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1.
公开(公告)号:US12268103B2
公开(公告)日:2025-04-01
申请号:US17836145
申请日:2022-06-09
Inventor: Kuo-Pin Chang , Yu-Wei Ting , Tsung-Hao Yeh , Kuo-Chyuan Tzeng , Kuo-Ching Huang
Abstract: Phase change material (PCM) switches and methods of fabrication thereof that provide improved thermal confinement within a phase change material layer. A PCM switch may include a dielectric capping layer between a heater pad and the phase change material layer of the PCM switch that is laterally-confined such opposing sides of the dielectric capping layer the heater pad may form continuous surfaces extending transverse to the signal transmission pathway across the PCM switch. Heat transfer from the heater pad through the dielectric capping layer to the phase change material layer may be predominantly vertical, with minimal thermal dissipation along a lateral direction. The localized heating of the phase change material may improve the efficiency of the PCM switch enabling lower bias voltages, minimize the formation of regions of intermediate resistivity in the PCM switch, and improve the parasitic capacitance characteristics of the PCM switch.
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2.
公开(公告)号:US20240224824A1
公开(公告)日:2024-07-04
申请号:US18304601
申请日:2023-04-21
Inventor: Hung-Ju Li , Yu-Wei Ting , Hui Hung Kuo , Chien Ta Huang , Kuo-Pin Chang , Kuo-Ching Huang
CPC classification number: H10N70/8413 , H10N70/011 , H10N70/231 , H10N70/823
Abstract: A device structure includes a heater line located over a substrate, an aluminum nitride layer having an inhomogeneous material composition, and a phase change material line. A top surface portion of the aluminum nitride layer has a higher atomic concentration of nitrogen than a bottom surface portion of the aluminum nitride layer contacting a top surface of the heater line. The PCM line includes a middle portion that overlies the heater line, a first end portion adjoined to a first side of the middle portion, and a second end portion adjoined to a second side of the middle portion.
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3.
公开(公告)号:US20230403954A1
公开(公告)日:2023-12-14
申请号:US17836145
申请日:2022-06-09
Inventor: Kuo-Pin Chang , Yu-Wei Ting , Tsung-Hao Yeh , Kuo-Chyuan Tzeng , Kuo-Ching Huang
IPC: H01L45/00
CPC classification number: H01L45/126 , H01L45/06 , H01L45/1675 , H01L45/144 , H01L45/1226
Abstract: Phase change material (PCM) switches and methods of fabrication thereof that provide improved thermal confinement within a phase change material layer. A PCM switch may include a dielectric capping layer between a heater pad and the phase change material layer of the PCM switch that is laterally-confined such opposing sides of the dielectric capping layer the heater pad may form continuous surfaces extending transverse to the signal transmission pathway across the PCM switch. Heat transfer from the heater pad through the dielectric capping layer to the phase change material layer may be predominantly vertical, with minimal thermal dissipation along a lateral direction. The localized heating of the phase change material may improve the efficiency of the PCM switch enabling lower bias voltages, minimize the formation of regions of intermediate resistivity in the PCM switch, and improve the parasitic capacitance characteristics of the PCM switch.
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公开(公告)号:US20240389483A1
公开(公告)日:2024-11-21
申请号:US18317118
申请日:2023-05-15
Inventor: Yu-Wei Ting , Harry-Hak-Lay Chuang , Kuo-Pin Chang , Kuo-Ching Huang
Abstract: An embodiment phase change material (PCM) switch may include a phase change material element, a first electrode, a second electrode, and a direct heating element including an ionic resistance change material contacting the phase change material element. The phase change material element may include a phase change material that switches from an electrically conducting phase to an electrically insulating phase or from an electrically insulating phase to an electrically conducting phase by application of a heat pulse generated by the heating element. The PCM switch may further include a switching electrode contacting the ionic resistance change material such that the ionic resistance change material may be switched from a high resistance to a low resistance state by application of voltages to the first electrode, the second electrode, and the switching electrode. Electrical currents within the ionic resistance change material may generate heat that switches the phase change material element.
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公开(公告)号:US20240387516A1
公开(公告)日:2024-11-21
申请号:US18317986
申请日:2023-05-16
Inventor: Kuo-Pin Chang , Chien Hung Liu , Yu-Wei Ting , Kuo-Ching Huang
IPC: H01L27/06 , H01L23/34 , H01L23/373 , H01L23/522 , H01L27/088 , H02M1/00 , H02M3/157
Abstract: A device structure includes a voltage regulator circuit, which includes: a first semiconductor die including a pulse width modulation (PWM) circuit and connected to a PWM voltage output node at which a pulsed voltage output is generated; and a series connection of an inductor and a parallel connection circuit, the parallel connection circuit including a parallel connection of capacitor-switch assemblies. A first end node of the series connection is connected to the PWM voltage output node; a second end node of the series connection is connected to electrical ground; each of the capacitor-switch assemblies includes a respective series connection of a respective capacitor and a respective switch; and each switch within the capacitor-switch assemblies is located within the first semiconductor die.
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6.
公开(公告)号:US20230422643A1
公开(公告)日:2023-12-28
申请号:US17851072
申请日:2022-06-28
Inventor: Kuo-Pin Chang , Yu-Wei Ting , Kuo-Ching Huang
CPC classification number: H01L45/1286 , H01L27/2463 , H01L45/1675 , H01L45/06 , H01L45/1226 , H01L45/148 , H01L45/143 , H01L45/144
Abstract: A semiconductor structure comprising a first electrode, a second electrode, a phase-change material (PCM) line in contact with and positioned between the first electrode and the second electrode, at least two heater lines positioned between the first electrode and the second electrode, and an isolation layer positioned between the PCM line and the at least two heater lines is provided. A method of forming a semiconductor structure is provided, the method including forming a dielectric isolation layer having a planar top surface over a substrate, forming at least two heater lines over the planar top surface, forming at least one heater-capping dielectric plate over the at least two heater lines, forming a phase-change material (PCM) line over the at least one heater-capping dielectric plate, forming a first electrode and a second electrode, and forming a PCM-capping dielectric plate over the PCM line.
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7.
公开(公告)号:US20240397733A1
公开(公告)日:2024-11-28
申请号:US18321898
申请日:2023-05-23
Inventor: Wei Ting Hsieh , Kuo-Ching Huang , Yu-Wei Ting , Kuo-Pin Chang , Hung-Ju Li
Abstract: A device structure includes a first series connection of a first phase change memory (PCM) switch and a second PCM switch. The first PCM switch includes a first heater line, a first PCM line, and a first contact electrode and a second contact electrode located on the first heater line. The second PCM switch includes a second heater line, a second PCM line, and a third contact electrode and a fourth contact electrode located on the second heater line. The second contact electrode is electrically connected to the third contact electrode. The fourth contact electrode is electrically grounded. One of the first contact electrode and the second contact electrode includes an radio-frequency (RF) signal input port. Another of the first contact electrode and the second contact electrode comprises an RF signal output port. The device structure may function as a combination PCM switch that decreases noise level during signal transmission.
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8.
公开(公告)号:US20240389487A1
公开(公告)日:2024-11-21
申请号:US18317268
申请日:2023-05-15
Inventor: Wei Ting Hsieh , Kuo-Ching Huang , Yu-Wei Ting , Ching-En Chen , Kuo-Pin Chang
IPC: H10N79/00
Abstract: A device structure includes semiconductor devices located on a substrate; metal interconnect structures located in dielectric material layers overlying the semiconductor devices; and a non-Ohmic voltage-triggered switch including a first switch electrode that is electrically connected to one of the semiconductor devices through a subset of the metal interconnect structures, a second switch electrode, and a non-Ohmic switching material portion providing a non-Ohmic current-voltage characteristics and in contact with the first switch electrode and the second switch electrode. The non-Ohmic voltage-triggered switch may be used as an electrostatic discharge (ESD) switch.
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9.
公开(公告)号:US20240397837A1
公开(公告)日:2024-11-28
申请号:US18321081
申请日:2023-05-22
Inventor: Wei Ting Hsieh , Kuo-Ching Huang , Yu-Wei Ting , Chien Hung Liu , Kuo-Pin Chang , Hung-Ju Li
Abstract: An embodiment phase change material switch may include a first phase change material element, a second phase change material element, a first conductor electrically connected to a first end of each of the first phase change material element and the second phase change material element such that the first conductor is configured as a first terminal of an electrical circuit having a parallel configuration, a second conductor electrically connected to a second end of each of the first phase change material element and the second phase change material element such that the second conductor is configured as a second terminal of the electrical circuit having the parallel configuration, and a heating device coupled to the first phase change material element and to the second phase change material element and configured to supply a heat pulse to the first phase change material element and to the second phase change material element.
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公开(公告)号:US20230422517A1
公开(公告)日:2023-12-28
申请号:US17849755
申请日:2022-06-27
Inventor: Hung-Ju LI , Kuo-Pin Chang , Yu-Wei Ting , Yu-Sheng Chen , Ching-En Chen , Kuo-Ching Huang
IPC: H01L27/24
CPC classification number: H01L27/2427
Abstract: A selector structure may include a bottom electrode including a bottom low thermal conductivity (LTC) metal and a first bottom high thermal conductivity (HTC) metal, a first switching film on the bottom electrode and having an electrical resistivity switchable by an electric field, and a first top electrode on the first switching film and including a first top low thermal conductivity (LTC) metal and a first top high thermal conductivity (HTC) metal.
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