Yu-Der Chih , Chung-Cheng Chou , Chun-Yun Wu , Chen-Ming Hung
IPC分类号: G11C13/00
CPC分类号: G11C13/0069 , G11C13/0026 , G11C13/0028 , G11C13/0038 , G11C13/004 , G11C13/0064
摘要: A memory device includes a main array comprising main memory cells; a redundancy array comprising redundancy memory cells; and write circuitry configured to perform a first programming operation on a main memory cell, to detect whether a current of the main memory cell exceeds a predefined current threshold during the first programming operation, and to disable a second programming operation for a redundancy memory cell if the current of the main memory cell exceeds the predefined current threshold during the first programming operation.
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公开(公告)号:US10929588B2
公开(公告)日:2021-02-23
申请号:US16252291
申请日:2019-01-18
发明人: Meng-Sheng Chang , Chen-Ming Hung , Shao-Yu Chou , Yao-Jen Yang
IPC分类号: G06F17/50 , G06F30/392 , H01L27/112 , G11C17/16 , G11C17/18 , H01L23/528 , H01L23/525
摘要: A method of generating an IC layout diagram includes intersecting an active region with first and second gate regions to define locations of first and second anti-fuse structures, overlying the first gate region with a first conductive region to define a location of an electrical connection between the first conductive region and first gate region, and overlying the second gate region with a second conductive region to define a location of an electrical connection between the second conductive region and second gate region. The first and second conductive regions are aligned along a direction perpendicular to a direction along which the first and second gate regions extend, and at least one of intersecting the active region with the first gate region, intersecting the active region with the second gate region, overlying the first gate region, or overlying the second gate region is executed by a processor of a computer.
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公开(公告)号:US20190251223A1
公开(公告)日:2019-08-15
申请号:US16252291
申请日:2019-01-18
发明人: Meng-Sheng Chang , Chen-Ming Hung , Shao-Yu Chou , Yao-Jen Yang
IPC分类号: G06F17/50 , H01L27/112 , H01L23/528 , G11C17/16 , G11C17/18
CPC分类号: G06F17/5072 , G11C17/16 , G11C17/18 , H01L23/5252 , H01L23/528 , H01L27/11206
摘要: A method of generating an IC layout diagram includes intersecting an active region with first and second gate regions to define locations of first and second anti-fuse structures, overlying the first gate region with a first conductive region to define a location of an electrical connection between the first conductive region and first gate region, and overlying the second gate region with a second conductive region to define a location of an electrical connection between the second conductive region and second gate region. The first and second conductive regions are aligned along a direction perpendicular to a direction along which the first and second gate regions extend, and at least one of intersecting the active region with the first gate region, intersecting the active region with the second gate region, overlying the first gate region, or overlying the second gate region is executed by a processor of a computer.
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公开(公告)号:US12073169B2
公开(公告)日:2024-08-27
申请号:US18446684
申请日:2023-08-09
发明人: Meng-Sheng Chang , Shao-Yu Chou , Yao-Jen Yang , Chen-Ming Hung
IPC分类号: G06F7/50 , G06F30/392 , G11C17/16 , G11C17/18 , H01L23/528 , H10B20/20 , H01L23/525
CPC分类号: G06F30/392 , G11C17/16 , G11C17/18 , H01L23/528 , H10B20/20 , H01L23/5252
摘要: An anti-fuse array includes first through fourth adjacent anti-fuse bit columns, the anti-fuse bits of the first and second anti-fuse bit columns including portions of active areas of a first active area column, and the anti-fuse bits of the third and fourth anti-fuse bit columns including portions of active areas of a second active area column. Each row of a first set of conductive segment rows includes first and second conductive segments positioned between adjacent active areas of the first active area column and a third conductive segment positioned between adjacent active areas of the second active area column. Each row of a second set of conductive segments alternating with the first set of conductive segment rows includes a fourth conductive segment positioned between adjacent active areas of the first active area column and fifth and sixth conductive segments positioned between adjacent active areas of the second active area column.
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公开(公告)号:US20240153558A1
公开(公告)日:2024-05-09
申请号:US18411758
申请日:2024-01-12
发明人: Yu-Der Chih , Chung-Cheng Chou , Chun-Yun Wu , Chen-Ming Hung
IPC分类号: G11C13/00
CPC分类号: G11C13/0069 , G11C13/0026 , G11C13/0028 , G11C13/0038 , G11C13/004 , G11C13/0064
摘要: A memory device includes a main array comprising main memory cells; a redundancy array comprising redundancy memory cells; and write circuitry configured to perform a first programming operation on a main memory cell, to detect whether a current of the main memory cell exceeds a predefined current threshold during the first programming operation, and to disable a second programming operation for a redundancy memory cell if the current of the main memory cell exceeds the predefined current threshold during the first programming operation.
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公开(公告)号:US11791006B2
公开(公告)日:2023-10-17
申请号:US17816118
申请日:2022-07-29
发明人: Gu-Huan Li , Chen-Ming Hung , Yu-Der Chih
IPC分类号: G11C17/18 , G11C17/16 , G11C8/10 , G11C7/10 , G11C11/4074 , G11C11/4096 , G11C11/4099
CPC分类号: G11C17/18 , G11C7/1069 , G11C7/1096 , G11C8/10 , G11C11/4074 , G11C11/4096 , G11C11/4099 , G11C17/16
摘要: A memory circuit includes a bank of non-volatile memory (NVM) devices, a plurality of high-voltage (HV) drivers, a global HV power switch configured to generate a HV power signal, and a plurality of HV power switches coupled to the global HV switch. A first HV power switch of the plurality of HV power switches is coupled to each HV driver of the plurality of HV drivers, the first HV power switch of the plurality of HV power switches is configured to output a power signal responsive to the HV power signal, and each HV driver of the plurality of HV drivers is configured to output a HV activation signal to a corresponding column of the bank of NVM devices responsive to the power signal.
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公开(公告)号:US11783107B2
公开(公告)日:2023-10-10
申请号:US17178973
申请日:2021-02-18
发明人: Meng-Sheng Chang , Shao-Yu Chou , Yao-Jen Yang , Chen-Ming Hung
IPC分类号: G06F7/50 , G06F30/392 , G11C17/16 , G11C17/18 , H01L23/528 , H10B20/20 , H01L23/525
CPC分类号: G06F30/392 , G11C17/16 , G11C17/18 , H01L23/528 , H10B20/20 , H01L23/5252
摘要: An IC device includes a first anti-fuse structure including a first dielectric layer between a first gate conductor and a first active area, and a second anti-fuse structure including a second dielectric layer between a second gate conductor and the first active area. A first via is electrically connected to the first gate conductor at a first location a first distance from the first active area, a second via is electrically connected to the second gate conductor at a second location a second distance from the first active area, and the first distance is approximately equal to the second distance.
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公开(公告)号:US20230317159A1
公开(公告)日:2023-10-05
申请号:US17709662
申请日:2022-03-31
发明人: Yu-Der Chih , Chung-Cheng Chou , Chun-Yun Wu , Chen-Ming Hung
IPC分类号: G11C13/00
CPC分类号: G11C13/0069 , G11C13/0064 , G11C13/004 , G11C13/0028 , G11C13/0026 , G11C13/0038
摘要: A memory device includes a main array comprising main memory cells; a redundancy array comprising redundancy memory cells; and write circuitry configured to perform a first programming operation on a main memory cell, to detect whether a current of the main memory cell exceeds a predefined current threshold during the first programming operation, and to disable a second programming operation for a redundancy memory cell if the current of the main memory cell exceeds the predefined current threshold during the first programming operation.
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10.
公开(公告)号:US09558841B2
公开(公告)日:2017-01-31
申请号:US13918681
申请日:2013-06-14
发明人: Sung-Chieh Lin , Kuo-Yuan Hsu , Wei-Li Liao , Chen-Ming Hung , Yun-Han Chen , Shao-Cheng Wang
摘要: A circuit includes a fuse cell, a sense circuit and an output control circuit. The fuse cell includes an electrical fuse. The sense circuit is electrically coupled to the fuse cell and configured for generating a sense signal indicative of a programmed condition of the electrical fuse, at an output of the sense circuit. The output control circuit is electrically coupled to the output of the sense circuit, and the output control circuit is configured for latching the sense signal indicative of the electrical fuse having been programmed, during a read operation of the fuse cell.
摘要翻译: 电路包括熔丝单元,感测电路和输出控制电路。 保险丝盒包括电熔丝。 感测电路电耦合到熔丝单元并且被配置为在感测电路的输出处产生指示电熔丝的编程状态的感测信号。 输出控制电路电耦合到感测电路的输出,并且输出控制电路被配置为在熔丝单元的读取操作期间锁存指示已经编程的电熔丝的感测信号。
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