中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

7 records (took 0.013 seconds)

    ENHANCED MATERIAL DETECTION BY STEREO BEAM PROFILE ANALYSIS
    3.
    发明公开
    ENHANCED MATERIAL DETECTION BY STEREO BEAM PROFILE ANALYSIS 审中-公开

    公开(公告)号：US20240011891A1

    公开(公告)日：2024-01-11

    申请号：US18363488

    申请日：2023-08-24

    Applicant: TRINAMIX GMBH

    Inventor： Patrick SCHINDLER ,  Ruben HUEHNERBEIN ,  Christian LENNARTZ ,  Jakob UNGER

    IPC: G01N21/01 ,  H04N13/254 ,  H04N13/239 ,  G06V10/764 ,  G06V10/145 ,  G06V10/147 ,  G06V10/60 ,  G06V10/75

    CPC classification number: G01N21/01 ,  H04N13/254 ,  H04N13/239 ,  G06V10/764 ,  G06V10/145 ,  G06V10/147 ,  G06V10/60 ,  G06V10/759 ,  G06V10/751 ,  G01N2021/0106 ,  G01N2021/177

    Abstract: A detector (110) for determining at least one material property of at least one object (112) is proposed. The detector (110) comprises



    at least one projector (116) configured for illuminating the object (112) with at least one illumination pattern (118) comprising a plurality of illumination features (120);
    at least one first camera (122) having at least one first sensor element, wherein the first sensor element has a matrix of first optical sensors, the first optical sensors each having a light-sensitive area, wherein each first optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object (112) to the first camera (122), wherein the first camera (122) is configured for imaging at least one first reflection image comprising a plurality of first reflection features generated by the object (112) in response to illumination by the illumination features (120), wherein the first camera (122) is arranged such that the first reflection image is imaged under a first direction of view to the object (112);
    at least one second camera (124) having at least one second sensor element, wherein the second sensor element has a matrix of second optical sensors, the second optical sensors each having a light-sensitive area, wherein each second optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object (112) to the second camera (124), wherein the second camera (124) is configured for imaging at least one second reflection image comprising a plurality of second reflection features generated by the object (112) in response to illumination by the illumination feature (120), wherein the second camera (124) is arranged such that the second reflection image is imaged under a second direction of view to the object (112), wherein the first direction of view and the second direction of view differ;
    at least one evaluation device (126) configured for evaluating the first reflection image and the second reflection image, wherein the evaluation comprises matching the first reflection features and the second reflection features and determining a combined material property of matched pairs of first and second reflection features by analysis of their beam profiles.

    ENHANCED MATERIAL DETECTION BY STEREO BEAM PROFILE ANALYSIS
    4.
    发明申请
    ENHANCED MATERIAL DETECTION BY STEREO BEAM PROFILE ANALYSIS 有权

    公开(公告)号：US20250055970A1

    公开(公告)日：2025-02-13

    申请号：US18723986

    申请日：2023-01-23

    Applicant: TRINAMIX GMBH

    Inventor： Patrick SCHINDLER ,  Ruben HUEHNERBEIN ,  Christian LENNARTZ ,  Jakob UNGER

    IPC: H04N13/254

    Abstract: Disclosed herein is a detector for determining at least one material property of at least one object. The detector includes at least one projector configured for illuminating the object with at least one illumination pattern including a plurality of illumination features; at least one first camera having at least one first sensor element; at least one second camera having at least one second sensor element; and at least one evaluation device configured for evaluating a first reflection image and the second reflection image.

    DETECTOR FOR OBJECT RECOGNITION
    7.
    发明申请
    DETECTOR FOR OBJECT RECOGNITION 有权

    公开(公告)号：US20230078604A1

    公开(公告)日：2023-03-16

    申请号：US17795890

    申请日：2021-01-29

    Applicant: TRINAMIX GMBH

    Inventor： Benjamin REIN ,  Patrick SCHINDLER ,  Friedrich SCHICK ,  Jakob UNGER ,  Peter SCHILLEN ,  Nils BERNER

    IPC: G06T7/70 ,  G06T7/521 ,  G06T7/60 ,  G06V10/141 ,  G06V10/60

    Abstract: A detector for object recognition includes an illumination source for projecting an illumination pattern on an area including at least one object; an optical sensor having a light-sensitive area and configured for determining a first image including a two-dimensional image of the area, and a second image including a plurality of reflection features generated in response to illumination, each reflection feature including a beam profile; an evaluation device for determining beam profile information for each reflection feature by analyzing their beam profiles, determining a three-dimensional image using the determined beam profile information, identifying the reflection features located inside and/or outside an image region, determining a depth level from the beam profile information of the reflection features located inside and/or outside of the image region, determining a material property of the object from the beam profile information, and determining a position and/or orientation of the object.

Patent Agency Ranking