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公开(公告)号:US20230317730A1
公开(公告)日:2023-10-05
申请号:US18331011
申请日:2023-06-07
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Guo-Huei WU , Chi-Yu LU , Ting-Yu CHEN , Li-Chun TIEN
IPC: H01L27/118 , H01L27/02
CPC classification number: H01L27/11807 , H01L27/0207 , H01L2027/11866 , H01L2027/11887 , H01L2027/11881 , H01L2027/11875 , H01L2027/11861 , H01L2027/11812
Abstract: A method includes a first set of active areas extending in a first direction and separated from each other along a second direction in a cell; first and second gate s that cross the first set of active areas along the second direction, the first gate being shared by a first transistor of a first type and a second transistor of a second type and the second gate being shared by a third transistor of the first type and a fourth transistor of the second type; and a set of conductive lines arranged in three metal tracks in the cell and coupling at least one of terminals of the first to fourth transistors to another one of the terminals of the first to fourth transistor. The first transistor is turned off to electrically disconnect a source/drain terminal of the first transistor from a source/drain terminal of the fourth transistor.
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公开(公告)号:US20230334208A1
公开(公告)日:2023-10-19
申请号:US18341545
申请日:2023-06-26
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Cheok-Kei LEI , Zhe-Wei JIANG , Chi-Yu LU , Yi-Hsin KO , Chi-Lin LIU , Hui-Zhong ZHUANG
IPC: G06F30/327 , H01L23/52 , H01L23/522 , G06F30/392 , G06F30/398
CPC classification number: G06F30/327 , H01L23/52 , H01L23/5222 , G06F30/392 , G06F30/398
Abstract: The present disclosure describes a method for optimizing metal cuts in standard cells. The method includes placing a standard cell in a layout area and inserting a metal cut along a metal interconnect of the standard cell at a location away from a boundary of the standard cell. The method further includes disconnecting, at the location, a metal portion of the metal interconnect from a remaining portion of the metal interconnect based on the metal cut.
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公开(公告)号:US20220367519A1
公开(公告)日:2022-11-17
申请号:US17875257
申请日:2022-07-27
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Guo-Huei WU , Chi-Yu LU , Ting-Yu CHEN , Li-Chun TIEN
IPC: H01L27/118 , H01L27/02
Abstract: A method is provided, and including operations as below: forming multiple active areas extending in a first direction; forming multiple conductive patterns extending in a second direction different from the first direction and arranged in a first layer above the active areas; forming multiple gates extending parallel to the conductive patterns; and forming a first set of conductive lines extending in the first direction and arranged in three first metal tracks that are in a second layer above the first layer, wherein one of the first set of conductive lines is arranged in a middle track of the three first metal tracks, coupled to one of the gates and overlap a first shallow trench region between two of the active areas.
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公开(公告)号:US20220093646A1
公开(公告)日:2022-03-24
申请号:US17025983
申请日:2020-09-18
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Guo-Huei WU , Chi-Yu LU , Ting-Yu CHEN , Li-Chun TIEN
IPC: H01L27/118 , H01L27/02
Abstract: An integrated circuit is disclosure. The integrated circuit includes a first pair of power rails, a set of conductive lines arranged in the first layer parallel to the first pair of power rails, a first set of active areas. The integrated circuit further includes a first gate arranged along the second direction, between the first pair of power rails, and crossing the first set of active areas in a layout view, wherein the first gate is configured to be shared by a first transistor of a first type and a second transistor of a second type; and a second gate and a third gate, in which the second gate is configured to be a control terminal of a third transistor, and the third gate is configured to be a control terminal of a fourth transistor which is coupled to the control terminal of the third transistor.
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公开(公告)号:US20200285792A1
公开(公告)日:2020-09-10
申请号:US16881706
申请日:2020-05-22
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Cheok-Kei LEI , Chi-Lin LIU , Hui-Zhong ZHUANG , Zhe-Wei JIANG , Chi-Yu LU , Yi-Hsin KO
IPC: G06F30/327 , H01L23/52 , H01L23/522 , G06F30/392 , G06F30/398
Abstract: The present disclosure describes a method for optimizing metal cuts in standard cells. The method includes placing a standard cell in an layout area and inserting a metal cut along a metal interconnect of the standard cell at a location away from a boundary of the standard cell. The method further includes disconnecting, at the location, a metal portion of the metal interconnect from a remaining portion of the metal interconnect based on the metal cut.
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