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公开(公告)号：US20110102575A1
公开(公告)日：2011-05-05
申请号：US12940214
申请日：2010-11-05
申请人： Steven K. Case , Beverly Caruso , Todd D. Liberty , Timothy A. Skunes , Carl E. Haugan , Chuanqi Chen
发明人： Steven K. Case , Beverly Caruso , Todd D. Liberty , Timothy A. Skunes , Carl E. Haugan , Chuanqi Chen
IPC分类号： H04N7/18
CPC分类号： H05K13/08 , G01N21/8806 , G01N21/956 , G06K9/2036
摘要： An electronics assembly line includes a first electronics assembly machine and a second electronics assembly machine. The first electronics assembly machine has a first electronics assembly machine outlet. The second electronics assembly machine has a second electronics assembly machine inlet and outlet. The inlet of the second electronics assembly machine is coupled to the outlet of the first electronics assembly machine by a conveyor. A first optical inspection sensor is disposed over the conveyor before the inlet of the second electronics assembly and is configured to provide first sensor inspection image data relative to a substrate that passes beneath the first optical inspection sensor in a non-stop fashion. A second optical inspection sensor is disposed over the conveyor after the outlet of the second electronics assembly machine and is configured to provide second sensor inspection image data relative to a substrate that passes beneath the second optical inspection sensor in a non-stop fashion. A computer is operably coupled to the first and second optical inspection sensors and is configured to provide an inspection result based upon at least one of the first and second inspection image data.
摘要翻译： 电子装配线包括第一电子组装机和第二电子组装机。 第一个电子组装机器具有第一电子组装机出口。 第二电子组装机具有第二电子组装机入口和出口。 第二电子组装机的入口通过输送机联接到第一电子组装机的出口。 在第二电子组件的入口之前，第一光学检测传感器设置在输送机之上，并且被配置为相对于以第一光学检测传感器以不间断方式通过的基板提供第一传感器检查图像数据。 在第二电子组装机器的出口之后，第二光学检测传感器设置在传送器上方并且被配置为相对于在第二光学检测传感器下方以不间断的方式通过的基板提供第二传感器检查图像数据。 计算机可操作地耦合到第一和第二光学检测传感器，并且被配置为基于第一和第二检查图像数据中的至少一个提供检查结果。
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公开(公告)号：US20120327215A1
公开(公告)日：2012-12-27
申请号：US13480079
申请日：2012-05-24
申请人： Steven K. Case , Beverly Caruso , Todd D. Liberty , Timothy A. Skunes , Carl E. Haugan , Chuanqi Chen , Hiroshi Anzai
发明人： Steven K. Case , Beverly Caruso , Todd D. Liberty , Timothy A. Skunes , Carl E. Haugan , Chuanqi Chen , Hiroshi Anzai
CPC分类号： G06K9/2036 , G01N21/8806 , G01N21/8903 , G01N21/956 , G06K2009/2045 , H05K13/0815
摘要： An optical inspection sensor is provided. The sensor includes an array of cameras configured to acquire image data relative to a workpiece that moves relative to the array of cameras in a non-stop fashion. An illumination system is disposed to provide a pulse of illumination when the array of cameras acquires the image data. At least some image data includes data regarding a skip mark or barcode on the workpiece.
摘要翻译： 提供光学检测传感器。 该传感器包括相机相机相对于摄像机阵列以不间断的方式移动的图像数据的摄像机阵列。 照明系统设置成当相机阵列获取图像数据时提供照明脉冲。 至少一些图像数据包括关于工件上的跳过标记或条形码的数据。
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公开(公告)号：US08872912B2
公开(公告)日：2014-10-28
申请号：US12940214
申请日：2010-11-05
CPC分类号： H05K13/08 , G01N21/8806 , G01N21/956 , G06K9/2036
摘要： An electronics assembly line includes a first electronics assembly machine and a second electronics assembly machine. The first electronics assembly machine has a first electronics assembly machine outlet. The second electronics assembly machine has a second electronics assembly machine inlet and outlet. The inlet of the second electronics assembly machine is coupled to the outlet of the first electronics assembly machine by a conveyor. A first optical inspection sensor is disposed over the conveyor before the inlet of the second electronics assembly and is configured to provide first sensor inspection image data relative to a substrate that passes beneath the first optical inspection sensor in a non-stop fashion. A second optical inspection sensor is disposed over the conveyor after the outlet of the second electronics assembly machine and is configured to provide second sensor inspection image data relative to a substrate that passes beneath the second optical inspection sensor in a non-stop fashion. A computer is operably coupled to the first and second optical inspection sensors and is configured to provide an inspection result based upon at least one of the first and second inspection image data.
摘要翻译： 电子装配线包括第一电子组装机和第二电子组装机。 第一个电子组装机器具有第一电子组装机出口。 第二电子组装机具有第二电子组装机入口和出口。 第二电子组装机的入口通过输送机联接到第一电子组装机的出口。 在第二电子组件的入口之前，第一光学检测传感器设置在输送机之上，并且被配置为相对于在第一光学检测传感器下方以不间断的方式通过的基板提供第一传感器检查图像数据。 在第二电子组装机器的出口之后，第二光学检测传感器设置在传送器上方并且被配置为相对于在第二光学检测传感器下方以不间断的方式通过的基板提供第二传感器检查图像数据。 计算机可操作地耦合到第一和第二光学检测传感器，并且被配置为基于第一和第二检查图像数据中的至少一个提供检查结果。
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4.发明申请公开(公告)号：US20110175997A1
公开(公告)日：2011-07-21
申请号：US12864110
申请日：2009-01-23
申请人： Steven K. Case , Caruso Beverly , Chuanqi Chen , Carl Haugan
发明人： Steven K. Case , Caruso Beverly , Chuanqi Chen , Carl Haugan
IPC分类号： H04N7/18
CPC分类号： G01N21/8903 , G01N21/8806
摘要： An optical inspection system (92) for inspecting a workpiece (10) including a feature (60) to be inspected is provided. The system (92) includes a workpiece transport conveyor (26) configured to transport the workpiece (10) in a nonstop manner. The system (92) also includes an illuminator (9) configured to provide a first strobed illumination field type and a second strobed illumination field type. An array of cameras (4) is configured to digitally image the feature, wherein the array of cameras (4) is configured to generate a first image of the feature with the first illumination field and a second image of the feature with the second illumination field. A processing device (90) is operably coupled to the illuminator (9) and the array of cameras (4), the processing device (90) provides an inspection result relative to the feature (60) on the workpiece (10) based, at least in part, upon the first and second images.
摘要翻译： 提供一种用于检查包括要检查的特征（60）的工件（10）的光学检查系统（92）。 系统（92）包括被配置为以不间断方式输送工件（10）的工件传送传送器（26）。 系统（92）还包括被配置为提供第一选通照明场类型和第二选通照明场类型的照明器（9）。 相机阵列（4）被配置为对特征进行数字成像，其中相机阵列（4）被配置为利用第一照明场和具有第二照明场的特征的第二图像来生成特征的第一图像 。 处理装置（90）可操作地耦合到照明器（9）和相机阵列（4），处理装置（90）基于工件（10）提供相对于工件（10）上的特征（60）的检查结果， 至少部分地在第一和第二图像上。
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公开(公告)号：US07209228B2
公开(公告)日：2007-04-24
申请号：US10712802
申请日：2003-11-12
申请人： Perry Y. Li , Chuanqi Chen , Arthur G. Erdman , Zhang Hong , John Byron Raymond
发明人： Perry Y. Li , Chuanqi Chen , Arthur G. Erdman , Zhang Hong , John Byron Raymond
CPC分类号： A61C9/0053 , A61C9/0093 , A61C13/0004 , G01B11/002 , G01B11/24
摘要： A scanning apparatus includes a support frame and a laser scanner mounted to the frame. A five bar closed loop spherical linkage supports a clamping device for retaining an object. The linkage moves the object through a scanning beam about a spherical surface to facilitate scanning of curved objects. The linkage is mounted on an arm rotatably mounted to the frame and the clamping device is rotatably mounted to the linkage to provide four degrees of freedom. Encoders and motors drive the linkage to provide accurate positioning and providing for digitizing the scanned object.
摘要翻译： 扫描装置包括安装在框架上的支撑框架和激光扫描仪。 五杆闭环球形连杆支撑用于保持物体的夹紧装置。 连杆通过围绕球面的扫描光束移动物体，以便扫描弯曲的物体。 联动装置安装在可旋转地安装到框架上的臂上，并且夹紧装置可旋转地安装到连杆机构以提供四个自由度。 编码器和电机驱动联动装置，以提供准确的定位并提供扫描对象的数字化。
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