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公开(公告)号：US07952348B2
公开(公告)日：2011-05-31
申请号：US11935077
申请日：2007-11-05
申请人： Haiyan Sun , Yuri Plotnikov , Changting Wang , William Stewart McKnight , Ui Suh
发明人： Haiyan Sun , Yuri Plotnikov , Changting Wang , William Stewart McKnight , Ui Suh
CPC分类号： G01N27/9033 , Y10T29/4902
摘要： A method of assembling an eddy current probe for use in nondestructive testing of a sample is described. The method includes positioning at least one substantially planar spiral drive coil within the eddy current probe, such that the drive coil is at least one of adjacent to and at least partially within a flexible material. The method further includes coupling at least one unpackaged solid-state magnetic field sensor to the at least one drive coil.
摘要翻译： 描述了组装用于样品的非破坏性测试的涡流探针的方法。 该方法包括将至少一个基本上平面的螺旋驱动线圈定位在涡流探针内，使得驱动线圈是与柔性材料相邻并且至少部分地在柔性材料内的至少一个。 该方法还包括将至少一个未封装的固态磁场传感器耦合到至少一个驱动线圈。
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公开(公告)号：US20090115411A1
公开(公告)日：2009-05-07
申请号：US11935077
申请日：2007-11-05
申请人： Haiyan Sun , Yuri Plotnikov , Changting Wang , William Stewart McKnight , Ui Suh
发明人： Haiyan Sun , Yuri Plotnikov , Changting Wang , William Stewart McKnight , Ui Suh
CPC分类号： G01N27/9033 , Y10T29/4902
摘要： A method of assembling an eddy current probe for use in nondestructive testing of a sample is described. The method includes positioning at least one substantially planar spiral drive coil within the eddy current probe, such that the drive coil is at least one of adjacent to and at least partially within a flexible material. The method further includes coupling at least one unpackaged solid-state magnetic field sensor to the at least one drive coil.
摘要翻译： 描述了组装用于样品的非破坏性测试的涡流探针的方法。 该方法包括将至少一个基本上平面的螺旋驱动线圈定位在涡流探针内，使得驱动线圈是与柔性材料相邻并且至少部分地在柔性材料内的至少一个。 该方法还包括将至少一个未封装的固态磁场传感器耦合到至少一个驱动线圈。
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公开(公告)号：US20090115410A1
公开(公告)日：2009-05-07
申请号：US11935118
申请日：2007-11-05
CPC分类号： G01N27/904 , Y10T29/49002
摘要： A method of assembling an eddy current array probe to facilitate nondestructive testing of a sample is provided. The method includes positioning a plurality of differential side mount coils at least partially within a flexible material. The method also includes coupling the flexible material within a tip portion of the eddy current array probe, such that the flexible material has a contour that substantially conforms to a portion of a surface of the sample to be tested.
摘要翻译： 提供了组装涡流阵列探针以促进样品的非破坏性测试的方法。 该方法包括至少部分地将多个差动侧安装线圈定位在柔性材料内。 该方法还包括将柔性材料联接在涡流阵列探针的尖端部分内，使得柔性材料具有基本上符合待测样品表面的一部分的轮廓。
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4.发明授权公开(公告)号：US07888932B2
公开(公告)日：2011-02-15
申请号：US11935118
申请日：2007-11-05
IPC分类号： G01N27/82
CPC分类号： G01N27/904 , Y10T29/49002
摘要： A method of assembling an eddy current array probe to facilitate nondestructive testing of a sample is provided. The method includes positioning a plurality of differential side mount coils at least partially within a flexible material. The method also includes coupling the flexible material within a tip portion of the eddy current array probe, such that the flexible material has a contour that substantially conforms to a portion of a surface of the sample to be tested.
摘要翻译： 提供了组装涡流阵列探针以促进样品的非破坏性测试的方法。 该方法包括至少部分地将多个差动侧安装线圈定位在柔性材料内。 该方法还包括将柔性材料联接在涡流阵列探针的尖端部分内，使得柔性材料具有基本上符合待测样品表面的一部分的轮廓。
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公开(公告)号：US20110004452A1
公开(公告)日：2011-01-06
申请号：US12810734
申请日：2007-12-31
申请人： Sanghamithra Korukonda , Sandeep Dewangan , Preeti Pisupati , William Stewart McKnight , Gigi Gambrell , Ui Suh , Changting Wang
发明人： Sanghamithra Korukonda , Sandeep Dewangan , Preeti Pisupati , William Stewart McKnight , Gigi Gambrell , Ui Suh , Changting Wang
CPC分类号： G01N27/904 , G01N27/9046
摘要： A method of inspecting a component using an eddy current array probe (ECAP) is provided. The method includes scanning a surface of the component with the ECAP, collecting, with the ECAP, a plurality of partial defect responses, transferring the plurality of partial defect responses to a processor, modeling the plurality of partial defect responses as mathematical functions based on at least one of a configuration of elements of the ECAP and a resolution of the elements, and producing a single maximum defect response from the plurality of partial defect responses.
摘要翻译： 提供了使用涡流阵列探针（ECAP）检查部件的方法。 该方法包括用ECAP扫描组件的表面，与ECAP收集多个部分缺陷响应，将多个部分缺陷响应传送到处理器，将多个部分缺陷响应建模为数学函数，基于 ECAP的元件的构造中的至少一个和元件的分辨率，以及从多个部分缺陷响应产生单个最大缺陷响应。
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6.发明申请PROCESS AND APPARATUS FOR TESTING A COMPONENT USING AN OMNI-DIRECTIONAL EDDY CURRENT PROBE 审中-公开使用OMNI-DIRECTIONAL EDDY CURRENT PROBE测试组件的过程和设备公开(公告)号：US20100312494A1
公开(公告)日：2010-12-09
申请号：US12810597
申请日：2007-12-28
申请人： Sanghamithra Korukonda , Sandeep Dewangan , William Stewart McKnight , Gigi Gambrell , Changting Wang , Ui Suh
发明人： Sanghamithra Korukonda , Sandeep Dewangan , William Stewart McKnight , Gigi Gambrell , Changting Wang , Ui Suh
CPC分类号： G01N27/9046 , G01N27/904
摘要： A method for testing a component using an eddy current array probe is provided. The method includes calibrating the eddy current array probe, collecting data from the eddy current array probe for analysis, and processing the collected data to at least one of compensate for response variations due to a detected orientation of a detected imperfection and to facilitate minimizing noise.
摘要翻译： 提供了使用涡流阵列探针测试部件的方法。 该方法包括校准涡流阵列探头，从涡流阵列探头收集数据用于分析，并且将收集的数据处理至少一个，以补偿由于检测到的缺陷的检测到的取向引起的响应变化，并且有助于最小化噪声。
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公开(公告)号：US20060132124A1
公开(公告)日：2006-06-22
申请号：US11019343
申请日：2004-12-21
申请人： Mottito Togo , Changting Wang , Yuri Plotnikov , Shyamsunder Mandayam , William McKnight , Walter Bantz , Ui Suh
发明人： Mottito Togo , Changting Wang , Yuri Plotnikov , Shyamsunder Mandayam , William McKnight , Walter Bantz , Ui Suh
IPC分类号： G01N27/82
CPC分类号： G01N27/904 , G01N27/902
摘要： An eddy current (EC) probe for inspecting a component is provided. The EC probe includes a tangential drive coil configured to generate a probing field for inducing eddy currents in the component, where a portion of the eddy currents are aligned parallel to an edge of the component. An axis of the tangential drive coil is aligned parallel to a surface of the component. The EC probe further includes a pair of sense coils, where an axis of the sense coils is aligned perpendicular to the surface of the component. The sense coils are configured to sense the portion of the eddy currents aligned parallel to the edge of the component.
摘要翻译： 提供用于检查元件的涡流（EC）探头。 EC探针包括切向驱动线圈，该切线驱动线圈被配置为产生用于在部件中感应涡流的探测场，其中涡流的一部分平行于部件的边缘排列。 切向驱动线圈的轴线平行于部件的表面对准。 EC探针还包括一对感测线圈，其中感测线圈的轴线垂直于部件的表面对准。 感测线圈被配置为感测平行于部件的边缘排列的涡流的部分。
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公开(公告)号：US07206706B2
公开(公告)日：2007-04-17
申请号：US11210119
申请日：2005-08-22
IPC分类号： G06F19/00
CPC分类号： G01N27/9046 , G01N27/9086
摘要： A method for inspecting a part is provided. The method includes applying a number of multifrequency excitation signals to a probe to generate a number of multifrequency response signals for the part being inspected. The method further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect a subsurface of the part. An inspection system is provided and includes an eddy current (EC) probe configured to induce eddy currents in a part. The system further includes an eddy current instrument coupled to the EC probe and configured to apply multifrequency excitation signals to the EC probe to generate multifrequency response signals. The system further includes a processor configured to analyze the multifrequency response signals from the EC instrument by performing a multifrequency phase analysis, to inspect a subsurface of the part.
摘要翻译： 提供了一种用于检查零件的方法。 该方法包括将多个多频激励信号应用于探针，以产生被检测部分的多个多频响应信号。 该方法还包括对多频响应信号执行多频相分析以检查该部分的地下。 提供了一种检查系统，并且包括涡流（EC）探针，其配置成在部件中感应涡流。 该系统还包括耦合到EC探头并被配置为向EC探头施加多频激励信号以产生多频响应信号的涡流仪器。 该系统还包括处理器，其被配置为通过执行多频相分析来分析来自EC仪器的多频响应信号，以检查该部件的地下。
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公开(公告)号：US20090072822A1
公开(公告)日：2009-03-19
申请号：US11855816
申请日：2007-09-14
CPC分类号： G01N27/9046 , H01F3/14 , H01F5/003 , H01F17/062 , Y10T29/49071
摘要： An inspection system for detecting a flaw in a part is provided. The inspection system includes a generally C-shaped core having an opening for receiving the part. The system also includes a driver coil wrapped around the core for creating a magnetic field in the opening. The system further includes at least one single element or multiple element eddy current sensor disposed in the opening.
摘要翻译： 提供了用于检测零件中的缺陷的检查系统。 检查系统包括具有用于接收部件的开口的大致C形的芯。 该系统还包括缠绕在芯上的驱动线圈，用于在开口中产生磁场。 该系统还包括设置在开口中的至少一个单元件或多元件涡流传感器。
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公开(公告)号：US07994780B2
公开(公告)日：2011-08-09
申请号：US11855816
申请日：2007-09-14
IPC分类号： G01N27/82
CPC分类号： G01N27/9046 , H01F3/14 , H01F5/003 , H01F17/062 , Y10T29/49071
摘要： An inspection system for detecting a flaw in a part is provided. The inspection system includes a generally C-shaped core having an opening for receiving the part. The system also includes a driver coil wrapped around the core for creating a magnetic field in the opening. The system further includes at least one single element or multiple element eddy current sensor disposed in the opening.
摘要翻译： 提供了用于检测零件中的缺陷的检查系统。 检查系统包括具有用于接收部件的开口的大致C形的芯。 该系统还包括缠绕在芯上的驱动线圈，用于在开口中产生磁场。 该系统还包括设置在开口中的至少一个单元件或多元件涡流传感器。
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