摘要:
A system to smooth and radius a microhole in a workplace to calibrate the mircohole which comprises means for preconditioning a microhole with a liquid abrasive slurry at a first station, means for flowing a calibration fluid through the preconditioned microhole and means for flowing a slurry through the microhole for a predetermined time based on the flow rate of the calibration fluid.
摘要:
Embodiments of the present invention provide an apparatus and a method for chamber particle source identification. The chamber particle source identification method and apparatus can greatly shorten the time it takes to identify chamber particle source(s). In one embodiment, a chamber particle monitor assembly for a processing chamber is provided. The chamber particle monitor assembly includes at least one laser light source, which can scan laser light in a chamber process volume within the processing chamber. The chamber particle monitor assembly also includes a plurality of laser light collectors, which can collect laser light emitted from the at least one laser light source continuously to monitor particle performance within the processing chamber. The plurality of laser light collectors are placed in the processing chamber such that none of the plurality of laser light collectors share a common axis. The chamber particle monitor assembly further includes an analyzer that analyzes signals representing the laser light collected by the plurality of laser light collectors to provide chamber particle information. The plurality of laser light collectors enables construction of three-dimensional (3-D) images of particle distribution within the processing volume.
摘要:
Broadly speaking, the embodiments of the present invention fill the need by providing an improved chamber particle source identification mechanism. The in-situ chamber particle source identification method and apparatus can greatly shorten the time it takes to identify chamber particle source, which could improve the chamber throughput for production system. The method and apparatus can also be used to test components for particle performance during chamber engineering development stage. In one embodiment, an in-situ chamber particle monitor assembly for a semiconductor processing chamber includes at least one laser light source. The at least one laser light source can scan laser light in a chamber process volume within the processing chamber. The in-situ chamber particle monitor assembly also includes at least one laser light collector. The at least one laser light collector can collect laser light emitted from the at least one laser light source. The chamber particle monitor assembly also includes an analyzer external to the processing chamber that analyzes signals representing the laser light collected by the at least one laser light collector to provide chamber particle information.
摘要:
The present invention comprises a hardware/software combination that is configured to provide for the optimization of the printed output transmitted by a facsimile machine. By generating and comparing a baseline cover sheet quality score with a companion document quality score, optimization decisions can be made to enhance the quality of facsimile transmissions. Optimization is also enhanced by recognizing the type of facsimile machine being used and providing the optimal configuration settings for the facsimile machine. In the most preferred embodiments of the present invention, the possible settings for multiple facsimile machines are stored in a database, along with the optimal settings for each of the facsimile machines. To further enhance the results of a facsimile transmission, a database of printers may also be consulted. By utilizing the best possible output from a printer, combined with the optimal settings for a fax machine, the optimal results for a facsimile transmission can be obtained. Additionally, the use of bar-coded identification for facsimile transmission provides a method of automating the optimization process, thereby increasing efficiency by reporting the results of the optimization process.
摘要:
A system virtualizes applications on a managed endpoint using containers. A managed endpoint receives a virtualized container from an IT automation appliance. The virtualized container includes an application and a virtualization module. The virtualization module includes computer program instructions for virtualizing the application. An operating system API call made by the application during execution is intercepted, and a portion of the computer program instructions are executed based on the operating system API call. The computer program instructions modify the behavior of the application to effect the file and data virtualization of the application. A virtualized container can be deployed and updated from an IT automation appliance along with an agent to support the deployment and updating of the virtualized container.
摘要:
A network communication card is provided for facilitating ultra high frequency (UHF) radio communication between a terminal and a base station, the network communication card being in communication with an antenna and comprising a double-sided multilayer printed circuit board (PCB). The PCB comprises a digital interface, a receiver and a transmitter. The digital interface provides communication between the PCB and the terminal. The receiver receives incoming radio signals from the base station and processes the received signals for communication to the terminal via the digital interface. The transmitter transmits outgoing radio signals from the terminal via the digital interface to the base station and includes the following components. A digital synthesizer provides a highly accurate modulated carrier signal. An upconversion circuit increases the frequency of the carrier signal. A filter filters spurious content from the carrier signal. A phase locked loop (PLL) comprising a synthesizer and a voltage controlled oscillator (VCO) generates a transmission signal from the filtered carrier signal. A transmission circuit transmits the transmission signal via the antenna.
摘要:
A disposable, closed fluid sampling system for use with a medical conduit line, especially for taking blood samples from a pressure monitoring line. The conduit line has at least one fluid sampling site interposed between a distal segment of tubing and a proximal segment of tubing. The system includes a disposable subsystem having a bypass cannula adapted to engage the sampling site, a reservoir for drawing a prime volume of fluid past the sampling site, and a fluid sampling container. A 3-way stopcock may connect the reservoir, bypass cannula, and sampling vessel for controlling the sampling procedure. The bypass cannula may simultaneously place the subsystem into fluid communication with an inner chamber of the sampling site and exclude the proximal segment of the conduit line. Alternatively, a stopcock immediately adjacent the sampling site in the proximal segment may be utilized. A method of using the system includes attaching the disposable subsystem, opening the reservoir to the distal segment while excluding the proximal segment, drawing a prime volume of fluid into the reservoir, opening the sampling vessel to the distal segment and drawing a sample, re-infusing the prime volume into the distal segment, and removing and discarding the subsystem. The reservoir remains attached between the prime volume draw and re-infusion and is thus “closed.”
摘要:
Broadly speaking, the embodiments of the present invention fill the need by providing an improved chamber particle source identification mechanism. The in-situ chamber particle source identification method and apparatus can greatly shorten the time it takes to identify chamber particle source, which could improve the chamber throughput for production system. The method and apparatus can also be used to test components for particle performance during chamber engineering development stage. In one embodiment, an in-situ chamber particle monitor assembly for a semiconductor processing chamber includes at least one laser light source. The at least one laser light source can scan laser light in a chamber process volume within the processing chamber. The in-situ chamber particle monitor assembly also includes at least one laser light collector. The at least one laser light collector can collect laser light emitted from the at least one laser light source. The chamber particle monitor assembly also includes an analyzer external to the processing chamber that analyzes signals representing the laser light collected by the at least one laser light collector to provide chamber particle information.