公开(公告)号：US20180052190A1

公开(公告)日：2018-02-22

申请号：US15801067

申请日：2017-11-01

Applicant: TECHNOPROBE S.p.A.

Inventor： Daniele Perego ,  Simone Todaro

IPC: G01R1/073 ,  G01R1/067

Abstract: A testing head for testing the working of a device under test comprises a plurality of contact probes, each contact probe having a rod-like body of a predetermined length that extends between a first end and a second end and being housed in respective guide holes made in at least one plate-like lower guide and one plate-like upper guide that are parallel to each other and spaced apart by a bending zone. Suitably, at least one of the lower guide and upper guide is equipped with at least one recessed portion formed at a plurality of those guide holes and realizing lowered portions thereof adapted to reduce a thickness of the plurality of those guide holes.

公开(公告)号：US10698003B2

公开(公告)日：2020-06-30

申请号：US15801067

申请日：2017-11-01

Applicant: TECHNOPROBE S.p.A.

Inventor： Daniele Perego ,  Simone Todaro

IPC: G01R1/073 ,  G01R1/067

Abstract: A testing head for testing the working of a device under test comprises a plurality of contact probes, each contact probe having a rod-like body of a predetermined length that extends between a first end and a second end and being housed in respective guide holes made in at least one plate-like lower guide and one plate-like upper guide that are parallel to each other and spaced apart by a bending zone. Suitably, at least one of the lower guide and upper guide is equipped with at least one recessed portion formed at a plurality of those guide holes and realizing lowered portions thereof adapted to reduce a thickness of the plurality of those guide holes.

公开(公告)号：US11549965B2

公开(公告)日：2023-01-10

申请号：US16324686

申请日：2017-08-07

Applicant: TECHNOPROBE S.P.A.

Inventor： Daniele Perego

IPC: G01R1/067 ,  G01R1/073 ,  G01R31/28

Abstract: It is herein described a contact probe of a testing head of an apparatus for testing electronic devices comprising a probe body being essentially extended in a longitudinal direction between respective end portions adapted to realize a contact with respective contact pads, at least one end portion having transverse dimensions greater than the probe body and comprising an enlarged portion, projecting only in correspondence of a first side wall of the contact probe. Suitably, the at least one end portion further comprises at least one protrusion projecting from a second side wall, opposite to the first side wall and substantially extending toward the second and opposite wall along a longitudinal axis of the contact probe starting from the enlarged portion.

公开(公告)号：US10551433B2

公开(公告)日：2020-02-04

申请号：US15703614

申请日：2017-09-13

Applicant: TECHNOPROBE S.p.A.

Inventor： Roberto Crippa ,  Raffaele Vallauri ,  Emanuele Bertarelli ,  Daniele Perego

IPC: G01R31/28 ,  G01R1/067

Abstract: A testing head for testing a device includes a couple of plate-like supports separated from each other by a suitable gap and provided with respective guide holes to slidably house a plurality of contact probes, each including a rod-like body extending along a preset longitudinal axis between a first and second ends, the first end being a contact tip that abuts a contact pad of the device and the second end being a contact head that abuts a contact pad of a space transformer. At least one of the supports comprises a couple of guides that are parallel to each other and separated by an additional gap and provided with corresponding guide holes. Each contact probe comprises a protruding element or stopper originating from a lateral wall and realized in correspondence of one wall of a guide hole of the guides contacting the lateral wall of the contact probe.

公开(公告)号：US20180003767A1

公开(公告)日：2018-01-04

申请号：US15703614

申请日：2017-09-13

Applicant: TECHNOPROBE S.p.A.

Inventor： Roberto Crippa ,  Raffaele Vallauri ,  Emanuele Bertarelli ,  Daniele Perego

IPC: G01R31/28 ,  G01R1/067

CPC classification number: G01R31/2891 ,  G01R1/06733 ,  G01R1/0675 ,  G01R1/07314 ,  G01R1/07357 ,  H01R13/2435 ,  H01R13/42

Abstract: A testing head for testing a device includes a couple of plate-like supports separated from each other by a suitable gap and provided with respective guide holes to slidably house a plurality of contact probes, each including a rod-like body extending along a preset longitudinal axis between a first and second ends, the first end being a contact tip that abuts a contact pad of the device and the second end being a contact head that abuts a contact pad of a space transformer. At least one of the supports comprises a couple of guides that are parallel to each other and separated by an additional gap and provided with corresponding guide holes. Each contact probe comprises a protruding element or stopper originating from a lateral wall and realized in correspondence of one wall of a guide hole of the guides contacting the lateral wall of the contact probe.