摘要:
A microprocessor is disclosed having a bus controller which is capable of automatically performing multiple bus cycles in response to a multi-cycle signal received from the control unit. The bus controller includes means for automatically incrementing the access address provided by the control unit, and for controlling the transfer of the data between the bus and respective destinations in the control units.
摘要:
A cache location selector selects locations in a cache for loading new information using either a valid chain, if not all locations already contain valid information, or a history loop otherwise. The valid chain selects the "highest" location in the cache which does not already contain valid information. The history loop selects locations in accordance with a modified form of the First-In-Not-Used-First-Out (FINUFO) replacement scheme. Both the valid chain and the history loop are fully and efficiently implemented in hardware. During normal cache operation, both the valid chain and the history loop continuously seek an appropriate location to be used for the next load. As a result, that location is preselected well before the load is actually required.
摘要:
Examples are disclosed for a device having at least two media access controllers. In some examples, a first media access controller may be coupled to a host computing device. A second media access controller may be coupled to one or more processor circuits arranged to perform packet processing of data payloads for one or more data frames forwarded through the first media access controller and/or forwarded through the second media access controller. The first media access controller may be coupled to the second media access controller via a communication link. Other examples are described and claimed.
摘要:
Accelerated test circuitry and support logic to test a content addressable memory (CAM). In a CAM array of n entries of m bits per entry, the testing of each word lind, each memory element, each exclusive OR (XOR) comparator and each match line may be thoroughly and quickly tested by means of the parallelism inherent in a CAM array and by the addition of a bulk load mechanism to enable all of the word lines simultaneously. The further addition of an ALLHIT indicator to assess all of the match lines in a single operation also reduces the number of operations and simplifies the test algorithm. The ALLHIT indicator may be an AND gate or a scan path.