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公开(公告)号:US20240363312A1
公开(公告)日:2024-10-31
申请号:US18768190
申请日:2024-07-10
Inventor: Cheng Kuang Tso , Chou-Feng Lee , Chih-Hsien Hsu , Chung-Hsiu Cheng , Jr-Sheng Chen
IPC: H01J37/32 , H01L21/3065
CPC classification number: H01J37/32449 , H01J37/32522 , H01L21/3065 , H01J2237/334
Abstract: Methods and systems for uniformly cooling a dome within a plasma treatment system are disclosed. The methods and systems utilize a diffuser including a perforated plate and a cone. The perforated plate includes a center portion and multiple arrays of holes with each array being located circumferentially at a different distance from the center. The cone extends away from the center. The diffuser spreads cooling gas more uniformly across the surface of the dome.
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公开(公告)号:US12062523B2
公开(公告)日:2024-08-13
申请号:US17670670
申请日:2022-02-14
Applicant: Taiwan Semiconductor Manufacturing Company
Inventor: Cheng Kuang Tso , Chou-Feng Lee , Chih-Hsien Hsu , Chung-Hsiu Cheng , Jr-Sheng Chen
IPC: H01J37/32 , H01L21/3065
CPC classification number: H01J37/32449 , H01J37/32522 , H01L21/3065 , H01J2237/334
Abstract: Methods and systems for uniformly cooling a dome within a plasma treatment system are disclosed. The methods and systems utilize a diffuser including a perforated plate and a cone. The perforated plate includes a center portion and multiple arrays of holes with each array being located circumferentially at a different distance from the center. The cone extends away from the center. The diffuser spreads cooling gas more uniformly across the surface of the dome.
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公开(公告)号:US20240071803A1
公开(公告)日:2024-02-29
申请号:US17899821
申请日:2022-08-31
Applicant: Taiwan Semiconductor Manufacturing Company
Inventor: Fu-Yi Liu , Chou-Feng Lee , Chih-Hsien Hsu
IPC: H01L21/687 , H01J37/32 , H01L21/311 , H01L21/3213
CPC classification number: H01L21/68721 , H01J37/32642 , H01J37/32724 , H01L21/31116 , H01L21/31144 , H01L21/32136 , H01L21/32139 , H01L21/6875 , H01L21/68757 , H01J2237/3341 , H01J2237/3345
Abstract: Methods and systems for dry etching are disclosed. The system includes a wafer clamp ring having a central opening through which a substrate may be treated and a plurality of smaller, outer support holes for receiving pins from plunger assemblies. The outer support holes are tapered and change in diameter. The tapered shape reduces horizontal shifting of the wafer clamp ring which can occur as the wafer clamp ring is moved up-and-down during operational use. The reduced shifting increases wafer yield along the edges of the wafer.
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公开(公告)号:US20230260758A1
公开(公告)日:2023-08-17
申请号:US17670670
申请日:2022-02-14
Applicant: Taiwan Semiconductor Manufacturing Company
Inventor: Cheng Kuang Tso , Chou-Feng Lee , Chih-Hsien Hsu , Chung-Hsiu Cheng , Jr-Sheng Chen
IPC: H01J37/32 , H01L21/3065
CPC classification number: H01J37/32449 , H01L21/3065 , H01J37/32522 , H01J2237/334
Abstract: Methods and systems for uniformly cooling a dome within a plasma treatment system are disclosed. The methods and systems utilize a diffuser including a perforated plate and a cone. The perforated plate includes a center portion and multiple arrays of holes with each array being located circumferentially at a different distance from the center. The cone extends away from the center. The diffuser spreads cooling gas more uniformly across the surface of the dome.
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