Abstract:
Products are disclosed for measuring electromagnetic fields. One embodiment has at least two coplanar magneto-resistive sensors. Each magneto-resistive sensor has a sensitive axis in the plane of the at least two coplanar magneto-resistive sensors. The at least two magneto-resistive sensors may be orthogonally arranged about a central point to measure orthogonal components of electromagnetic fields.
Abstract:
A giant magnetoresistive (GMR) based eddy current sensor including a giant magnetoresistive sensor integrated on a silicon chip with a signal conditioning circuit and a circular coil.
Abstract:
The present invention provides a multi-dimensional standing wave probe for microscale and nanoscale measurement, manipulation, and surface modification, including: a filament having a first free end and a second end that is attached to at least one actuator to apply oscillation cycles to the filament; wherein the oscillation of the filament during at least one complete cycle of oscillation of the actuator causes the free end to move in a multi-dimensional envelope, producing a defined virtual probe tip at the free end, wherein a shape of the virtual probe tip is defined by both a characteristic shape of the oscillation of the free end and a geometry of the filament. Optionally, the actuator includes a monolithic crystal actuator. Preferably, the monolithic crystal actuator includes a crystal having zero grain boundaries. The monolithic crystal actuator also includes a plurality of thin flexure structures. The monolithic crystal actuator further includes a plurality of metallic electrodes disposed on inside or outside surfaces, or a combination thereof, of the plurality of thin flexure structures.
Abstract:
A plain bearing slide system has a carriage mounted on a slide by use of bearing pads. Each bearing pad is coated with a layer of polymeric material having a convex surface, and is arranged to ride on a counterface. The combined thickness of the layer and a layer providing the counterface is such that the difference between the static and dynamic coefficients of friction is substantially less than the difference associated with the material when used in bulk bearings. A slide system using PTFE, and with a combined thickness of the layers of 2 to 3 micrometers, operated as a measuring instrument under ambient conditions such that the PTFE is substantially non-eroding, has proved capable of providing measurements to an accuracy of 0.05 nanometers.
Abstract:
A small-scale positioning device employing a platform, a levering mechanism and a floating actuator device. The platform is movably attached to a fixed frame by a lever, a pair of levers, or more. The floating actuator device is coupled between at least one lever and the platform. When the actuator device is activated, it generates a force on the platform and an equal but opposite force on the levering mechanism, causing one or more levers to rotate around their respective fulcrums, thereby controlling the position of the movable platform relative to the fixed frame. The amount of displacement of the platform is dependent upon the effective expansion or contraction of the actuator device and the lever ratio. If the pair of levers are symmetrical, then motion is created in only a single degree of motion. Flexures may be included to prevent motion in unwanted directions.
Abstract:
An apparatus for profiling the surface of a workpiece, including a probe adapted to make contact with the surface of a workpiece, a sensor for determining or deriving the force between the probe and the workpiece surface, an actuator that adjusts the position of the probe along an axis, which is generally perpendicular to the surface of the workpiece, in order to maintain a constant force between the probe and the surface, and a closed control loop, including a controller that controls the operation of the actuator based on information from the sensor.
Abstract:
The present invention provides an apparatus and method for performing surface property measurements, such as workpiece hardness and other material property measurements, with in-process compensation for instrument frame distortion and the like. The apparatus includes a substantially rigid base; a stylus coupled to the substantially rigid base, the stylus configured and selectively positioned to interact with a surface of a specimen at points along a central axis of the stylus; a proximity detector sensor coupled to the substantially rigid base, the proximity detector sensor disposed at a predetermined distance from the surface of the specimen and operable for sensing the predetermined distance between the proximity detector sensor and the surface of the specimen; and a proximity detector actuator coupled to the substantially rigid base, the proximity detector actuator operable for maintaining the predetermined distance between the proximity detector sensor and the surface of the specimen as the substantially rigid base and the stylus are moved with respect to the surface of the specimen along the central axis of the stylus.
Abstract:
The present invention provides a multi-dimensional standing wave probe for microscale and nanoscale measurement, manipulation, and surface modification, including: a filament having a first free end and a second end that is attached to at least one actuator to apply oscillation cycles to the filament; wherein the oscillation of the filament during at least one complete cycle of oscillation of the actuator causes the free end to move in a multi-dimensional envelope, producing a defined virtual probe tip at the free end, wherein a shape of the virtual probe tip is defined by both a characteristic shape of the oscillation of the free end and a geometry of the filament. Optionally, the actuator includes a monolithic crystal actuator. Preferably, the monolithic crystal actuator includes a crystal having zero grain boundaries. The monolithic crystal actuator also includes a plurality of thin flexure structures. The monolithic crystal actuator further includes a plurality of metallic electrodes disposed on inside or outside surfaces, or a combination thereof, of the plurality of thin flexure structures.
Abstract:
An oscillating probe of an elongated rod, having a first free end, and a second end that is attached to at least one actuator to apply oscillation cycles to the rod. Oscillation of the elongated rod during at least one complete cycle of oscillation of the actuator causes the free end to move in at least one-dimensional envelope, producing a defined virtual probe tip geometry at the free end. The probe is connected to a system for utilizing information sensed as the free end is placed near a surface.
Abstract:
A symmetric ultra-precision spindle design in which all forces of constraint are, within the tolerances of manufacturing and assembly processes, symmetrically arranged about its axis. Additionally this design may require little or no external power other than the forces to rotate the spindle.