公开(公告)号：US09244095B2

公开(公告)日：2016-01-26

申请号：US14364309

申请日：2012-12-12

Applicant: UNIVERSITAT BASEL

Inventor： Marija Plodinec ,  Marko Loparic ,  Roderick Y H Lim

IPC: G01Q10/00 ,  G01Q10/06 ,  B82Y35/00

CPC classification number: G01Q10/06 ,  B82Y35/00 ,  G01Q10/065

Abstract: The present invention relates to a method for controlling a scanning probe microscope having a probe (2) with a tip (21) for interacting with a sample (4), and a nanoscanner (1) for retaining the sample (4) or the probe (2), comprising the steps of monitoring the extension of the piezo element (1) along a first direction (R) along which the tip (21) is moved towards the sample (4), and adjusting the level of the probe (2) along the first direction (R) by means of an additional actuator (3), when the nanoscanner (1) exhibits an extension below or above a threshold value. The invention further relates to a device (100) for controlling a scanning probe microscope.

公开(公告)号：US11686720B2

公开(公告)日：2023-06-27

申请号：US15770205

申请日：2016-10-24

Applicant: UNIVERSITAT BASEL

Inventor： Marija Plodinec ,  Ellen Obermann ,  Philipp Oertle ,  Christian Räz

IPC: G01N3/42 ,  G01N33/483 ,  G01N33/48 ,  G01N3/00 ,  G01N33/574 ,  G01N3/06 ,  G01Q60/36 ,  G01Q60/24

CPC classification number: G01N33/4833 ,  G01N3/00 ,  G01N3/068 ,  G01N3/42 ,  G01N33/48 ,  G01N33/57415 ,  G01N2203/0089 ,  G01N2203/0286 ,  G01N2291/02827 ,  G01N2800/7028 ,  G01Q60/24 ,  G01Q60/366

Abstract: The invention relates to a method for classifying a tissue sample obtained from mammary carcinoma. The method comprises determining a stiffness value for each of a plurality of points on said tissue sample, resulting in a stiffness distribution, and assigning said sample to a breast cancer subtype and nodal status based on said stiffness distribution.

公开(公告)号：US09500670B2

公开(公告)日：2016-11-22

申请号：US14651233

申请日：2013-12-12

Applicant: UNIVERSITAT BASEL

Inventor： Roderick Lim ,  Marija Plodinec ,  Marko Loparic ,  Pascal Oehler ,  Leon Camenzind

IPC: B82Y35/00 ,  G01Q40/00 ,  G01Q30/06 ,  G01Q20/00 ,  G01Q10/06 ,  G01Q10/00

CPC classification number: G01Q20/00 ,  G01Q10/00 ,  G01Q10/065 ,  G01Q30/06

Abstract: The present invention relates to a method for controlling a scanning probe microscope having a probe (2) with a tip (21) for interacting with a sample (4), and a nanoscanner (1) for retaining the sample (4) or the probe (2), comprising the steps of monitoring the extension of the piezo element (1) along a first direction (R) along which the tip (21) is moved towards the sample (4), and adjusting the level of the probe (2) along the first direction (R) by means of an additional actuator (3), when the nanoscanner (1) exhibits an extension below or above a threshold value. The invention further relates to a device (100) for controlling a scanning probe microscope.

Abstract translation: 本发明涉及一种用于控制扫描探针显微镜的方法，所述扫描探针显微镜具有带有用于与样品（4）相互作用的尖端（21）的探针（2）和用于保持样品（4）或探针 （2），包括以下步骤：沿尖端（21）朝向样品（4）移动的第一方向（R）监测压电元件（1）的延伸，并且调节探针（2）的水平 ）当所述纳米扫描仪（1）展现出低于或高于阈值的延伸时，通过附加致动器（3）沿所述第一方向（R）。 本发明还涉及一种用于控制扫描探针显微镜的装置（100）。

公开(公告)号：US20140338073A1

公开(公告)日：2014-11-13

申请号：US14364309

申请日：2012-12-12

Applicant: UNIVERSITAT BASEL

Inventor： Marija Plodinec ,  Marko Loparic ,  Roderick YH Lim

IPC: G01Q10/06

CPC classification number: G01Q10/06 ,  B82Y35/00 ,  G01Q10/065

Abstract: The present invention relates to a method for controlling a scanning probe microscope having a probe (2) with a tip (21) for interacting with a sample (4), and a nanoscanner (1) for retaining the sample (4) or the probe (2), comprising the steps of monitoring the extension of the piezo element (1) along a first direction (R) along which the tip (21) is moved towards the sample (4), and adjusting the level of the probe (2) along the first direction (R) by means of an additional actuator (3), when the nanoscanner (1) exhibits an extension below or above a threshold value. The invention further relates to a device (100) for controlling a scanning probe microscope.

Abstract translation: 本发明涉及一种用于控制扫描探针显微镜的方法，所述扫描探针显微镜具有带有用于与样品（4）相互作用的尖端（21）的探针（2）和用于保持样品（4）或探针 （2），包括以下步骤：沿尖端（21）朝向样品（4）移动的第一方向（R）监测压电元件（1）的延伸，并且调节探针（2）的水平 ）当所述纳米扫描仪（1）展现出低于或高于阈值的延伸时，通过附加致动器（3）沿所述第一方向（R）。 本发明还涉及一种用于控制扫描探针显微镜的装置（100）。