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公开(公告)号：US20240012027A1
公开(公告)日：2024-01-11
申请号：US18252142
申请日：2021-11-10
Applicant: TECHNOPROBE S.P.A.
Inventor： Raffaele VALLAURI
IPC: G01R1/073
CPC classification number: G01R1/07314 , G01R1/07357
Abstract: A probe head for testing the operation of a device under test is disclosed. The probe head has a plurality of contact probes including a body extending along a longitudinal axis adapted to contact respective contact pads and having a substantially square or rectangular-shaped cross section, and a guide lying in a plane and provided with guide holes having a substantially square or rectangular-shaped cross section for slidingly housing the contact probes. In the plane of the guide the cross section of the guide holes and the cross section of the contact probes are rotated relative to each other around the longitudinal axis and have respective different orientations with respect to a reference system in the plane, so that an edge of the body is mechanically interfering with a corresponding wall of the guide holes The probe head also has a conductive portion formed at the guide and/or formed at another guide of the probe head being adapted to contact and short-circuit a corresponding group of contact probes.
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公开(公告)号：US20200072873A1
公开(公告)日：2020-03-05
申请号：US16677581
申请日：2019-11-07
Applicant: TECHNOPROBE S.p.A.
Inventor： Roberto CRIPPA , Flavio MAGGIONI , Raffaele VALLAURI
Abstract: A method of manufacturing a multi-layer for a probe card comprises providing first contact pads on an exposed face of a first dielectric layer and second contact pads on an exposed face of a last dielectric layer. Each dielectric layer is laser ablated to realize pass-through structures and the pass-through structures are conductively filled to realize conductive structures. The dielectric layers are superimposed in a way that each conductive structure contacts a corresponding conductive structure of a contiguous dielectric layer in the multi-layer and forms conductive paths electrically connected the first and second contact pads. The second contact pads having a greater distance between its symmetry centers than the first contact pads, the multi-layer thus performing a spatial transformation between the first and second contact pads connected through the connective paths.
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Patent Agency Ranking
公开(公告)号：US20170059612A1
公开(公告)日：2017-03-02
申请号：US15352448
申请日：2016-11-15
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto CRIPPA , Giuseppe CRIPPA , Raffaele VALLAURI
CPC classification number: G01R1/06738 , G01R1/06716 , G01R1/06755 , G01R1/06761 , G01R1/073 , G01R1/07314 , G01R1/07357 , H01R13/03 , H01R13/2464
Abstract: A contact probe of a testing head of a testing apparatus of electronic devices comprises respective end portions adapted to contact respective contact pads and a body essentially extended in a longitudinal direction between the end portions, at least one end portion comprising an insert made of a first conductive material having a hardness being greater than a second conductive material making the contact probe which is supported by a section of the end portion, the section being made of the second conductive material and being shaped in a complementary way with respect to the insert and having respective abutting surfaces facing and adhering to respective abutting surfaces of the insert.
Abstract translation: 电子装置的测试装置的测试头的接触探针包括适于接触相应接触垫的相应端部和在端部之间基本上沿纵向方向延伸的本体，至少一个端部包括由第一 所述导电材料具有大于第二导电材料的硬度，所述导电材料使所述接触探针由所述端部的一部分支撑，所述部分由所述第二导电材料制成并且相对于所述插入件以互补的方式成形，并具有 相应的邻接表面面向并粘附到插入件的相应的邻接表面。
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公开(公告)号：US20230028352A1
公开(公告)日：2023-01-26
申请号：US17783433
申请日：2020-12-10
Applicant: TECHNOPROBE S.P.A.
Inventor： Raffaele VALLAURI , Fabio MORGANA
IPC: G01R1/067
Abstract: A contact probe having a first end portion and a second end portion, a probe body extended along a longitudinal development direction between the first end portion and the second end portion is disclosed. The probe body has a pair of arms separated by a slot and extending according to the longitudinal development direction and a conductive insert extended along the longitudinal development direction, in a bending plane of the contact probe. The conductive insert is made of a first material and the contact probe is made of a second material and the first material has a lower electrical resistivity than an electrical resistivity of the second material. The conductive insert is a power transmission element of the contact probe and the arms are structural support elements of the contact probe during a deformation of the probe body.
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公开(公告)号：US20210247422A1
公开(公告)日：2021-08-12
申请号：US17244498
申请日：2021-04-29
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto CRIPPA , Raffaele VALLAURI
Abstract: A contact probe comprises a probe body being extended in a longitudinal direction between respective end portions adapted to realize a contact with respective contact pads, at least one end portion having transverse dimensions greater than the probe body. Suitably, the end portion comprises at least one indentation adapted to house a material scrap being on the contact probe after a separation from a substrate wherein the contact probe has been realized.
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公开(公告)号：US20190293686A1
公开(公告)日：2019-09-26
申请号：US16439527
申请日：2019-06-12
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto CRIPPA , Raffaele VALLAURI
Abstract: A contact probe comprises a probe body being extended in a longitudinal direction between respective end portions adapted to realize a contact with respective contact pads, at least one end portion having transverse dimensions greater than the probe body. Suitably, the end portion comprises at least one indentation adapted to house a material scrap being on the contact probe after a separation from a substrate wherein the contact probe has been realized.
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公开(公告)号：US20170269125A1
公开(公告)日：2017-09-21
申请号：US15309776
申请日：2016-03-09
Applicant: TECHNOPROBE S.P.A.
Inventor： Roberto CRIPPA , Giuseppe CRIPPA , Raffaele VALLAURI
IPC: G01R1/067
CPC classification number: G01R1/06738 , G01R1/06716 , G01R1/06755 , G01R1/06761 , G01R1/073 , G01R1/07314 , G01R1/07357 , H01R13/03 , H01R13/2464
Abstract: A contact probe of a testing head of a testing apparatus of electronic devices comprises respective end portions adapted to contact respective contact pads and a body essentially extended in a longitudinal direction between the end portions, at least one end portion comprising an insert made of a first conductive material having a hardness being greater than a second conductive material making the contact probe which is supported by a section of the end portion, the section being made of the second conductive material and being shaped in a complementary way with respect to the insert and having respective abutting surfaces facing and adhering to respective abutting surfaces of the insert.
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