Memory Circuit with Leakage Compensation
    5.
    发明申请

    公开(公告)号:US20180366205A1

    公开(公告)日:2018-12-20

    申请号:US16112402

    申请日:2018-08-24

    摘要: A memory array comprising a word line and a bit line is disclosed. Each of a plurality of memory cells of the memory array has a first terminal connected to the bit line and a current path between the first terminal and a respective second terminal. A first memory cell of the plurality of memory cells has the second terminal coupled to receive a first supply voltage when selected by the word line. A second memory cell of the plurality of memory cells has the second terminal coupled to receive a voltage different from the first supply voltage when the first memory cell is selected by the word line.

    MEMORY CIRCUIT WITH LEAKAGE COMPENSATION

    公开(公告)号:US20170243659A1

    公开(公告)日:2017-08-24

    申请号:US15050678

    申请日:2016-02-23

    IPC分类号: G11C17/08

    摘要: A memory array comprising a word line and a bit line is disclosed. Each of a plurality of memory cells of the memory array has a first terminal connected to the bit line and a current path between the first terminal and a respective second terminal. A first memory cell of the plurality of memory cells has the second terminal coupled to receive a first supply voltage when selected by the word line. A second memory cell of the plurality of memory cells has the second terminal coupled to receive a voltage different from the first supply voltage when the first memory cell is selected by the word line.